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1. 发明授权

US08799703B2 Methods and systems for measuring I/O signals 有权
标题翻译：用于测量I / O信号的方法和系统
公开(公告)号：US08799703B2
公开(公告)日：2014-08-05
申请号：US14027464
申请日：2013-09-16
申请人： Infineon Technologies AG
发明人： Simon Brewerton , Patrick Leteinturier , Oreste Bernardi , Antonio Vilela , Klaus Scheibert , Jens Barrenscheen
IPC分类号： G06F11/00
CPC分类号： G06F11/263 , G06F11/0739 , G06F11/0754 , G06F11/3013 , G06F11/3068
摘要： Some embodiments of the invention relate to an embedded processing system. The system includes a memory unit to store a plurality of operating instructions and a processing unit coupled to the memory unit. The processing unit can execute logical operations corresponding to respective operating instructions. An input/output (I/O) interface receives a first time-varying waveform and provides an I/O signal that is based on the first time-varying waveform. A comparison unit coupled to the processing unit and adapted to selectively assert an error signal based on whether the I/O signal has a predetermined relationship with a reference signal, wherein the predetermined relationship holds true during normal operation but fails to hold true when an unexpected event occurs and causes an unexpected change at least one of the I/O signal and reference signal.
摘要翻译：本发明的一些实施例涉及一种嵌入式处理系统。该系统包括用于存储多个操作指令的存储器单元和耦合到存储器单元的处理单元。处理单元可以执行与各个操作指令相对应的逻辑操作。输入/输出（I / O）接口接收第一时变波形并提供基于第一时变波形的I / O信号。比较单元，耦合到所述处理单元，并且适于基于所述I / O信号是否与参考信号具有预定关系来选择性地确定错误信号，其中所述预定关系在正常操作期间成立，但是当意外事件发生并导致至少一个I / O信号和参考信号的意外变化。

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