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    • 5. 发明授权
    • Reference cell repair scheme
    • 参考细胞修复方案
    • US09147457B2
    • 2015-09-29
    • US13613038
    • 2012-09-13
    • Jung Pill KimTaehyun KimSungryul Kim
    • Jung Pill KimTaehyun KimSungryul Kim
    • G11C11/00G11C11/16G11C29/00
    • G11C11/16G11C11/165G11C11/1673G11C29/787G11C29/832
    • In a magnetic random access memory (MRAM), numerous arrays of reference bit cells are coupled together by coupling their respective bit lines to a merged reference node. Pass gate circuitry coupled between the respective reference bit lines and the merged reference node is configured for selectively coupling or decoupling one or more of the reference bit lines to and from the merged reference node. The pass gate circuitry is controllable by programming one-time programmable devices coupled to the pass gate circuitry. The one-time programmable devices can be programmed to decouple flawed arrays of reference bit cells from the merged reference node or to select between redundant arrays of reference bit cells for coupling to the reference node.
    • 在磁随机存取存储器(MRAM)中,参考位单元的多个阵列通过将它们各自的位线耦合到合并的参考节点而耦合在一起。 耦合在相应的参考位线和合并的参考节点之间的通过门电路被配置用于选择性地将一个或多个参考位线耦合或去耦合到合并的参考节点。 传递门电路可通过编程耦合到通路电路的一次可编程器件来控制。 一次性可编程器件可以被编程为将参考位单元的有缺陷的阵列与合并的参考节点去耦,或者在用于耦合到参考节点的参考位单元的冗余阵列之间进行选择。
    • 6. 发明申请
    • REFERENCE CELL REPAIR SCHEME
    • 参考细胞修复方案
    • US20140071738A1
    • 2014-03-13
    • US13613038
    • 2012-09-13
    • Jung Pill KimTaehyun KimSungryul Kim
    • Jung Pill KimTaehyun KimSungryul Kim
    • G11C11/16
    • G11C11/16G11C11/165G11C11/1673G11C29/787G11C29/832
    • In a magnetic random access memory (MRAM), numerous arrays of reference bit cells are coupled together by coupling their respective bit lines to a merged reference node. Pass gate circuitry coupled between the respective reference bit lines and the merged reference node is configured for selectively coupling or decoupling one or more of the reference bit lines to and from the merged reference node. The pass gate circuitry is controllable by programming one-time programmable devices coupled to the pass gate circuitry. The one-time programmable devices can be programmed to decouple flawed arrays of reference bit cells from the merged reference node or to select between redundant arrays of reference bit cells for coupling to the reference node.
    • 在磁随机存取存储器(MRAM)中,参考位单元的多个阵列通过将它们各自的位线耦合到合并的参考节点而耦合在一起。 耦合在相应的参考位线和合并的参考节点之间的通过门电路被配置用于选择性地将一个或多个参考位线耦合或去耦合到合并的参考节点。 传递门电路可通过编程耦合到通路电路的一次可编程器件来控制。 一次性可编程器件可以被编程为将参考位单元的有缺陷的阵列与合并的参考节点去耦,或者在用于耦合到参考节点的参考位单元的冗余阵列之间进行选择。
    • 9. 发明申请
    • REFERENCE LEVEL ADJUSTMENT SCHEME
    • 参考水平调整方案
    • US20140071739A1
    • 2014-03-13
    • US13613100
    • 2012-09-13
    • Jung Pill KimTaehyun KimSungryul KimXia Li
    • Jung Pill KimTaehyun KimSungryul KimXia Li
    • G11C11/16
    • G11C11/1675G11C7/12G11C11/16
    • A tunable reference cell scheme for magnetic random access memory (MRAM) circuitry selectively couples reference cells and data cells to shared write driver circuitry. Magnetic tunnel junctions (MTJs) in the reference cells can be programmed to a selected magnetic orientation using the shared write driver circuitry. The programmed reference cells can be merged with other programmed reference cells and/or with fixed reference cells to produce a tunable reference level for comparison with MTJ data cells during a read operation. Sharing write driver circuitry between data cells and reference cells allows programming of reference cells without consuming increased area on a chip or macro.
    • 用于磁随机存取存储器(MRAM)电路的可调谐参考单元方案选择性地将参考单元和数据单元耦合到共享写入驱动器电路。 可以使用共享写入驱动器电路将参考单元中的磁隧道结(MTJ)编程为选定的磁方向。 编程的参考单元可以与其他编程的参考单元和/或与固定参考单元合并,以产生可读参考水平,以便在读操作期间与MTJ数据单元进行比较。 在数据单元和参考单元之间共享写入驱动器电路可以编程参考单元,而不会消耗芯片或宏上的增加的面积。