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    • 2. 发明授权
    • Energy storage apparatus
    • 储能装置
    • US09099251B2
    • 2015-08-04
    • US13833579
    • 2013-03-15
    • SAMSUNG ELECTRO-MECHANICS CO., LTD.
    • Sung Yeol ParkYeong Su Cho
    • H01G11/26H01G9/15H01G11/24H01G11/12H01G11/72H01G11/76H01G4/30
    • H01G11/24H01G4/30H01G9/151H01G11/12H01G11/26H01G11/72H01G11/76Y02E60/13Y02T10/7022
    • The present invention relates to an energy storage apparatus capable of preventing performance degradation by reducing resistance during movement of charges between layers in a multilayer capacitor with very high capacity includes: a plurality of cathode layers for storing positive charges; a plurality of anode layers for storing negative charges; a plurality of separation layers for electrically separating the cathode layers and the anode layers; a cathode hole for introducing the positive charge into the cathode layer from the outside or discharging the positive charge from the cathode layer to the outside; an anode hole for introducing the negative charge into the anode layer from the outside or discharging the negative charge from the anode layer to the outside; a cathode conducting unit for moving the positive charge; and an anode conducting unit for moving the negative charge.
    • 本发明涉及一种能够通过在具有非常高的容量的层叠电容器中的层之间的电荷移动期间降低电阻来防止性能劣化的能量存储装置,包括:用于存储正电荷的多个阴极层; 用于存储负电荷的多个阳极层; 用于电分离阴极层和阳极层的多个分离层; 用于从外部将正电荷引入阴极层或将正电荷从阴极层排出到外部的阴极孔; 阳极孔,用于从外部将负电荷引入阳极层,或者将负电荷从阳极层排出到外部; 用于移动正电荷的阴极导电单元; 以及用于移动负电荷的阳极导电单元。
    • 3. 发明申请
    • THICKNESS MEASUREMENT DEVICE AND METHOD FOR MEASURING THICKNESS
    • 厚度测量装置和测量厚度的方法
    • US20150042367A1
    • 2015-02-12
    • US14331168
    • 2014-07-14
    • SAMSUNG ELECTRO-MECHANICS CO., LTD.
    • Ji Hoon KIMSung Yeol Park
    • G01B7/06
    • G01B7/06
    • Disclosed herein are a thickness measurement device and a method for measuring a thickness. The thickness measurement device includes: a four-terminal probe including a first probe through a fourth probe which are in contact with a metal film; a contact pressure controlling unit each controlling the first probe through the fourth probe so that the metal film and the first probe through the fourth probe have the same contact pressure; a current supplying unit supplying a current to the four-terminal probe; a voltage measuring unit measuring a voltage across the four-terminal probe; and a thickness calculating unit calculating a thickness of the metal film using a current value supplied from the current supplying unit and a voltage value measured by the voltage measuring unit.
    • 这里公开了厚度测量装置和厚度测量方法。 厚度测量装置包括:四端子探针,其包括与金属膜接触的通过第四探针的第一探针; 接触压力控制单元,其每个通过第四探针控制第一探针,使得金属膜和通过第四探针的第一探针具有相同的接触压力; 电流供给单元,向四端子探头供给电流; 测量四端子探头两端的电压的电压测量单元; 以及厚度计算单元,使用从电流供给单元提供的电流值和由电压测量单元测量的电压值来计算金属膜的厚度。