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    • 2. 发明授权
    • Inter-block interface circuit and system LSI
    • 块间​​接口电路和系统LSI
    • US06882175B2
    • 2005-04-19
    • US10460175
    • 2003-06-13
    • Isao MotegiEiji Nagata
    • Isao MotegiEiji Nagata
    • H01L21/822H01L27/04H03K19/00H03K17/16H03K19/003
    • H03K19/0016
    • An inter-block interface circuit which effectively prevents occurrences of inconveniences (for example, such that a shoot-through current flows due to unsteady potential in wiring) caused by switching off a power supply of a block, using simple circuitry, in LSI such that signals are communicated between the blocks and the power supplies of the blocks are interrupted independently. In the circuit, gate circuits 112 and 114 are respectively provided in blocks 102 and 104 that communicate signals with one another, and interface control circuit 202 dynamically controls respective input levels of gate circuits 112 and 114. In other words, the circuit 202 fixes an input level of gate circuit 112 or 114 in a block whose power supply is ON to “L”, and thereby compulsively fixes an output level of the gate circuit to “L”.
    • 一种块间接口电路,其有效地防止了在LSI中使用简单的电路关闭块的电源而引起的不方便(例如,由于布线中的不稳定电位而导致直通电流流动) 信号在块之间通信,块的电源被独立中断。 在电路中,门电路112和114分别设置在彼此传送信号的块102和104中,并且接口控制电路202动态地控制门电路112和114的相应输入电平。 换句话说,电路202将电源接通的块中的门电路112或114的输入电平固定为“L”,从而强制将门电路的输出电平固定为“L”。
    • 6. 发明授权
    • Isolation testing circuit and testing circuit optimization method
    • 隔离测试电路和测试电路优化方法
    • US07146550B2
    • 2006-12-05
    • US10792809
    • 2004-03-05
    • Eiji Nagata
    • Eiji Nagata
    • G01R31/28G06F17/50
    • G01R31/31704H01L2924/0002H01L2924/00
    • In order to avoid generation of a routing complexity of LSI and a signal rounding due to insertion of the isolation testing circuit, if a plurality of IPs are incorporated into LSI, the present invention provides an isolation testing circuits having test switching selectors 731 to 736 for selecting any one of a test input signal (or a test input transit signal) and a normal input signal, and test signal transit buffers 721 to 726 for relaying the test input signal (or the test input transit signal) are formed in respective IP blocks 701 to 706 incorporated into an LSI. Adjacent isolation testing circuits are connected mutually based on a floor plan or layout placement information such that a wiring length of a test input signal 709 and test input transit signals 710 to 714, which are connected in a single stroke of a pen, can be reduced shortest.
    • 为了避免由于隔离测试电路的插入而导致LSI的布线复杂度的产生和舍入的信号,如果多个IP被并入到LSI中,本发明提供一种具有测试切换选择器731至736的隔离测试电路,用于 选择测试输入信号(或测试输入转接信号)和正常输入信号中的任何一个,并且在相应的IP块中形成用于中继测试输入信号(或测试输入转接信号)的测试信号中继缓冲器721至726 701至706并入LSI。 相邻的隔离测试电路基于平面图或布局布置信息相互连接,使得可以减少连接在笔的单个行程中的测试输入信号709和测试输入转接信号710至714的布线长度 最短
    • 10. 发明授权
    • Dielectric resonator controlled oscillator having a raised frequency
multiplying efficiency
    • 具有升高的倍频效率的介质谐振器控制振荡器
    • US4736168A
    • 1988-04-05
    • US43286
    • 1987-03-18
    • Eiji Nagata
    • Eiji Nagata
    • H03B19/00H03B5/18H03B19/14
    • H03B5/1876H03B19/14H03B2200/007H03B5/1852
    • In a dielectric resonator controlled oscillator with frequency multiplication, a line (12) has an open end and another end connected to a gate electrode of an FET (11) with a dielectric resonator (13) electromagnetically coupled to the line at a location along a total length of the line. The total length is selected to make a combination of the line and the dielectric resonator have a substantially zero impedance for a higher harmonic frequency when seen from the gate electrode. More specifically, the total length is selected so as to be equal to about three quarters of a wavelength which a frequency multiplied oscillation, such as a frequency doubled oscillation, has in the line. The location is selected so as to optimize the oscillator for a fundamental oscillation of a fundamental frequency determined by the dielectric resonator.
    • PCT No.PCT / JP86 / 00390 Sec。 371日期1987年3月18日 102(e)1987年3月18日PCT PCT 1986年7月23日PCT公布。 公开号WO87 / 00707 日本1987年1月29日。在具有倍频的介质谐振器控制振荡器中,线(12)具有开口端,另一端连接到具有电介质谐振器(13)的FET(11)的栅电极,电介质谐振器 沿着线的总长度的一个位置的线。 总长度被选择为使得当从栅电极观察时,线和介质谐振器的组合对于较高谐波频率具有基本零阻抗。 更具体地,总长度被选择为等于频率倍增振荡(例如倍频振荡)的波长的大约四分之三。 选择该位置以优化用于由介质谐振器确定的基频的基本振荡的振荡器。