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    • 6. 发明申请
    • KNOWN GOOD DIE TESTING FOR HIGH FREQUENCY APPLICATIONS
    • 已知的高频应用的良好的测试
    • US20160327590A1
    • 2016-11-10
    • US14703677
    • 2015-05-04
    • QUALCOMM Incorporated
    • Young Kyu SongKyu-Pyung Hwang
    • G01R1/073G01R29/08G01R31/28
    • G01R1/045G01R1/06722G01R1/06772G01R1/07314G01R29/08G01R31/2822
    • Embodiments contained in the disclosure provide a method and apparatus for testing an electronic device. An electronic device is installed in a test socket guide. A pusher tip applies a load to the guided coaxial spring probes and forces contact with pads on the device. Test and ground signals are routed through the device and test socket. The apparatus includes a socket having at least one guided coaxial spring probe pin. A socket guide shim is positioned between the receptacle for the electronic device and the socket. A socket guide aids positioning. A pusher tip is placed on the side opposite that of the guided coaxial spring probe pins. The pusher tip mates with a pusher shim and the pusher spring. A top is then placed on the assembly and acts to compress the pusher spring and engage the guided coaxial spring probe pins with the pads on the device.
    • 本公开内容的实施例提供了一种用于测试电子设备的方法和装置。 电子设备安装在测试插座导轨中。 推动器尖端对被引导的同轴弹簧探针施加负载,并强制与设备上的焊盘接触。 测试和接地信号通过设备和测试插座进行路由。 该装置包括具有至少一个被引导的同轴弹簧探针销的插座。 插座引导垫片位于电子设备的插座和插座之间。 插座导轨辅助定位。 推动器尖端放置在与所引导的同轴弹簧探针的相对侧的一侧。 推杆与推动垫片和推杆弹簧配合。 然后将顶部放置在组件上并且用于压缩推动器弹簧并且将引导的同轴弹簧探针针与装置上的垫接合。