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    • 1. 发明申请
    • SIGNAL WAVEFORM MEASURING APPARATUS AND MEASURING METHOD
    • 信号波形测量装置和测量方法
    • US20100219359A1
    • 2010-09-02
    • US12550895
    • 2009-08-31
    • Hiroyasu FUJIWARATadashi KawazoeMotoichi Ohtsu
    • Hiroyasu FUJIWARATadashi KawazoeMotoichi Ohtsu
    • H01J40/14
    • G01J11/00
    • A signal waveform measuring apparatus 1A is configured from: a signal optical system 11, a reference optical system 16, a time difference setting unit 12 setting a time difference between signal light L1 and reference light L2, a wavelength conversion element 20 including an aggregate of crystals of a dye molecule and generating converted light L5, which has been wavelength-converted to a shorter wavelength than incident light made incident on the crystal aggregate, at an intensity proportional to an r-th power (r>1) of the intensity of the incident light, a photodetector 30 detecting the converted light L5, generated at the element 20 at the intensity that is in accordance with the intensity of the signal light L1, the intensity of the reference light L2, and the time difference between the two, and a signal waveform analyzer 40 performing analysis of the detection result of the converted light L5 and thereby acquiring a time waveform of the signal light L1. A signal waveform measuring apparatus and a measuring method that enable a time waveform of signal light to be measured with good precision by a simple configuration are thereby realized.
    • 信号波形测量装置1A由信号光学系统11,参考光学系统16,设置信号光L1和参考光L2之间的时间差的时差设定单元12构成,波长转换元件20包括 并且以与入射到晶体聚集体上的入射光波长转换为更短波长的转换光L5的强度成比例的第r次幂(r> 1) 入射光,检测在元件20处以与信号光L1的强度相关的强度,参考光L2的强度和两者之间的时间差产生的转换光L5的光电检测器30, 以及信号波形分析器40,对转换光L5的检测结果进行分析,从而获取信号光L1的时间波形。 从而实现了通过简单的结构实现以高精度测量信号光的时间波形的信号波形测量装置和测量方法。
    • 2. 发明授权
    • Signal waveform measuring apparatus and method comprising a wavelength conversion element
    • 包括波长转换元件的信号波形测量装置和方法
    • US08183514B2
    • 2012-05-22
    • US12550895
    • 2009-08-31
    • Hiroyasu FujiwaraTadashi KawazoeMotoichi Ohtsu
    • Hiroyasu FujiwaraTadashi KawazoeMotoichi Ohtsu
    • H03F3/08G02F1/35
    • G01J11/00
    • A signal waveform measuring apparatus 1A is configured from: a signal optical system 11, a reference optical system 16, a time difference setting unit 12 setting a time difference between signal light L1 and reference light L2, a wavelength conversion element 20 including an aggregate of crystals of a dye molecule and generating converted light L5, which has been wavelength-converted to a shorter wavelength than incident light made incident on the crystal aggregate, at an intensity proportional to an r-th power (r>1) of the intensity of the incident light, a photodetector 30 detecting the converted light L5, generated at the element 20 at the intensity that is in accordance with the intensity of the signal light L1, the intensity of the reference light L2, and the time difference between the two, and a signal waveform analyzer 40 performing analysis of the detection result of the converted light L5 and thereby acquiring a time waveform of the signal light L1. A signal waveform measuring apparatus and a measuring method that enable a time waveform of signal light to be measured with good precision by a simple configuration are thereby realized.
