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    • 1. 发明授权
    • Symmetrical differential sensing method and system for STT MRAM
    • STT MRAM对称差分感测方法及系统
    • US09076540B2
    • 2015-07-07
    • US13592597
    • 2012-08-23
    • David MuellerWolf AllersMihail Jefremow
    • David MuellerWolf AllersMihail Jefremow
    • G11C11/00G11C11/16G11C7/02G11C7/12G11C29/02G11C29/50
    • G11C11/1673G11C7/02G11C7/12G11C11/16G11C11/1659G11C29/021G11C29/028G11C2029/5006
    • The invention relates to methods and systems for reading a memory cell and in particular, an STT MRAM. In one example, a system for reading a memory cell includes a sense path and an inverse path. A reference current is provided through the sense path and is sampled via a first sampling element in the sense path, and a cell current from the memory cell is provided through the inverse sense path and is sampled via a second sampling element in the inverse sense path. Subsequently, the memory cell is disconnected from the inverse sense path, the cell current is provided through the sense path, the reference source is disconnected from the sense path, and the reference current is provided through the inverse sense path. The output levels are then determined by the cell and reference currents working against the sampled reference and sampled cell currents.
    • 本发明涉及用于读取存储器单元,特别是STT MRAM的方法和系统。 在一个示例中,用于读取存储器单元的系统包括感测路径和反向路径。 通过感测路径提供参考电流,并且通过感测路径中的第一采样元件进行采样,并且通过反向感测路径提供来自存储器单元的单元电流,并且经由反向感测路径中的第二采样元件进行采样 。 随后,存储器单元与反向感测路径断开,通过感测路径提供单元电流,参考源与感测路径断开,并通过反向感测路径提供参考电流。 然后,输出电平由电池和参考电流根据采样的参考和采样单元电流工作来确定。
    • 2. 发明申请
    • Symmetrical Differential Sensing Method and System for STT MRAM
    • STT MRAM对称差分传感方法及系统
    • US20140056059A1
    • 2014-02-27
    • US13592597
    • 2012-08-23
    • David MuellerWolf AllersMihail Jefremow
    • David MuellerWolf AllersMihail Jefremow
    • G11C7/02G11C11/16
    • G11C11/1673G11C7/02G11C7/12G11C11/16G11C11/1659G11C29/021G11C29/028G11C2029/5006
    • The invention relates to methods and systems for reading a memory cell and in particular, an STT MRAM. In one example, a system for reading a memory cell includes a sense path and an inverse path. A reference current is provided through the sense path and is sampled via a first sampling element in the sense path, and a cell current from the memory cell is provided through the inverse sense path and is sampled via a second sampling element in the inverse sense path. Subsequently, the memory cell is disconnected from the inverse sense path, the cell current is provided through the sense path, the reference source is disconnected from the sense path, and the reference current is provided through the inverse sense path. The output levels are then determined by the cell and reference currents working against the sampled reference and sampled cell currents.
    • 本发明涉及用于读取存储器单元,特别是STT MRAM的方法和系统。 在一个示例中,用于读取存储器单元的系统包括感测路径和反向路径。 通过感测路径提供参考电流,并且通过感测路径中的第一采样元件进行采样,并且通过反向感测路径提供来自存储器单元的单元电流,并且经由反向感测路径中的第二采样元件进行采样 。 随后,存储器单元与反向感测路径断开,通过感测路径提供单元电流,参考源与感测路径断开,并通过反向感测路径提供参考电流。 然后,输出电平由电池和参考电流根据采样的参考和采样单元电流工作来确定。
    • 5. 发明授权
    • Mismatch error reduction method and system for STT MRAM
    • STT MRAM的不匹配误差减少方法和系统
    • US09070466B2
    • 2015-06-30
    • US13605693
    • 2012-09-06
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • G11C11/16
    • G11C11/1673
    • The invention relates to methods and systems for reading a memory cell and in particular, an STT MRAM. In accordance with one aspect of the invention, a method for reading a memory cell includes combining a cell current from a memory cell with a reference current from a reference source to create an average current, enabling the average current to flow through a first mirror transistor in a sense path and a second mirror transistor in a reference path, storing the current mismatch on a capacitor coupled to the gates of the first mirror transistor and the second mirror transistor, disconnecting the memory cell from the reference path and disconnecting the reference source from the sense path, enabling the cell current only to flow through the sense path, and determining the output level of the memory cell.
    • 本发明涉及用于读取存储器单元,特别是STT MRAM的方法和系统。 根据本发明的一个方面,一种用于读取存储单元的方法包括将来自存储单元的单元电流与来自参考源的参考电流组合以产生平均电流,使平均电流能够流过第一镜像晶体管 在参考路径中的感测路径和第二镜像晶体管中,将电流失配存储在耦合到第一镜面晶体管和第二镜像晶体管的栅极的电容器上,将存储器单元与参考路径断开并将参考源与 感测路径,使得电池电流仅能够流过感测路径,并且确定存储器单元的输出电平。
    • 7. 发明申请
    • Mismatch Error Reduction Method and System for STT MRAM
    • STT MRAM的不匹配误差减少方法和系统
    • US20140063923A1
    • 2014-03-06
    • US13605693
    • 2012-09-06
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • G11C7/06G11C11/16
    • G11C11/1673
    • The invention relates to methods and systems for reading a memory cell and in particular, an STT MRAM. In accordance with one aspect of the invention, a method for reading a memory cell includes combining a cell current from a memory cell with a reference current from a reference source to create an average current, enabling the average current to flow through a first mirror transistor in a sense path and a second mirror transistor in a reference path, storing the current mismatch on a capacitor coupled to the gates of the first mirror transistor and the second mirror transistor, disconnecting the memory cell from the reference path and disconnecting the reference source from the sense path, enabling the cell current only to flow through the sense path, and determining the output level of the memory cell.
    • 本发明涉及用于读取存储器单元,特别是STT MRAM的方法和系统。 根据本发明的一个方面,一种用于读取存储单元的方法包括将来自存储单元的单元电流与来自参考源的参考电流组合以产生平均电流,使平均电流能够流过第一镜像晶体管 在参考路径中的感测路径和第二镜像晶体管中,将电流失配存储在耦合到第一镜面晶体管和第二镜像晶体管的栅极的电容器上,将存储器单元与参考路径断开并将参考源与 感测路径,使得电池电流仅能够流过感测路径,并且确定存储器单元的输出电平。