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1. 发明授权

US5025655A Impact test hammer 失效
标题翻译：冲击试验锤
公开(公告)号：US5025655A
公开(公告)日：1991-06-25
申请号：US507116
申请日：1990-04-10
申请人： Kiyoshi Umemura , Teruo Irie
发明人： Kiyoshi Umemura , Teruo Irie
IPC分类号： G01M7/08 , G01N3/00 , G01N3/30 , G01N3/31
CPC分类号： G01M7/08 , G01N3/30 , G01N2203/0039 , G01N2203/0623
摘要： An impact test hammer includes a cylindrical handle having opposite first and second end portions and a hollow interior, a sensor portion fixed to the first end portion of the handle, and a grip portion fixed to the second end portion of the handle. An elastic striking portion is fixed to an outer periphery of the sensor storage portion, and an impact acceleration sensor is housed within the sensor storage portion for sensing a striking power of the elastic striking portion applied to a test object. A circuit is housed within the grip portion and operatively connected to the sensor by way of wiring extending through the hollow interior of the handle. Such a circuit includes a range switch, a scale conversion amplifier and a wind amplifier. A knob is provided on the outer periphery of the grip portion for operating the range switch to set a degree of amplification of the amplifier. The amplifier receives a signal from the sensor and amplifies the signal according to the amplification degree set by the range switch. The wind comparator outputs an indicator actuation signal when the output from the amplifier falls within a specified range which is determined based on the characteristics of the test object.
摘要翻译：冲击试验锤包括具有相对的第一和第二端部和中空内部的圆柱形手柄，固定到手柄的第一端部的传感器部分和固定到手柄的第二端部的把手部分。弹性击打部固定在传感器存储部的外周，冲击加速度传感器被容纳在传感器收纳部内，用于感测施加于被检体的弹性打击部的打击力。电路容纳在把手部分内并且通过延伸穿过手柄的中空内部的布线可操作地连接到传感器。这种电路包括量程开关，比例转换放大器和风力放大器。在把手部分的外周设有旋钮，用于操作量程开关以设定放大器的放大程度。放大器从传感器接收信号，并根据由量程开关设置的放大度放大信号。当放大器的输出落在基于测试对象的特性确定的指定范围内时，风力比较器输出指示器致动信号。

2. 发明授权

US4978914A Laminated board for testing electronic components 失效
标题翻译：用于电子元件测试的层压板
公开(公告)号：US4978914A
公开(公告)日：1990-12-18
申请号：US517433
申请日：1990-04-24
申请人： Mitsuru Akimoto , Takamasa Jimbo , Kiyoshi Umemura , Haruhiko Iwase , Kenzirou Ogawa
发明人： Mitsuru Akimoto , Takamasa Jimbo , Kiyoshi Umemura , Haruhiko Iwase , Kenzirou Ogawa
IPC分类号： G01R1/04 , H05K1/02 , H05K1/16 , H05K3/46
CPC分类号： G01R1/04 , H05K1/0212 , H05K1/167 , H05K2201/0209 , H05K2203/1115 , H05K2203/162 , H05K2203/165 , H05K3/4641
摘要： An electronic component testing laminated board suitable for performing a heat test on electronic components of a multikind and small quantity production type. The laminated board includes a metal plate, a testing circuit layer including a double-sided printing wiring board or the like and integrally formed through a thin electric insulating layer on one side of the metal plate for mounting thereon electronic components to be tested, and a heater circuit layer including a metal foil circuit or the like and integrally formed through another electric insulating layer on the other side of the metal plate for maintaining the testing circuit layer at a given temperature. An inorganic filler or the like is added to the electric insulating layers. An electronic component testing box for removably accommodating the electronic component testing lamianted board includes walls made of a heat insulating material, power supply connecting connector, signal input and output connector, temperature measuring apparatus, etc.

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