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1. 发明申请

US20050065322A1 Secreted salivary zsig63 polypeptide 审中-公开
标题翻译：分泌唾液zsig63多肽
公开(公告)号：US20050065322A1
公开(公告)日：2005-03-24
申请号：US10969164
申请日：2004-10-20
申请人： David Adler , Paul Sheppard
发明人： David Adler , Paul Sheppard
IPC分类号： C07K14/47 , C12N9/00 , C07H21/04
CPC分类号： C07K14/47
摘要： The present invention relates to polynucleotide and polypeptide molecules for zsig63, a novel secreted salivary protein. The polypeptides, and polynucleotides encoding them, may exhibit anti-microbial activity and may be used in the study or treatment of microbial infections. The polynucleotides encoding zsig63, are located on chromosome 4, and can be used to identify a region of the genome associated with human disease states. The present invention also includes antibodies to the zsig63 polypeptides.
摘要翻译：本发明涉及用于zsig63（一种新型分泌的唾液蛋白）的多核苷酸和多肽分子。多肽和编码它们的多核苷酸可以表现出抗微生物活性，并且可以用于研究或治疗微生物感染。编码zsig63的多核苷酸位于染色体4上，可用于鉴定与人类疾病状态相关的基因组区域。本发明还包括针对zsig63多肽的抗体。

2. 发明申请

US20060223987A1 Novel beta-defensins 审中-公开
公开(公告)号：US20060223987A1
公开(公告)日：2006-10-05
申请号：US11450178
申请日：2006-06-09
申请人： David Adler , James Holloway , Nand Baindur , Stephanie Beigel-Orme , Paul Sheppard
发明人： David Adler , James Holloway , Nand Baindur , Stephanie Beigel-Orme , Paul Sheppard
IPC分类号： C07K16/18 , C07H21/04 , C12P21/06 , C12N5/06
CPC分类号： C07K14/4723 , A61K38/00 , