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1. 发明授权

US5875029A Apparatus and method for surface inspection by specular interferometric and diffuse light detection 失效
标题翻译：通过镜面干涉和漫反射光检测进行表面检测的装置和方法
公开(公告)号：US5875029A
公开(公告)日：1999-02-23
申请号：US908061
申请日：1997-08-11
申请人： Peter C. Jann , Wayne W. Li , Igor Iosilevsky , Kenneth H. Womack , Vlastimil Cejna , George A. Burt, Jr.
发明人： Peter C. Jann , Wayne W. Li , Igor Iosilevsky , Kenneth H. Womack , Vlastimil Cejna , George A. Burt, Jr.
IPC分类号： G01N21/94 , G01N21/956 , G01B9/02
CPC分类号： G01N21/9501 , G01N21/94 , G01N2201/1045
摘要： A simple yet versatile noncontact optical inspection instrument and method are described for the inspection of magnetic disk surfaces for surface defects. This instrument is capable of inspecting the disk surface at any point in the disk manufacturing process. Surface defects such as bumps, pits and scratches can be measured. Surface contaminants such as particles and stains can also be measured. The instrument is also capable of discriminating between surface defects and surface contaminants. The instrument is comprised of two identical optical sensors which are located on opposite sides of the disk. A carriage supports and translates these sensors along the disk radius while a spindle rotates the disk. Both surfaces of the disk are therefore simultaneously scanned in a spiral fashion. The sensor's illumination optics produce a monochromatic focused spot of light which is normally incident upon the disk surface. The sensor uses two collection optics channels which simultaneously detect both the specular reflected light and the diffuse scattered light produced by the disk surface. Both the angle and power of the specular reflected light are measured, while just the power of the diffuse scattered light is measured. The output signals from the sensors are processed to estimate the size of the defects and to determine the type of defect.
摘要翻译：描述了一种简单而通用的非接触式光学检测仪器和方法，用于检查表面缺陷的磁盘表面。该仪器能够在磁盘制造过程的任何时刻检查磁盘表面。可以测量诸如凸块，凹坑和划痕的表面缺陷。还可以测量颗粒和污渍等表面污染物。该仪器还能够区分表面缺陷和表面污染物。仪器由两个相同的光学传感器构成，位于光盘的相对两侧。当主轴旋转磁盘时，滑架沿着磁盘半径支撑并平移这些传感器。因此，盘的两个表面都以螺旋方式同时扫描。传感器的照明光学器件产生通常入射在盘表面上的单色聚光光点。该传感器使用两个收集光学通道，其同时检测镜面反射光和由盘表面产生的漫射散射光。测量镜面反射光的角度和功率，同时测量漫射散射光的功率。来自传感器的输出信号被处理以估计缺陷的尺寸并确定缺陷的类型。

2. 发明授权

US5792947A Method and apparatus for combined glide and defect analysis 失效
标题翻译：组合滑行和缺陷分析的方法和装置
公开(公告)号：US5792947A
公开(公告)日：1998-08-11
申请号：US634693
申请日：1996-04-18
申请人： Vladimir Pogrebinsky , Igor Iosilevsky , George A. Burt, Jr. , David Ferry
发明人： Vladimir Pogrebinsky , Igor Iosilevsky , George A. Burt, Jr. , David Ferry
IPC分类号： G01R33/12 , G11B5/60 , G01B5/28 , G01B17/08
CPC分类号： G01R33/1207
摘要： A method and apparatus for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor for detecting defects on the surface of a magnetic disk. The sensor generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor processes the signal before it is received by a peak detecting circuit. The peak detecting circuit detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.
摘要翻译：一种用于检测数据记录介质表面上的缺陷的方法和装置。在一个实施例中，本发明包括用于检测磁盘表面上的缺陷的传感器。传感器产生一个模拟电压信号，代表在磁盘表面上检测到的表面异常。模拟信号处理器在由峰值检测电路接收信号之前处理该信号。峰值检测电路检测并将模拟信号的峰值转换为数字数据。数字数据由数字信号处理器接收和操纵，其中可以计算缺陷的峰值振幅，平均峰值振幅和平均峰值功率。

3. 发明授权

US5883714A Method and apparatus for detecting defects on a disk using interferometric analysis on reflected light 失效
标题翻译：用于使用对反射光进行干涉分析来检测盘上的缺陷的方法和装置
公开(公告)号：US5883714A
公开(公告)日：1999-03-16
申请号：US726914
申请日：1996-10-07
申请人： Peter C. Jann , George A. Burt, Jr. , Joel Libove
发明人： Peter C. Jann , George A. Burt, Jr. , Joel Libove
IPC分类号： G01N21/88 , G01B9/02
CPC分类号： G01N21/88
摘要： A simple yet versatile non-contact optical inspection instrument and method are described for measuring the height and width of defects and contaminants on a magnetic disk surface. The instrument includes a sensor which produces an illumination beam that is modulated and then focused normally on the disk surface as a spot. The illumination spot is Doppler shifted due to the movement of the disk and the diffusely reflected light is interfered with a reference beam produced by the sensor's illumination optics. The sensor uses two collection optics channels which simultaneously detect both the specular reflected light and the diffuse scattered light produced by the disk surface. The phase shift of the specular reflected light and that of the diffusely scattered light are measured. The output signals from the sensors are processed to estimate the size and type of the defects. Another aspect of the present invention includes a demodulator which increases the frequency of an FM signal. Pulses representing the zero-crossings of the signal are generated and filtered to provide a voltage that is proportional to the frequency of the FM signal. Because the pulse train has a frequency that is significantly greater than the input frequency, a low-pass filter with both a high cut-off frequency and a gradual roll-off in frequency response may thus be used to optimize the output or demodulated signal in terms of increased bandwidth or faster response and more linear group delay.
摘要翻译：描述了一种简单而通用的非接触光学检测仪器和方法，用于测量磁盘表面上的缺陷和污染物的高度和宽度。该仪器包括一个传感器，该传感器产生一个照明光束，该照明光束被调制然后正常地聚焦在光盘表面上作为光斑。由于盘的运动，照明点是多普勒频移，并且漫反射光被传感器的照明光学器件产生的参考光束干扰。该传感器使用两个收集光学通道，其同时检测镜面反射光和由盘表面产生的漫射散射光。测量镜面反射光和漫散射光的相移。来自传感器的输出信号被处理以估计缺陷的尺寸和类型。本发明的另一方面包括一种提高FM信号频率的解调器。产生表示信号过零点的脉冲并进行滤波，以提供与FM信号的频率成比例的电压。因为脉冲串具有明显大于输入频率的频率，因此可以使用具有高截止频率和频率响应中的逐渐滚降的低通滤波器来优化输出或解调信号增加带宽的条件或更快的响应和更多的线性组延迟。

