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    • 8. 发明申请
    • METHODS OF OPERATING NONVOLATILE MEMORY DEVICES THAT SUPPORT EFFICIENT ERROR DETECTION
    • 操作有效的错误检测的非易失性存储器件的操作方法
    • US20150248930A1
    • 2015-09-03
    • US14712939
    • 2015-05-15
    • SAMSUNG ELECTRONICS CO., LTD.
    • Ji-Sang LeeMoosung KimKihwan Choi
    • G11C11/56G11C16/34
    • G11C11/5635G06F11/1048G11C11/5628G11C11/5642G11C16/02G11C16/0483G11C16/3413G11C16/3436G11C16/3454G11C29/04G11C2029/0411G11C2211/5621
    • Methods of operating nonvolatile memory devices may include identifying one or more multi-bit nonvolatile memory cells in a nonvolatile memory device that have undergone unintentional programming from an erased state to an at least partially programmed state. Errors generated during an operation to program a first plurality of multi-bit nonvolatile memory cells may be detected by performing a plurality of reading operations to generate error detection data and then decoding the error detection data to identify specific cells having errors. A programmed first plurality of multi-bit nonvolatile memory cells and a force-bit data vector, which was modified during the program operation, may be read to support error detection. This data, along with data read from a page buffer associated with the first plurality of multi-bit nonvolatile memory cells, may then be decoded to identify which of the first plurality of multi-bit nonvolatile memory cells are unintentionally programmed cells.
    • 操作非易失性存储器件的方法可以包括识别非易失性存储器件中的一个或多个多位非易失性存储器单元,其经历从擦除状态到至少部分编程状态的无意编程。 可以通过执行多个读取操作来生成错误检测数据,然后解码错误检测数据以识别具有错误的特定单元,来检测在编程第一多个多位非易失性存储器单元的操作期间产生的错误。 可以读取编程的第一多个多位非易失性存储单元和在编程操作期间被修改的强位数据向量,以支持错误检测。 然后可以将该数据连同从与第一多个多位非易失性存储器单元相关联的页面缓冲器读取的数据解码以识别第一多个多位非易失性存储器单元中的哪一个是无意编程的单元。