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    • 3. 发明授权
    • Non-intrusive interposer for accessing integrated circuit package signals
    • 用于访问集成电路封装信号的非插入式插入器
    • US07641481B2
    • 2010-01-05
    • US11870064
    • 2007-10-10
    • Mark Trobough
    • Mark Trobough
    • H01R12/00
    • H01R13/2442H01R12/714H05K7/1061
    • Disclosed is an interposer for accessing one or more signals from an Integrated Circuit (IC) package. The interposer is disposed between the IC package and a socket body. The interposer comprises a plurality of clearance holes and at least one connecting element. The plurality of clearance holes allows an array of contacts on a first surface of the socket body to pass through the interposer and make electrical contact with a first set of contacts of a plurality of contacts of the IC package. The at least one connecting element is configured to make electrical contact with a second set of contacts of the plurality of contacts of the IC package. The electrical contact between the at least one connecting element and the second set of contacts of the plurality of contacts of the IC package provides access to the one or more signals from the IC package.
    • 公开了一种用于从集成电路(IC)封装访问一个或多个信号的插入器。 插入器设置在IC封装和插座主体之间。 插入器包括多个间隙孔和至少一个连接元件。 多个间隙孔允许插座主体的第一表面上的触点阵列通过插入件并与IC封装的多个触点的第一组触点电接触。 所述至少一个连接元件构造成与所述IC封装的所述多个触点中的第二组触点进行电接触。 所述至少一个连接元件和所述IC封装的所述多个触点中的所述第二组触点之间的电接触提供对所述IC封装中的所述一个或多个信号的访问。
    • 7. 发明授权
    • Interconnection device for connecting test equipment with a circuit
board designed for fine pitch solder lead integrated circuit components
    • 用于将测试设备连接到电路板的互连设备,用于精细节距焊丝集成电路组件
    • US5418469A
    • 1995-05-23
    • US343842
    • 1994-11-23
    • Leonard TurnerMark TroboughAshok KabadiRon Flamm
    • Leonard TurnerMark TroboughAshok KabadiRon Flamm
    • G01R1/073G01R31/00
    • G01R1/07328Y10S439/912
    • An apparatus and method for reliably interconnecting a test device with a circuit board designed for fine pitch solder lead surface mounted components is described. The test equipment interface system of the present invention includes a board interconnect unit, an interposer, and a test device cable. The test device cable is coupled to a test device, which can receive and manipulate signals via the cable. These signals correspond to signals provided by a component being emulated by the present invention. A component being emulated is replaced on the circuit board by the board interconnect unit. The board interconnect unit has leads or pins in a quantity, size, and configuration corresponding to a component being emulated and is typically soldered to a circuit board under test for the purpose of analyzing and debugging the circuitry on the circuit board. The board interconnect unit features a lead frame which is attached to a metal body. The lead frame is used to route or convert the pins into an array of contact pads. The contact pads are relatively widely spaced for better access to and connection with an array of electrically conductive spring pins or contact pins of the interposer. Because the lead frame converts the fine dimension pins to a more widely spaced array of contact pads, the corresponding spring pins of the interposer do not have to be manufactured with the precise dimensional tolerances required for the manufacture of the pins.