4. 发明授权

US4702101A Apparatus and method for testing the calibration of a hard disk substrate tester 失效
标题翻译：用于测试硬盘基板测试仪校准的装置和方法
公开(公告)号：US4702101A
公开(公告)日：1987-10-27
申请号：US764654
申请日：1985-08-12
申请人： David C. Abbe , George A. Burt, Jr.
发明人： David C. Abbe , George A. Burt, Jr.
IPC分类号： G11B19/04 , G11B21/21 , G11B33/10 , G01C25/00
CPC分类号： G11B19/04 , G11B21/21 , G11B33/10
摘要： An apparatus for testing the calibration of hard disk substrate tester includes a calibrating micrometer moving a known surface to at least two distances from a non-contact detector in the hard disk surface tester and a known distance from each other, and further includes a piezoelectric transducer mounted to the known surface moved by the calibrating micrometer, and an oscillator oscillating the surface at predetermined frequencies and amplitudes. A method for determining the status of calibration of the hard disk substrate tester places a known surface at least two distances from or positions in relation to a surface detector in the hard disk substrate tester, determining the distance between these positions, driving the known surface usually by generating an oscillation thereof by a piezoelectric transducer at one or at a set or plurality of predetermined monotone frequencies and amplitudes, and determining the calibration of the hard disk substrate tester by comparing its output with the corresponding predetermined frequency and amplitude of the driven surface.
摘要翻译：用于测试硬盘基板测试仪的校准的装置包括校准千分尺将已知表面移动到与硬盘表面测试仪中的非接触检测器至少两距离并且彼此已知的距离，并且还包括压电换能器安装到由校准千分尺移动的已知表面，以及振荡器以预定的频率和振幅振荡该表面。用于确定硬盘基板测试仪的校准状态的方法将已知表面与硬盘基板测试仪中的表面检测器相距至少两个距离或位置，确定这些位置之间的距离，通常驱动已知表面通过以一个或一组或多个预定单调频率和幅度的压电换能器产生振荡，并通过将其输出与驱动表面的相应预定频率和幅度进行比较来确定硬盘基板测试仪的校准。

5. 发明授权

US4044641A Machine for handling sheet material 失效
标题翻译：纸张处理机
公开(公告)号：US4044641A
公开(公告)日：1977-08-30
申请号：US725328
申请日：1976-09-21
申请人： George A. Burt, Jr. , William M. Neill
发明人： George A. Burt, Jr. , William M. Neill
IPC分类号： A41H42/00 , B26D1/62 , B26D1/56
CPC分类号： B26D1/626 , A41H42/00 , Y10T83/4824 , Y10T83/483 , Y10T83/4838
摘要： A machine for automatically producing a bib apron and for affixing a narrow strip thereto to form both the neck loop and tie elements for the apron. The machine includes a cutting mechanism having a skewed roller carrying a cutting blade which makes point contact with a second roller to divide a continuous web of nonwoven fibrous material into separate rectangular sheets. The material for the strip is folded longitudinally and is then advanced across each sheet by a feed mechanism including a capstan drive and a clamping mechanism for holding the strip in juxtaposition with the sheet. Thereafter, the strip is contacted by a pull member which draws the center of the strip in a downstream direction to form a "V". The forward corners of the sheet are then folded over the legs of the V and are adhesively secured to the body of the sheet to hold the strip in place. Upon the actuation of the clamping mechanism to sever the strip from its supply, the thus completed apron is advanced past three additional folding stations. The apron is folded longitudinally at the first of two of these stations and transversely at the third station to facilitate stacking and packaging.
摘要翻译：一种用于自动生产围拢围裙并用于将窄带固定到其上的机器，以形成围裙的颈圈和领带元件。该机器包括切割机构，该切割机构具有带有切割刀片的倾斜辊，该切割刀片与第二辊点接触以将无纺纤维材料的连续卷材分成单独的矩形片材。用于条的材料纵向折叠，然后通过包括主导轴驱动器和夹持机构的进给机构前进穿过每个片材，该夹紧机构用于将条带与片并置放置。此后，条带通过牵引构件接触，该拉构件沿着下游方向拉出带的中心以形成“V”。然后将片材的前角折叠在V的腿上，并且粘合地固定到片材的主体以将条带保持在适当位置。在致动夹紧机构以将条从其供应中切断时，如此完成的围裙经过三个附加的折叠台前进。围裙在这两个站中的两个站点的第一个纵向折叠，并在第三站横向折叠，以方便堆放和包装。

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