    • 信号波形测量装置1A由信号光学系统11,参考光学系统16,设置信号光L1和参考光L2之间的时间差的时差设定单元12构成,波长转换元件20包括 并且以与入射到晶体聚集体上的入射光波长转换为更短波长的转换光L5的强度成比例的第r次幂(r> 1) 入射光,检测在元件20处以与信号光L1的强度相关的强度,参考光L2的强度和两者之间的时间差产生的转换光L5的光电检测器30, 以及信号波形分析器40,对转换光L5的检测结果进行分析,从而获取信号光L1的时间波形。 从而实现了通过简单的结构实现以高精度测量信号光的时间波形的信号波形测量装置和测量方法。
    • 3. 发明授权
    • Wavelength-converted light generating apparatus and generating method
    • 波长转换发光装置及其生成方法
    • US07764421B2
    • 2010-07-27
    • US12410871
    • 2009-03-25
    • Hiroyasu FujiwaraMotoichi OhtsuTadashi Kawazoe
    • Hiroyasu FujiwaraMotoichi OhtsuTadashi Kawazoe
    • G02F1/35
    • G02F1/3501G02F1/355G02F1/37
    • A wavelength-converted light generating apparatus 1A includes: an excitation light source 10 supplying excitation light L0 of a predetermined wavelength; and a wavelength conversion element 20, in which an aggregate 22 of crystals of a dye molecule is held by a holding substrate 21 and which, by incidence of the excitation light L0, generates converted light L1 that has been wavelength-converted. The excitation light source 10 supplies the excitation light L0 of a wavelength longer than an absorption edge of the dye molecule to the wavelength conversion element 20. The wavelength conversion element 20, by incidence of the excitation light L0 on the crystal aggregate 22, generates and outputs the converted light (for example, visible light) L1 that has been wavelength-converted to a shorter wavelength than the excitation light (for example, near-infrared light) L0. A wavelength-converted light generating apparatus and generating method capable of favorably generating light of a shorter wavelength than incident light of a predetermined wavelength by wavelength conversion is thus realized.
    • 波长转换光产生装置1A包括:提供预定波长的激发光L0的激发光源10; 以及波长转换元件20,其中染料分子的晶体的聚集体22由保持基板21保持,并且通过激发光L0的入射产生已被波长转换的转换光L1。 激发光源10将比染料分子的吸收端长的波长的激发光L0提供给波长转换元件20.波长转换元件20通过在晶体聚集体22上的激发光L0的入射产生 将已被波长转换的转换光(例如可见光)L1输出到比激发光(例如近红外光)L0更短的波长。 因此实现了通过波长转换有利地产生比预定波长的入射光更短波长的光的波长转换光产生装置和产生方法。
    • 4. 发明申请
    • WAVELENGTH-CONVERTED LIGHT GENERATING APPARATUS AND GENERATING METHOD
    • 波长转换光产生装置和发生方法
    • US20090257114A1
    • 2009-10-15
    • US12410871
    • 2009-03-25
    • Hiroyasu FujiwaraMotoichi OhtsuTadashi Kawazoe
    • Hiroyasu FujiwaraMotoichi OhtsuTadashi Kawazoe
    • G02F1/35
    • G02F1/3501G02F1/355G02F1/37
    • A wavelength-converted light generating apparatus 1A includes: an excitation light source 10 supplying excitation light L0 of a predetermined wavelength; and a wavelength conversion element 20, in which an aggregate 22 of crystals of a dye molecule is held by a holding substrate 21 and which, by incidence of the excitation light L0, generates converted light L1 that has been wavelength-converted. The excitation light source 10 supplies the excitation light L0 of a wavelength longer than an absorption edge of the dye molecule to the wavelength conversion element 20. The wavelength conversion element 20, by incidence of the excitation light L0 on the crystal aggregate 22, generates and outputs the converted light (for example, visible light) L1 that has been wavelength-converted to a shorter wavelength than the excitation light (for example, near-infrared light) L0. A wavelength-converted light generating apparatus and generating method capable of favorably generating light of a shorter wavelength than incident light of a predetermined wavelength by wavelength conversion is thus realized.
