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    • 5. 发明授权
    • High resolution technique and instrument for measuring lattice
parameters in single crystals
    • 用于测量单晶中晶格参数的高分辨率技术和仪器
    • US4961210A
    • 1990-10-02
    • US486324
    • 1990-02-28
    • Mohammad Fatemi
    • Mohammad Fatemi
    • G01N23/207
    • G01N23/207
    • A method of measuring the lattice parameter in an unknown single crystal byomparing its diffraction angle to a standard single crystal, on a double-crystal diffractometer is disclosed. The method comprises several steps including mounting the unknown and standard crystals on a mounting block of the second stage of a double-crystal diffractometer aligning a tilt axis of the crystal surface with an x-ray beam and the azimuth axis of the second stage crystal mount, rotating the mounting block until the normals of the crystals have equal vertical components, tilting the crystal about the azimuth axis until the crystal normals are in line with the x-ray beam measuring the angle of the sharpest diffraction peak from each crystal while moving the crystals laterally across the beam, rotating the crystal mounting block assembly by 180 degrees about the azimuth axis while maintaining the relative tilt between the two wafers, such that the same area of the crystal surface remains in the x-ray beam during the 180 degrees rotation, sequentially measuring the angle of sharpest diffraction peak of both crystals after rotation, and calculating the diffraction angle of the unknown crystal from the standard crystal diffraction angle by using the diffraction angles measured before and after rotation by 180 degrees and thereby removing any misorientation of the crystal normals in the horizontal plane. A novel device for performing the tilt corrections of the crystals is also disclosed.
    • 公开了一种在双晶衍射仪上通过将其衍射角与标准单晶进行比较来测量未知单晶中的晶格参数的方法。 该方法包括若干步骤,包括将未知和标准晶体安装在双晶衍射仪的第二级的安装块上,将晶体表面的倾斜轴与X射线束和第二级晶体安装座的方位轴对准 ,旋转安装块直到晶体的法线具有相等的垂直分量,使晶体围绕方位轴倾斜,直到晶体法线与测量每个晶体最尖锐衍射峰的角度的X射线束一致,同时移动 晶体横向横梁,将晶体安装块组件绕方位轴旋转180度,同时保持两个晶片之间的相对倾斜,使得在180度旋转期间晶体表面的相同面积保留在x射线束中 顺序地测量旋转后两个晶体的最尖锐的衍射峰的角度,并计算未知的cr的衍射角 通过使用在旋转之前和之后测量的衍射角180°从标准晶体衍射角度ystal,从而消除水平面中晶体法线的任何取向错误。 还公开了一种用于执行晶体倾斜校正的新型装置。