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1. 发明授权

US08217671B2 Parallel array architecture for constant current electro-migration stress testing 失效
标题翻译：用于恒流电迁移应力测试的并行阵列架构
公开(公告)号：US08217671B2
公开(公告)日：2012-07-10
申请号：US12492619
申请日：2009-06-26
申请人： Kanak B. Agarwal , Peter A. Habitz , Jerry D. Hayes , Ying Liu , Deborah M. Massey , Alvin W. Strong
发明人： Kanak B. Agarwal , Peter A. Habitz , Jerry D. Hayes , Ying Liu , Deborah M. Massey , Alvin W. Strong
IPC分类号： G01R31/00
CPC分类号： G01R31/2858
摘要： A parallel array architecture for constant current electro-migration stress testing is provided. The parallel array architecture comprises a device under test (DUT) array having a plurality of DUTs coupled in parallel and a plurality of localized heating elements associated with respective ones of the DUTs in the DUT array. The architecture further comprises DUT selection logic that isolates individual DUTs within the array. Moreover, the architecture comprises current source logic that provides a reference current and controls the current through the DUTs in the DUT array such that each DUT in the DUT array has substantially a same current density, and current source enable logic for selectively enabling portions for the current source logic. Electro-migration stress testing is performed on the DUTs of the DUT array using the heating elements, the DUT selection logic, current source logic, and current source enable logic.
摘要翻译：提供了一种用于恒流电迁移应力测试的并行阵列架构。并行阵列结构包括被测器件（DUT）阵列，其具有并联耦合的多个DUT和与DUT阵列中相应的DUT相关联的多个局部加热元件。该架构还包括DUT阵列中的各个DUT隔离的DUT选择逻辑。此外，该架构包括提供参考电流并且控制通过DUT阵列中的DUT的电流的电流源逻辑，使得DUT阵列中的每个DUT具有基本上相同的电流密度，以及电流源使能逻辑，用于选择性地使能部分电流源逻辑。使用加热元件，DUT选择逻辑，电流源逻辑和电流源使能逻辑在DUT阵列的DUT上执行电迁移应力测试。

2. 发明授权

US07418689B2 Method of generating wiring routes with matching delay in the presence of process variation 有权
标题翻译：在存在过程变化的情况下生成具有匹配延迟的布线路线的方法
公开(公告)号：US07418689B2
公开(公告)日：2008-08-26
申请号：US10908102
申请日：2005-04-27
申请人： Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
发明人： Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G06F17/5077
摘要： A method and service of balancing delay in a circuit design begins with nodes that are to be connected together by a wiring design, or by being supplied with an initial wiring design that is to be altered. The wiring design will have many wiring paths, such as a first wiring path, a second wiring path, etc. Two or more of the wiring paths are designed to have matching timing, such that the time needed for a signal to travel along the first wiring path is about the same time needed for a signal to travel along the second wiring path, the third path, etc. The method/service designs one or all of the wiring paths to make the paths traverse wire segments of about the same length and orientation, within each wiring level that the first wiring path and the second wiring path traverse. Also, this process makes the first wiring path and the second wiring path traverse the wire segments in the same order, within each wiring level that the first wiring path and the second wiring path traverse.
摘要翻译：电路设计中的平衡延迟的方法和服务从通过布线设计连接在一起的节点开始，或通过提供要被改变的初始布线设计。布线设计将具有许多布线路径，例如第一布线路径，第二布线路径等。两条或多条布线路径被设计成具有匹配的定时，使得信号沿着第一布线路径行进所需的时间信号沿着第二布线路径，第三路径等移动所需的大致相同的时间。该方法/服务设计一个或所有布线路径，以使路径穿过大约相同长度的线段，并且在第一布线路径和第二布线路径横越的各布线层内。此外，该处理使得第一布线路径和第二布线路径在第一布线路径和第二布线路径横越的各布线层内以相同的顺序横穿线段。