    • 波长转换光产生装置1A包括:提供预定波长的激发光L0的激发光源10; 以及波长转换元件20,其中染料分子的晶体的聚集体22由保持基板21保持,并且通过激发光L0的入射产生已被波长转换的转换光L1。 激发光源10将比染料分子的吸收端长的波长的激发光L0提供给波长转换元件20.波长转换元件20通过在晶体聚集体22上的激发光L0的入射产生 将已被波长转换的转换光(例如可见光)L1输出到比激发光(例如近红外光)L0更短的波长。 因此实现了通过波长转换有利地产生比预定波长的入射光更短波长的光的波长转换光产生装置和产生方法。
    • 7. 发明申请
    • COMPOUND SEMICONDUCTOR DEPOSITION METHOD AND APPARATUS
    • 化合物半导体沉积方法和装置
    • US20120058627A1
    • 2012-03-08
    • US13266337
    • 2010-04-28
    • Motoichi OhtsuTadashi KawazoeShunsuke YamazakiKoichi KajiyamaMichinobu MizumuraKeiichi Ito
    • Motoichi OhtsuTadashi KawazoeShunsuke YamazakiKoichi KajiyamaMichinobu MizumuraKeiichi Ito
    • H01L21/20B05C9/08
    • C23C16/481C23C14/548C23C16/303C23C16/52C30B25/00C30B29/403H01L21/0237H01L21/0242H01L21/0254H01L21/0262H01L33/0062
    • Provided is a compound semiconductor deposition method of adjusting the luminous wavelength of a compound semiconductor of a ternary or higher system in a nanometer order in depositing the compound semiconductor on a substrate. In the compound semiconductor deposition method of depositing a compound semiconductor of a ternary or higher system on a substrate, propagation light of a smaller energy than a desired ideal excitation energy for the compound semiconductor is irradiated onto the substrate 13 while depositing the compound semiconductor on the substrate 13, near-field light is generated based on the irradiated propagation light from fine particles of the compound semiconductor deposited on the substrate 13, new vibrational levels for the compound semiconductor are formed in multiple stages based on the generated near-field light, and a component in the compound semiconductor corresponding to the excitation energy is excited with the propagation light through a vibrational level, among the new vibrational levels, which has an excitation energy equal to or smaller than the energy of the propagation light is excited to desorb the component.
    • 提供一种在将化合物半导体沉积在基板上时以纳米级调节三元或更高系统的化合物半导体的发光波长的化合物半导体沉积方法。 在将三元或更高系统的化合物半导体沉积在衬底上的化合物半导体沉积方法中,将化合物半导体所需的理想激发能的能量较小的传播光照射到衬底13上,同时将化合物半导体沉积在 基板13,基于沉积在基板13上的化合物半导体的微粒的照射的传播光产生近场光,基于产生的近场光,以多个阶段形成化合物半导体的新的振动电平,以及 对应于激发能的化合物半导体中的成分被传播光激发,通过振动水平,激发能量等于或小于传播光的能量的新的振动水平被激发,从而解吸部件 。
    • 10. 发明授权
    • Interference detecting apparatus and tomography apparatus
    • 干涉检测装置及断层摄影装置
    • US06493091B2
    • 2002-12-10
    • US09784000
    • 2001-02-16
    • Motonobu KourogiMotoichi Ohtsu
    • Motonobu KourogiMotoichi Ohtsu
    • G01B902
    • G01B9/02008G01B9/02002G01N21/4795
    • Measurement of an internal structure of a sample is performed using interference of light within a short time. Through a first optical frequency comb generator 5 using a first signal having a frequency f1 and generating reference light having a sideband every interval of the frequency f1 and a second optical frequency comb generator 6 using a second signal having a frequency f2 and generating object light having a sideband every interval of the frequency f2, and sweeping of emission timing between the reference light and the object light, by changing a phase difference or frequency difference between the first signal and second signal, and detecting a change in light intensity of the interference light due to the interference, operation of detecting the interference position is made at a high speed.
    • 样品的内部结构的测量使用光在短时间内的干扰来进行。 通过第一光频梳发生器5,使用具有频率f1的第一信号,并且产生具有频率f1的每个间隔的边带的参考光;以及使用具有频率f2的第二信号产生第二光频梳发生器6,并产生具有 频带f2的每个间隔的边带,以及通过改变第一信号和第二信号之间的相位差或频率差来扫描参考光和对象光之间的发射定时,以及检测干涉光的光强度的变化 由于干扰,高速地进行检测干扰位置的动作。