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    • 3. 发明申请
    • Temperature Modulated Refractive Index Measurement
    • 温度调制折射率测量
    • US20130155395A1
    • 2013-06-20
    • US13818102
    • 2011-08-02
    • Ulrich MullerJan Kristian Kruger
    • Ulrich MullerJan Kristian Kruger
    • G01N21/41
    • G01N21/41G01N21/43G01N2021/1731G01N2201/0691
    • The present invention is directed to temperature modulated refractive index measurement. In accordance with the invention a method for determination of the complex temperature coefficient of the refractive index of a sample is provided, wherein the determination of the complex temperature coefficient of the refractive index of the sample is based on a refractive index measurement. Furthermore, the refractive index of the sample is measured over a period of time, wherein the temperature of the sample is modulated over said period of time and the complex temperature coefficient of the refractive index is calculated on the basis of the refractive index measurement over the period of time and the temperature modulation over the period of time. Additionally, a measurement system, in particular comprising a temperature control system and a processing system to carry out the above method, is disclosed.
    • 本发明涉及温度调制折射率测量。 根据本发明,提供了用于确定样品的折射率的复合温度系数的方法,其中样品的折射率的复合温度系数的确定基于折射率测量。 此外,在一段时间内测量样品的折射率,其中在所述时间段内调制样品的温度,并且基于折射率的折射率测量来计算折射率的复合温度系数 一段时间和一段时间的温度调制。 此外,公开了一种特别包括温度控制系统和执行上述方法的处理系统的测量系统。