3. 发明授权

US07401307B2 Slack sensitivity to parameter variation based timing analysis 有权
标题翻译：对基于参数变化的时序分析的松弛敏感性
公开(公告)号：US07401307B2
公开(公告)日：2008-07-15
申请号：US10904309
申请日：2004-11-03
申请人： Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Jeffrey H. Oppold , Anthony D. Polson
发明人： Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Jeffrey H. Oppold , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F17/5045
摘要： A method, system and program product are disclosed for improving an IC design that prioritize failure coefficients of slacks that lead to correction according to their probability of failure. With an identified set of independent parameters, a sensitivity analysis is performed on each parameter by noting the difference in timing, typically on endpoint slacks, when the parameter is varied. This step is repeated for every independent parameter. A failure coefficient is then calculated from the reference slack and the sensitivity of slack for each of the timing endpoints and a determination is made as to whether at least one timing endpoint fails a threshold test. Failing timing endpoints are then prioritized for modification according to their failure coefficients. The total number of runs required is one run that is used as a reference run, plus one additional run for each parameter.
摘要翻译：公开了一种用于改进IC设计的方法，系统和程序产品，其优先考虑根据其故障概率导致校正的松弛故障系数。通过确定的一组独立参数，当参数变化时，通过注意时序上的差异，通常在端点松弛时，对每个参数执行灵敏度分析。对于每个独立参数重复此步骤。然后从参考松弛和每个定时端点的松弛的灵敏度计算失效系数，并且确定至少一个定时端点是否失败阈值测试。然后将失败的定时终点根据其故障系数进行优先级修改。所需的总运行次数是一次运行，用作参考运行，每个参数再运行一次运行。

4. 发明授权

US07823115B2 Method of generating wiring routes with matching delay in the presence of process variation 有权
标题翻译：在存在过程变化的情况下生成具有匹配延迟的布线路线的方法
公开(公告)号：US07823115B2
公开(公告)日：2010-10-26
申请号：US12108629
申请日：2008-04-24
申请人： Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
发明人： Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G06F17/5077
摘要： A method and service of balancing delay in a circuit design begins with nodes that are to be connected together by a wiring design, or by being supplied with an initial wiring design that is to be altered. The wiring design will have many wiring paths, such as a first wiring path, a second wiring path, etc. Two or more of the wiring paths are designed to have matching timing, such that the time needed for a signal to travel along the first wiring path is about the same time needed for a signal to travel along the second wiring path, the third path, etc. The method/service designs one or all of the wiring paths to make the paths traverse wire segments of about the same length and orientation, within each wiring level that the first wiring path and the second wiring path traverse. Also, this process makes the first wiring path and the second wiring path traverse the wire segments in the same order, within each wiring level that the first wiring path and the second wiring path traverse.
摘要翻译：电路设计中的平衡延迟的方法和服务从通过布线设计连接在一起的节点开始，或通过提供要被改变的初始布线设计。布线设计将具有许多布线路径，例如第一布线路径，第二布线路径等。两条或多条布线路径被设计成具有匹配的定时，使得信号沿着第一布线路径行进所需的时间信号沿着第二布线路径，第三路径等移动所需的大致相同的时间。该方法/服务设计一个或所有布线路径，以使路径穿过大约相同长度的线段，并且在第一布线路径和第二布线路径横越的各布线层内。此外，该处理使得第一布线路径和第二布线路径在第一布线路径和第二布线路径横越的各布线层内以相同的顺序横穿线段。

5. 发明申请

US20080313590A1 METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGRATED CIRCUIT 有权
标题翻译：用于评估集成电路中的时序的方法和系统
公开(公告)号：US20080313590A1
公开(公告)日：2008-12-18
申请号：US12183549
申请日：2008-07-31
申请人： Eric A. FOREMAN , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
发明人： Eric A. FOREMAN , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G01R31/3016
摘要： Methods for analyzing the timing in integrated circuits and for reducing the pessimism in timing slack calculations in static timing analysis (STA). The methods involve grouping and canceling the delay contributions of elements having similar delays in early and late circuit paths. An adjusted timing slack is calculated using the delay contributions of elements having dissimilar delays. In some embodiments, the delay contributions of elements having dissimilar delays are root sum squared. Embodiments of the invention provide methods for reducing the pessimism due to both cell-based and wire-dependent delays. The delays considered in embodiments of the invention may include delays due to the location of elements in a path.
摘要翻译：用于分析集成电路中的定时并减少静态时序分析（STA）中定时松弛计算中的悲观情况的方法。该方法涉及分组和消除在早期和晚期电路路径中具有类似延迟的元件的延迟贡献。使用具有不同延迟的元件的延迟贡献来计算调整的定时松弛。在一些实施例中，具有不同延迟的元件的延迟贡献是根和平方。本发明的实施例提供了用于减少由于基于单元和线依赖的延迟引起的悲观的方法。在本发明的实施例中考虑的延迟可以包括由于路径中的元件的位置而导致的延迟。

