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1. 发明授权

US08612813B2 Circuit and method for efficient memory repair 有权
标题翻译：电路和方法进行高效的内存修复
公开(公告)号：US08612813B2
公开(公告)日：2013-12-17
申请号：US13750497
申请日：2013-01-25
申请人： International Business Machines Corporation
发明人： Valerie H. Chickanosky , Kevin W. Gorman , Suzanne Granato , Michael R. Ouellette
IPC分类号： G06F11/00 , G01R31/28 , G11C29/00
CPC分类号： G11C29/44 , G11C29/4401 , G11C29/76 , G11C2029/0401
摘要： A circuit and method of testing a memory and calculating a repair solution for a given address location includes pausing a built in self test (BIST) operation on detection of a failing memory output data of an integrated circuit. During the pause, the circuit and method analyzes “n” number of groups of the failing memory output data during “n” cycles using analysis logic and calculating a repair solution. Normal operations can be resumed.
摘要翻译：一种用于测试存储器并为给定地址位置计算修复解决方案的电路和方法包括：在检测集成电路的故障存储器输出数据时暂停内置自检（BIST）操作。在暂停期间，电路和方法使用分析逻辑在“n”个周期期间分析“n”个故障存储器输出数据组，并计算修复解决方案。正常操作可以恢复。

2. 发明申请

US20140129888A1 STAGGERED START OF BIST CONTROLLERS AND BIST ENGINES 有权
标题翻译：突击控制器和主机启动
公开(公告)号：US20140129888A1
公开(公告)日：2014-05-08
申请号：US13671605
申请日：2012-11-08
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Valerie H. Chickanosky , Kevin W. Gorman , Suzanne Granato , Michael R. Ouellette , Nancy H. Pratt , Michael A. Ziegerhofer
IPC分类号： G01R31/3177
CPC分类号： G01R31/31724
摘要： Each register in each built-in self-test (BIST) controller contains a BIST controller-specific start count value that is different from at least one other BIST controller-specific start count. A test controller provides a start command simultaneously to all the BIST controllers. This causes each of the BIST controllers to simultaneously begin a countdown of the BIST controller-specific start count values, using a counter. Each of the BIST controllers starts a test procedure in a corresponding BIST domain when the countdown completes (in the corresponding BIST controller). Thus, the test procedure starts at different times in at least two of the BIST domains based on the difference of the BIST controller-specific start count values in the different registers. Further, during the test procedure, each stagger controller can stagger the start of each BIST engine within the corresponding BIST domain to which the stagger controller is connected.
摘要翻译：每个内置自检（BIST）控制器中的每个寄存器包含与至少一个其他BIST控制器特定启动计数不同的BIST控制器特定的起始计数值。测试控制器同时向所有BIST控制器提供启动命令。这使得每个BIST控制器使用计数器同时开始BIST控制器特定的开始计数值的倒计时。每个BIST控制器在倒计时完成时（在相应的BIST控制器中），在对应的BIST域中启动测试过程。因此，根据不同寄存器中BIST控制器特定的开始计数值的差异，测试过程在至少两个BIST域中的不同时间开始。此外，在测试过程中，每个交错控制器可以错开交错控制器所连接的相应BIST域内的每个BIST引擎的开始。

3. 发明授权

US08935586B2 Staggered start of BIST controllers and BIST engines 有权
标题翻译： BIST控制器和BIST引擎交错启动
公开(公告)号：US08935586B2
公开(公告)日：2015-01-13
申请号：US13671605
申请日：2012-11-08
申请人： International Business Machines Corporation
发明人： Valarie H. Chickanosky , Kevin W. Gorman , Suzanne Granato , Michael R. Ouellette , Nancy H. Pratt , Michael A. Ziegerhofer
IPC分类号： G01R31/28
CPC分类号： G01R31/31724
摘要： Each register in each built-in self-test (BIST) controller contains a BIST controller-specific start count value that is different from at least one other BIST controller-specific start count. A test controller provides a start command simultaneously to all the BIST controllers. This causes each of the BIST controllers to simultaneously begin a countdown of the BIST controller-specific start count values, using a counter. Each of the BIST controllers starts a test procedure in a corresponding BIST domain when the countdown completes (in the corresponding BIST controller). Thus, the test procedure starts at different times in at least two of the BIST domains based on the difference of the BIST controller-specific start count values in the different registers. Further, during the test procedure, each stagger controller can stagger the start of each BIST engine within the corresponding BIST domain to which the stagger controller is connected.
摘要翻译：每个内置自检（BIST）控制器中的每个寄存器包含与至少一个其他BIST控制器特定启动计数不同的BIST控制器特定的起始计数值。测试控制器同时向所有BIST控制器提供启动命令。这使得每个BIST控制器使用计数器同时开始BIST控制器特定的开始计数值的倒计时。每个BIST控制器在倒计时完成时（在相应的BIST控制器中），在对应的BIST域中启动测试过程。因此，根据不同寄存器中BIST控制器特定的开始计数值的差异，测试过程在至少两个BIST域中的不同时间开始。此外，在测试过程中，每个交错控制器可以错开交错控制器所连接的相应BIST域内的每个BIST引擎的开始。

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