    • 描述了一种用于将测试装置与设计用于细间距焊料引线表面安装部件的电路板可靠地互连的装置和方法。 本发明的测试设备接口系统包括板互连单元,插入器和测试设备电缆。 测试设备电缆耦合到可以经由电缆接收和操纵信号的测试设备。 这些信号对应于由本发明仿真的部件提供的信号。 正在仿真的部件由电路板互连单元在电路板上替换。 电路板互连单元具有对应于正在仿真的部件的数量,尺寸和配置的引线或引脚,并且通常被焊接到被测电路板,以分析和调试电路板上的电路。 电路板互连单元具有连接到金属体的引线框架。 引线框架用于将引脚路由或转换为接触焊盘阵列。 接触垫相对较宽地间隔开,以便更好地接触和连接插入件的导电弹簧销或接触针阵列。 因为引线框架将精细尺寸的引脚转换成更广泛间隔的接触焊盘阵列,因此插入器的相应弹簧销不必以制造引脚所需的精确尺寸公差制造。
    • 9. 发明授权
    • Interconnection device for connecting test equipment with a circuit
board designed for fine pitch solder lead integrated circuit components
    • 用于将测试设备连接到电路板的互连设备,用于精细节距焊丝集成电路组件
    • US5594356A
    • 1997-01-14
    • US382295
    • 1995-02-01
    • Leonard TurnerMark TroboughAshok KabadiRon Flamm
    • Leonard TurnerMark TroboughAshok KabadiRon Flamm
    • G01R1/073G01R31/02
    • G01R1/07328Y10S439/912
    • An apparatus and method for reliably interconnecting a test device with a circuit board designed for fine pitch solder lead surface mounted components is described. The test equipment interface system of the present invention comprises a board interconnect unit, an interposer, and a test device cable. The test device cable is coupled to a test device, which can receive and manipulate signals via the cable. These signals correspond to signals provided by a component being emulated by the present invention. A component being emulated is replaced on the circuit board by the board interconnect unit. The board interconnect unit has leads or pins in a quantity, size, and configuration corresponding to a component being emulated and is typically soldered to a circuit board under test for the purpose of analyzing and debugging the circuitry on the circuit board. The board interconnect unit comprises a lead frame which is attached to a metal body. The lead frame is used to route or convert the pins into an array of contact pads. The contact pads are relatively widely spaced for better access to and connection with an array of electrically conductive spring pins or contact pins of the interposer. Because the lead frame converts the fine dimension pins to a more widely spaced array of contact pads, the corresponding spring pins of the interposer do not have to be manufactured with the precise dimensional tolerances required for the manufacture of the pins.
    • 描述了一种用于将测试装置与设计用于细间距焊料引线表面安装部件的电路板可靠地互连的装置和方法。 本发明的测试设备接口系统包括板互连单元,插入器和测试设备电缆。 测试设备电缆耦合到可以经由电缆接收和操纵信号的测试设备。 这些信号对应于由本发明仿真的部件提供的信号。 正在仿真的部件由电路板互连单元在电路板上替换。 电路板互连单元具有对应于正在仿真的部件的数量,尺寸和配置的引线或引脚,并且通常被焊接到被测电路板,以分析和调试电路板上的电路。 板互连单元包括附接到金属体的引线框架。 引线框架用于将引脚路由或转换为接触焊盘阵列。 接触垫相对较宽地间隔开,以便更好地接触和连接插入件的导电弹簧销或接触针阵列。 因为引线框架将精细尺寸的引脚转换成更广泛间隔的接触焊盘阵列,因此插入器的相应弹簧销不必以制造引脚所需的精确尺寸公差制造。
    • 10. 发明申请
    • NON-INTRUSIVE INTERPOSER FOR ACCESSING INTEGRATED CIRCUIT PACKAGE SIGNALS
    • 用于访问集成电路封装信号的非侵入式插件
    • US20090197436A1
    • 2009-08-06
    • US11870064
    • 2007-10-10
    • Mark Trobough
    • Mark Trobough
    • H01R12/00
    • H01R13/2442H01R12/714H05K7/1061
    • Disclosed is an interposer for accessing one or more signals from an Integrated Circuit (IC) package. The interposer is disposed between the IC package and a socket body. The interposer comprises a plurality of clearance holes and at least one connecting element. The plurality of clearance holes allows an array of contacts on a first surface of the socket body to pass through the interposer and make electrical contact with a first set of contacts of a plurality of contacts of the IC package. The at least one connecting element is configured to make electrical contact with a second set of contacts of the plurality of contacts of the IC package. The electrical contact between the at least one connecting element and the second set of contacts of the plurality of contacts of the IC package provides access to the one or more signals from the IC package.
    • 公开了一种用于从集成电路(IC)封装访问一个或多个信号的插入器。 插入器设置在IC封装和插座主体之间。 插入器包括多个间隙孔和至少一个连接元件。 多个间隙孔允许插座主体的第一表面上的触点阵列通过插入件并与IC封装的多个触点的第一组触点电接触。 所述至少一个连接元件构造成与所述IC封装的所述多个触点中的第二组触点进行电接触。 所述至少一个连接元件和所述IC封装的所述多个触点中的所述第二组触点之间的电接触提供对所述IC封装中的所述一个或多个信号的访问。