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    • 1. 发明授权
    • Method and apparatus for measuring the optical forces acting on a particle
    • 用于测量作用在颗粒上的光学力的方法和装置
    • US08637803B2
    • 2014-01-28
    • US13320503
    • 2010-05-14
    • Mario Montes UsateguiArnau Farré Flaquer
    • Mario Montes UsateguiArnau Farré Flaquer
    • H01J40/14G01N21/00H01S1/00G02B21/32
    • G02B21/32
    • An apparatus and method for measuring optical forces acting on a trapped particle. In one implementation the apparatus and method are adaptable for use in the optical train of an optical microscope that is configured to trap, with a single light beam, a particle suspended in a suspension medium between an entry cover and an exit cover of a chamber positioned on or within the microscope. The apparatus and method involves the use of a single collection lens system having a numerical aperture designed to be greater than or equal to an index of refraction index of the suspension medium intended to suspend the particle in the chamber which is placeable at or near the exit cover of the chamber of the microscope. A light sensing device is positioned at or near the back focal plane of the collection lens, or at an optical equivalent thereof, which is capable of directly or indirectly producing optical force measurements acting on the particle derived by the x and y coordinates of the centroid of the light distribution imaged onto the light sensing device by the collection lens.
    • 用于测量作用在被捕获的颗粒上的光学力的装置和方法。 在一个实施方案中,该装置和方法适用于光学显微镜的光学系列,该光学显微镜的光学系列被构造成用单个光束将悬浮在悬浮介质中的颗粒捕获在位于所述腔室的入口盖和出口盖之间 在显微镜下或内。 该装置和方法涉及使用具有数值孔径的单个收集透镜系统,该数字孔径被设计为大于或等于用于将颗粒悬浮在室中的悬浮介质的折射率指数,该室可放置在出口处或附近 显微镜室的盖子。 光感测装置位于收集透镜的后焦平面或其光学等效物处或附近,其能够直接或间接产生作用在由质心的x和y坐标导出的颗粒上的光学力测量 通过收集透镜成像到光感测装置上的光分布。
    • 2. 发明申请
    • Method and Apparatus for Measuring the Optical Forces Acting on a Particle
    • 用于测量作用在颗粒上的光力的方法和装置
    • US20120068059A1
    • 2012-03-22
    • US13320503
    • 2010-05-14
    • Mario Montes UsateguiAmau Farré Flaquer
    • Mario Montes UsateguiAmau Farré Flaquer
    • H01S1/00G02B21/32
    • G02B21/32
    • An apparatus and method for measuring optical forces acting on a trapped particle. In one implementation the apparatus and method are adaptable for use in the optical train of an optical microscope that is configured to trap, with a single light beam, a particle suspended in a suspension medium between an entry cover and an exit cover of a chamber positioned on or within the microscope. The apparatus and method involves the use of a single collection lens system having a numerical aperture designed to be greater than or equal to an index of refraction index of the suspension medium intended to suspend the particle in the chamber which is placeable at or near the exit cover of the chamber of the microscope. A light sensing device is positioned at or near the back focal plane of the collection lens, or at an optical equivalent thereof, which is capable of directly or indirectly producing optical force measurements acting on the particle derived by the x and y coordinates of the centroid of the light distribution imaged onto the light sensing device by the collection lens.
    • 用于测量作用在被捕获的颗粒上的光学力的装置和方法。 在一个实施方案中,该装置和方法适用于光学显微镜的光学系列,该光学显微镜的光学系列被构造成用单个光束将悬浮在悬浮介质中的颗粒捕获在位于所述腔室的入口盖和出口盖之间 在显微镜下或内。 该装置和方法涉及使用具有数值孔径的单个收集透镜系统,该数字孔径被设计为大于或等于用于将颗粒悬浮在室中的悬浮介质的折射率指数,该室可放置在出口处或附近 显微镜室的盖子。 光感测装置位于收集透镜的后焦平面或其光学等效物处或附近,其能够直接或间接产生作用在由质心的x和y坐标导出的颗粒上的光学力测量 通过收集透镜成像到光感测装置上的光分布。