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    • 1. 发明授权
    • Process for anisotropic etching of silicon plates
    • 硅板的异相蚀刻工艺
    • US5071510A
    • 1991-12-10
    • US586803
    • 1990-09-24
    • Guenther FindlerHorst Muenzel
    • Guenther FindlerHorst Muenzel
    • H01L21/3063H01L21/308
    • H01L21/3081H01L21/3063Y10S438/928Y10S438/958
    • Electrochemical etching of silicon wafers or plates, on the front side of which a monocrystalline epitaxy layer is provided having a doping of a type opposite to the doping of the remainder of the silicon plate, so as to provide a pn or np junction, is performed with an organic photo film material of negative type and polyisoprene base serving as a passivating layer on the previously etched and metallized front (epitaxy) side. The film layer is held in place with the help of an adhesion promoting silane compound and covers the entire front side including the portions previously masked with silicon nitride or oxide. It is dried and hardened before exposure to the etchant which is used to etch the rear side of the plate until the etchant reaches the pn junction, where a small voltage bias applied to the junction from the front side assures an etch-stop. Etchants containing tetraalkylammonium hydroxide in water solution or in water-free form are preferred, with various additives as inhibitors, complexing agents and/or wetting agents.
    • 在其前侧提供具有与硅板的其余部分的掺杂相反的掺杂类型的单晶外延层以提供pn或np结的硅晶片或板的电化学蚀刻, 在预蚀刻和金属化的正面(外延)侧上具有负型有机摄影薄膜材料和用作钝化层的聚异戊二烯基底。 借助于增粘硅烷化合物将膜层保持在适当位置,并覆盖包括先前用氮化硅或氧化物掩蔽的部分的整个正面。 在暴露于用于蚀刻板的后侧的蚀刻剂之前将其干燥和硬化,直到蚀刻剂到达pn结,其中从前侧施加到接合处的小的电压偏置确保蚀刻停止。 含有水溶液中的四烷基氢氧化铵或无水形式的蚀刻剂是优选的,具有各种添加剂作为抑制剂,络合剂和/或润湿剂。