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    • 1. 发明申请
    • METHODS FOR ADJUSTING CRITICAL DIMENSION UNIFORMITY IN AN ETCH PROCESS WITH A HIGHLY CONCENTRATED UNSATURATED HYDROCARBON GAS
    • 在高浓度不饱和碳氢化合物气体的调和过程中调整关键尺寸均匀性的方法
    • US20100003828A1
    • 2010-01-07
    • US11946562
    • 2007-11-28
    • Guowen DingChanghun LeeTeh-Tien Su
    • Guowen DingChanghun LeeTeh-Tien Su
    • H01L21/467
    • H01L21/32136
    • Methods for etching a metal material layer disposed on a substrate to form features with desired profile and uniform critical dimension (CD) of the features across the substrate. In one embodiment, a method for etching a material layer disposed on a substrate includes providing a substrate having a metal layer disposed on a substrate into an etch reactor, flowing a gas mixture containing at least a halogen containing gas and a passivation gas into the reactor, the passivation gas including a nitrogen containing gas and an unsaturated hydrocarbon gas, wherein the nitrogen gas and the unsaturated hydrocarbon gas and etching the metal layer using a plasma formed from the gas mixture. The CD uniformity could be conveniently, efficiently tuned by the gas ratio, if the concentration of the unsaturated hydrocarbon gas is high enough that the molecular ratio of the unsaturated hydrocarbon gas in the diluent gas times the reactor pressure in milliTorr is greater than 1.25.
    • 用于蚀刻设置在基底上的金属材料层以形成具有跨越衬底的特征所需轮廓和均匀临界尺寸(CD)的特征的方法。 在一个实施例中,用于蚀刻设置在衬底上的材料层的方法包括:将具有设置在衬底上的金属层的衬底提供到蚀刻反应器中,将含有至少含卤素气体和钝化气体的气体混合物流入反应器 包括含氮气体和不饱和烃气体的钝化气体,其中氮气和不饱和烃气体使用由气体混合物形成的等离子体蚀刻金属层。 如果不饱和烃气体的浓度足够高,稀释气体中的不饱和烃气体的分子比(以毫乇为单位的反应器压力)大于1.25,则可以通过气体比率方便地,有效地调节CD均匀性。