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1. 发明公开

US20240389977A1 ULTRASONIC DIAGNOSTIC DEVICE 审中-公开
公开(公告)号：US20240389977A1
公开(公告)日：2024-11-28
申请号：US18797874
申请日：2024-08-08
申请人： IHI Corporation
发明人： Toshiaki HAMANO
IPC分类号： A61B8/00 , G01C9/02 , G01S7/52
CPC分类号： A61B8/4254 , A61B8/461 , G01C9/02 , G01S7/52057 , G01S7/52085
摘要： Provided is an ultrasound diagnostic device comprising: a sheet material that is capable of being attached to a surface of a living body and has a two-dimensional code drawn on a surface thereof; an ultrasonic transducer; a probe; an imaging device that is provided to the probe and is capable of imaging the two-dimensional code; an inclination angle sensor provided to the probe; a probe specifying unit configured to specify a position of the probe on the surface of the living body based on the two-dimensional code imaged by the imaging device, and specify an inclination angle of the probe with respect to a vertical direction based on a detection result given by the inclination angle sensor; and an image generating unit configured to generate a diagnostic image indicating a result of ultrasound diagnostic of the living body based on the ultrasonic wave echo.

2. 发明申请

US20170219422A1 INSPECTION PROBE 审中-公开
公开(公告)号：US20170219422A1
公开(公告)日：2017-08-03
申请号：US15491318
申请日：2017-04-19
申请人： IHI CORPORATION
发明人： Toshiaki HAMANO , Eisuke SHIINA
IPC分类号： G01H9/00 , G01V8/10 , G01N29/04
CPC分类号： G01H9/008 , G01N29/04 , G01N29/2468 , G01N29/2487 , G01N29/265 , G01N2291/044 , G01N2291/056 , G01N2291/2634 , G01N2291/267 , G01V8/10
摘要： Disclosed is an inspection probe of an inspection system that includes an ultrasonic probe that is freely movable on a test object and irradiates the test object with an ultrasonic wave to detect a reflected wave, and a calculation unit that executes arithmetic processing according to a detection result according to the ultrasonic probe to acquire a flaw detection result of the test object. The inspection probe includes a chassis that is freely movable on a sheet material where a two-dimensional pattern disposed on the test object and indicating a position on the test object is drawn. The ultrasonic probe is fixed to the chassis so that an incident point of an ultrasonic wave that is incident onto an opposing surface of the test object from the ultrasonic probe is within an angle of view of the reader which reads the two-dimensional pattern.

3. 发明申请

US20210390680A1 ULTRASONIC FLAW DETECTION DEVICE 有权
公开(公告)号：US20210390680A1
公开(公告)日：2021-12-16
申请号：US17412619
申请日：2021-08-26
申请人： IHI CORPORATION
发明人： Toshiaki HAMANO
IPC分类号： G06T7/00
摘要： An ultrasonic flaw detection device (A) includes: an ultrasonic probe (2) that emits ultrasonic waves to an inspection object (P) and detects reflected waves; a sheet material (1) attached to a surface of the inspection object and having two-dimensional patterns, the two-dimensional patterns being arranged on the inspection object and indicating positions on the inspection object; an imaging device (3) attached to the ultrasonic probe and imaging the two-dimensional patterns (1a); and a processing unit (21) that reads position information indicating a position on the inspection object from a captured image captured by the imaging device and relates a detection result of the ultrasonic probe to the position information, wherein the processing unit determines an index indicating the degree of quality of the detection result based on an air pocket area (HA) that is an area in which air pockets are shown in a predetermined area (H) of the captured image.

4. 发明申请

US20220137002A1 ULTRASONIC FLAW DETECTION DEVICE 有权
公开(公告)号：US20220137002A1
公开(公告)日：2022-05-05
申请号：US17434087
申请日：2020-02-28
申请人： IHI CORPORATION
发明人： Toshiaki HAMANO
IPC分类号： G01N29/06 , G01N29/04 , G01N29/24 , G01N29/26
摘要： An ultrasonic flaw detection device includes: an ultrasonic probe that detects waveform data of ultrasonic echoes emitted to an inspection area of an inspection target; a processing unit that stores pieces of sampling data obtained by sampling the waveform data obtained by the ultrasonic probe at predetermined sampling intervals in a storage unit continuously in time series; and a display control unit that divides the inspection area into a plurality of divided areas and displays each of the plurality of divided areas on a display, wherein the processing unit directly or indirectly links a divided area of the plurality of divided areas to one or more waveform data containing sampling data of one or more sampling point included in the divided area.

5. 发明申请

US20160231284A1 INSPECTION SYSTEM 审中-公开
标题翻译：检查系统
公开(公告)号：US20160231284A1
公开(公告)日：2016-08-11
申请号：US15134686
申请日：2016-04-21
申请人： IHI CORPORATION
发明人： Eisuke SHIINA , Toshiaki HAMANO , Takuya SHIMOMURA
IPC分类号： G01N29/04 , G01B17/00
摘要： An inspection system includes: a sheet material that is attached to a surface of a pipe and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; a reader that is mounted to an ultrasonic probe and reads the two-dimensional patterns; and a calculation unit that acquires position data on the pipe based on the two-dimensional patterns read by the reader. The inspection system associates the position data with a flaw detection result obtained from a detection result based on the ultrasonic probe.
摘要翻译：检查系统包括：片材，其附接到管的表面并且具有布置在其上的二维图案，其布置在管上并且指示管上的位置; 读取器，其被安装到超声波探头并读取二维图案; 以及计算单元，其基于由读取器读取的二维图案来获取管道上的位置数据。检查系统将位置数据与基于超声波探头的检测结果获得的缺陷检测结果相关联。

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