6. 发明申请

US20080201683A1 Method of Generating Wiring Routes with Matching Delay in the Presence of Process Variation 有权
公开(公告)号：US20080201683A1
公开(公告)日：2008-08-21
申请号：US12108629
申请日：2008-04-24
申请人： Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
发明人： Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G06F17/5077
摘要： A method and service of balancing delay in a circuit design begins with nodes that are to be connected together by a wiring design, or by being supplied with an initial wiring design that is to be altered. The wiring design will have many wiring paths, such as a first wiring path, a second wiring path, etc. Two or more of the wiring paths are designed to have matching timing, such that the time needed for a signal to travel along the first wiring path is about the same time needed for a signal to travel along the second wiring path, the third path, etc. The method/service designs one or all of the wiring paths to make the paths traverse wire segments of about the same length and orientation, within each wiring level that the first wiring path and the second wiring path traverse. Also, this process makes the first wiring path and the second wiring path traverse the wire segments in the same order, within each wiring level that the first wiring path and the second wiring path traverse.

7. 发明授权

US07266474B2 Ring oscillator structure and method of separating random and systematic tolerance values 失效
标题翻译：环形振荡器结构和分离随机和系统容差值的方法
公开(公告)号：US07266474B2
公开(公告)日：2007-09-04
申请号：US11162197
申请日：2005-08-31
申请人： Peter A. Habitz , Jerry D. Hayes
发明人： Peter A. Habitz , Jerry D. Hayes
IPC分类号： G06F11/30 , H03K3/03 , G01R23/00
CPC分类号： G05B23/0221 , G01R31/2648
摘要： A ring oscillator test structure comprises at least two overlapping rings that are switchable between different numbers of stages. A delay distribution is measured for various numbers of stages in a set of oscillators formed in different locations subject to different systematic delay effects. The delay distributions are analyzed to isolate the systematic and the random contributions to the standard deviation of the distributions.
摘要翻译：环形振荡器测试结构包括可在不同数量级之间切换的至少两个重叠环。测量在不同位置处形成的一组振荡器中的不同数量的级的延迟分布，其受到不同的系统延迟效应的影响。分析延迟分布，分析系统和随机贡献与分布的标准偏差。

8. 发明授权

US07870525B2 Slack sensitivity to parameter variation based timing analysis 有权
标题翻译：对基于参数变化的时序分析的松弛敏感性
公开(公告)号：US07870525B2
公开(公告)日：2011-01-11
申请号：US12122451
申请日：2008-05-16
申请人： Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Jeffrey H. Oppold , Anthony D. Polson
发明人： Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Jeffrey H. Oppold , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F17/5045
摘要： A method, system and program product are disclosed for improving an IC design that prioritize failure coefficients of slacks that lead to correction according to their probability of failure. With an identified set of independent parameters, a sensitivity analysis is performed on each parameter by noting the difference in timing, typically on endpoint slacks, when the parameter is varied. This step is repeated for every independent parameter. A failure coefficient is then calculated from the reference slack and the sensitivity of slack for each of the timing endpoints and a determination is made as to whether at least one timing endpoint fails a threshold test. Failing timing endpoints are then prioritized for modification according to their failure coefficients. The total number of runs required is one run that is used as a reference run, plus one additional run for each parameter.
摘要翻译：公开了一种用于改进IC设计的方法，系统和程序产品，其优先考虑根据其故障概率导致校正的松弛故障系数。通过确定的一组独立参数，当参数变化时，通过注意时序上的差异，通常在端点松弛时，对每个参数执行灵敏度分析。对于每个独立参数重复此步骤。然后从参考松弛和每个定时端点的松弛的灵敏度计算失效系数，并且确定至少一个定时端点是否失败阈值测试。然后将失败的定时终点根据其故障系数进行优先级修改。所需的总运行次数是一次运行，用作参考运行，每个参数再运行一次运行。

