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    • 6. 发明授权
    • Method of optimizing solid state drive soft retry voltages
    • 优化固态硬盘软重试电压的方法
    • US09025393B2
    • 2015-05-05
    • US13856179
    • 2013-04-03
    • LSI Corporation
    • Yunxiang WuZhengang ChenYingQuan WuNing Chen
    • G11C11/56G11C29/42G11C16/00G11C29/02G11C29/50
    • G11C11/5642G11C16/00G11C29/023G11C29/028G11C29/42G11C29/50004
    • A method of optimizing solid state drive (SSD) soft retry voltages comprises limiting a number of voltage reads and properly spacing and determining the reference voltage at which each voltage is read based on desired Bit Error Rate (BER) and channel throughput. The method determines each reference voltage for a number of soft retry voltage reads based on a hard decision read. The spacing between each read reference voltage is constant since each SSD type requires a number of reads for an accurate presentation of soft retry voltages. The voltage distance between each successive read is limited to a multiple of the constant spacing while the multiple is based on success or failure of the first read. The method determines a limited number of reads, the constant spacing between reads, and a desired reference voltage for each read, thereby increasing valuable throughput of the channel and decreasing BER.
    • 优化固态驱动(SSD)软重试电压的方法包括基于所需的误码率(BER)和信道吞吐量来限制多个电压读取和适当的间隔并确定读取每个电压的参考电压。 该方法基于硬判决读取确定多个软重试电压读取的每个参考电压。 每个读取参考电压之间的间距是恒定的,因为每个SSD类型需要多个读取以精确呈现软重试电压。 每个连续读取之间的电压距离被限制为恒定间隔的倍数,而倍数是基于第一次读取的成功或失败。 该方法确定读数的有限数量,读取之间的恒定间隔和每次读取的期望参考电压,从而增加了信道的有价值的吞吐量并降低了BER。
    • 7. 发明授权
    • Lempel-Ziv data compression with shortened hash chains based on repetitive patterns
    • 基于重复模式的Lempel-Ziv数据压缩与缩短的哈希链
    • US08912932B2
    • 2014-12-16
    • US13803946
    • 2013-03-14
    • LSI Corporation
    • Ning ChenRobin Sik
    • H03M7/30
    • H03M7/3086
    • Methods and apparatus are provided for Lempel-Ziv data compression with shortened hash chains based on repetitive multi-byte runs. Data is compressed by processing a sequence of data to identify a repetitive pattern, such as a multi-byte run; and providing indicators associated with the sequence of data of a start position and an end position of the repetitive pattern. The indicators of the start and end positions of the repetitive pattern may comprise, for example, flags associated with the positions. The indicators of the start and end positions of the repetitive pattern are processed to determine a sequence length of the repetitive pattern. In addition, a match can be identified in the sequence of data having a length that is greater than or equal to an offset of s bytes to identify a run comprised of an s-byte sequence.
    • 提供了基于重复多字节运行的具有缩短的散列链的Lempel-Ziv数据压缩的方法和装置。 通过处理数据序列来压缩数据以识别重复模式,例如多字节运行; 并提供与重复模式的开始位置和结束位置的数据序列相关联的指示符。 重复模式的开始和结束位置的指示符可以包括例如与位置相关联的标志。 处理重复图案的开始和结束位置的指示符以确定重复图案的序列长度。 此外,可以在具有大于或等于s字节的偏移的长度的数据序列中识别匹配,以识别由s字节序列组成的运行。
    • 8. 发明申请
    • Method of Optimizing Solid State Drive Soft Retry Voltages
    • 优化固态硬盘软重试电压的方法
    • US20140286102A1
    • 2014-09-25
    • US13856179
    • 2013-04-03
    • LSI CORPORATION
    • Yunxiang WuZhengang ChenYingQuan WuNing Chen
    • G11C29/04
    • G11C11/5642G11C16/00G11C29/023G11C29/028G11C29/42G11C29/50004
    • A method of optimizing solid state drive (SSD) soft retry voltages comprises limiting a number of voltage reads and properly spacing and determining the reference voltage at which each voltage is read based on desired Bit Error Rate (BER) and channel throughput. The method determines each reference voltage for a number of soft retry voltage reads based on a hard decision read. The spacing between each read reference voltage is constant since each SSD type requires a number of reads for an accurate presentation of soft retry voltages. The voltage distance between each successive read is limited to a multiple of the constant spacing while the multiple is based on success or failure of the first read. The method determines a limited number of reads, the constant spacing between reads, and a desired reference voltage for each read, thereby increasing valuable throughput of the channel and decreasing BER.
    • 优化固态驱动(SSD)软重试电压的方法包括基于所需的误码率(BER)和信道吞吐量来限制多个电压读取和适当的间隔并确定读取每个电压的参考电压。 该方法基于硬判决读取确定多个软重试电压读取的每个参考电压。 每个读取参考电压之间的间距是恒定的,因为每个SSD类型需要多个读取以精确呈现软重试电压。 每个连续读取之间的电压距离被限制为恒定间隔的倍数,而倍数是基于第一次读取的成功或失败。 该方法确定读数的有限数量,读取之间的恒定间隔和每次读取的期望参考电压,从而增加了信道的有价值的吞吐量并降低了BER。