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    • 1. 发明授权
    • X-ray generating apparatus
    • X射线发生装置
    • US09159524B2
    • 2015-10-13
    • US14055453
    • 2013-10-16
    • RIGAKU CORPORATION
    • Martin HorvarthJiri MarsikLadislav PinaVaclav JelinekNaohisa OsakaKazuhiko OmoteMakoto KambeLicai JiangBonglea Kim
    • H01J35/14
    • H01J35/14H01J2235/081H01J2235/083
    • The X-ray generating apparatus 100 applies an electron beam e1 onto a target 150 to generate X-rays x1, and includes a permanent magnet lens 120 configured to focus the electron beam e1, a correction coil 130 provided on a side of the electron beam e1 with respect to the permanent magnet lens 120 and configured to correct a focus position formed by the permanent magnet lens 120 in a traveling direction of the electron beam e1, and a target 150 onto which the focused electron beam is applied. Accordingly, the apparatus configuration can be extremely compact and lightweight in comparison with general apparatuses. Furthermore, by the correction coil 130, the intensity of the magnetic field can be finely adjusted and the focus position in the traveling direction of the electron beam e1 can be finely adjusted.
    • X射线产生装置100将电子束e1施加到靶150上以产生X射线x1,并且包括被配置为聚焦电子束e1的永磁体透镜120,设置在电子束侧的校正线圈130 e1相对于永磁体透镜120,并且被配置为在电子束e1的行进方向上校正由永久磁铁透镜120形成的聚焦位置,以及被施加聚焦电子束的目标150。 因此,与一般装置相比,装置结构可以非常紧凑和重量轻。 此外,通过校正线圈130,可以精细地调节磁场的强度,并且可以精细地调整电子束e1的行进方向上的聚焦位置。