9. 发明申请

US20100327892A1 Parallel Array Architecture for Constant Current Electro-Migration Stress Testing 失效
标题翻译：用于恒流电迁移应力测试的并行阵列架构
公开(公告)号：US20100327892A1
公开(公告)日：2010-12-30
申请号：US12492619
申请日：2009-06-26
申请人： Kanak B. Agarwal , Peter A. Habitz , Jerry D. Hayes , Ying Liu , Deborah M. Massey , Alvin W. Strong
发明人： Kanak B. Agarwal , Peter A. Habitz , Jerry D. Hayes , Ying Liu , Deborah M. Massey , Alvin W. Strong
IPC分类号： G01R31/02
CPC分类号： G01R31/2858
摘要： A parallel array architecture for constant current electro-migration stress testing is provided. The parallel array architecture comprises a device under test (DUT) array having a plurality of DUTs coupled in parallel and a plurality of localized heating elements associated with respective ones of the DUTs in the DUT array. The architecture further comprises DUT selection logic that isolates individual DUTs within the array. Moreover, the architecture comprises current source logic that provides a reference current and controls the current through the DUTs in the DUT array such that each DUT in the DUT array has substantially a same current density, and current source enable logic for selectively enabling portions for the current source logic. Electro-migration stress testing is performed on the DUTs of the DUT array using the heating elements, the DUT selection logic, current source logic, and current source enable logic.
摘要翻译：提供了一种用于恒流电迁移应力测试的并行阵列架构。并行阵列结构包括被测器件（DUT）阵列，其具有并联耦合的多个DUT和与DUT阵列中相应的DUT相关联的多个局部加热元件。该架构还包括DUT阵列中的各个DUT隔离的DUT选择逻辑。此外，该架构包括提供参考电流并且控制通过DUT阵列中的DUT的电流的电流源逻辑，使得DUT阵列中的每个DUT具有基本上相同的电流密度，以及电流源使能逻辑，用于选择性地使能部分电流源逻辑。使用加热元件，DUT选择逻辑，电流源逻辑和电流源使能逻辑在DUT阵列的DUT上执行电迁移应力测试。

10. 发明授权

US07716616B2 Slack sensitivity to parameter variation based timing analysis 失效
标题翻译：对基于参数变化的时序分析的松弛敏感性
公开(公告)号：US07716616B2
公开(公告)日：2010-05-11
申请号：US11930924
申请日：2007-10-31
申请人： Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Jeffrey H. Oppold , Anthony D. Polson
发明人： Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Jeffrey H. Oppold , Anthony D. Polson
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F17/5045
摘要： A method, system and program product are disclosed for improving an IC design that prioritize failure coefficients of slacks that lead to correction according to their probability of failure. With an identified set of independent parameters, a sensitivity analysis is performed on each parameter by noting the difference in timing, typically on endpoint slacks, when the parameter is varied. This step is repeated for every independent parameter. A failure coefficient is then calculated from the reference slack and the sensitivity of slack for each of the timing endpoints and a determination is made as to whether at least one timing endpoint fails a threshold test. Failing timing endpoints are then prioritized for modification according to their failure coefficients. The total number of runs required is one run that is used as a reference run, plus one additional run for each parameter.
摘要翻译：公开了一种用于改进IC设计的方法，系统和程序产品，其优先考虑根据其故障概率导致校正的松弛故障系数。通过确定的一组独立参数，当参数变化时，通过注意时序上的差异，通常在端点松弛时，对每个参数执行灵敏度分析。对于每个独立参数重复此步骤。然后从参考松弛和每个定时端点的松弛的灵敏度计算失效系数，并且确定至少一个定时端点是否失败阈值测试。然后将失败的定时终点根据其故障系数进行优先级修改。所需的总运行次数是一次运行，用作参考运行，每个参数再运行一次运行。

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