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    • 3. 发明申请
    • Ion trap mass spectrometry method
    • 离子阱质谱法
    • US20080054173A1
    • 2008-03-06
    • US11889232
    • 2007-08-10
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • H01J49/04
    • H01J49/4265H01J49/0081
    • According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
    • 根据本发明的一个方面,提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪,该质谱仪包括:用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤:通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。
    • 5. 发明授权
    • Ion trap mass spectrometry method
    • 离子阱质谱法
    • US07989764B2
    • 2011-08-02
    • US11889232
    • 2007-08-10
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • H01J49/42H01J49/40
    • H01J49/4265H01J49/0081
    • According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
    • 根据本发明的一个方面,提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪,该质谱仪包括:用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤:通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。
    • 6. 发明申请
    • MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
    • 质谱仪和质谱方法
    • US20090179148A1
    • 2009-07-16
    • US12350328
    • 2009-01-08
    • Hiroyuki YasudaYasushi TeruiShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaYasushi TeruiShinji NagaiTetsuya Nishida
    • B01D59/44H01J49/00
    • H01J49/004H01J49/063
    • Performing an MS3 with a tandem mass spectrometer causes problems of increase in size of the device and of increase in cost. Likewise, a plural number of times MS/MS analyses are even more difficult. An electrode to create a harmonic potential is disposed in a collision cell, and fragment ions produced by the first-time collision induced dissociation are accumulated in the harmonic potential. Target ions of the subsequent stage are let out, by means of an axial resonance excitation, selectively from the accumulated ions. The ions are excited in the axial direction to have a potential exceeding the harmonic potential. Thereby, the second-time collision induced dissociation is performed by means of a potential difference provided at the subsequent stage. In addition, an operation to return the ions back to the harmonic potential enables a plural number of times MS/MS analyses to be performed.
    • 使用串联质谱仪进行MS3会导致设备尺寸增加和成本增加的问题。 同样,多次MS / MS分析更加困难。 用于产生谐波电位的电极设置在碰撞室中,并且由第一次碰撞引起的解离产生的碎片离子累积在谐波电位中。 选择性地从累积的离子中排出后续阶段的目标离子,借助于轴向共振激发。 离子在轴向上被激发以具有超过谐波电位的电位。 因此,通过在后续阶段提供的电位差来执行第二次碰撞诱导解离。 此外,使离子返回到谐波电位的操作能够进行多次MS / MS分析。
    • 9. 发明申请
    • MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
    • 质谱仪和质谱方法
    • US20130228682A1
    • 2013-09-05
    • US13885435
    • 2011-11-17
    • Hiroyuki YasudaShinji Yoshioka
    • Hiroyuki YasudaShinji Yoshioka
    • H01J49/14H01J49/00
    • H01J49/14H01J49/0031H01J49/0045H01J49/063H01J49/4255
    • A mass spectrometer is provided including: a collision chamber of generating fragment ions by superimposingly applying an AC voltage and a first DC voltage between linear multipolar electrodes, and accelerating the fragment ions by applying a second DC voltage between a front stage electrode and a later stage electrode; a mass spectrometer unit of carrying out mass separation of the fragment ions; and a control unit of determining the second DC voltage based on the mass-to-charge ratios such that the rates of the fragment ions in the collision chamber become equal regardless of the mass-to-charge ratios. Herein, the control unit increases the second DC voltage as the mass-to-charge ratios selected by the mass spectrometer unit become larger. This allows the mass window to be wider even when a DC electric field is generated in order to solve a crosstalk drawback, in the movement direction of the molecular ions.
    • 提供一种质谱仪,包括:通过在线性多极电极之间叠加施加AC电压和第一DC电压来产生碎片离子的碰撞室,并且通过在前级电极和后级电极之间施加第二DC电压来加速碎片离子 电极; 进行碎片离子的质量分离的质谱仪单元; 以及控制单元,其基于所述质荷比来确定所述第二DC电压,使得所述碰撞室中的碎片离子的速率与所述质荷比无关,变得相等。 这里,当由质谱仪单元选择的质荷比变大时,控制单元增加第二DC电压。 这样即使产生直流电场,为了解决分子离子的移动方向上的串扰缺陷,也可以使质量窗口更宽。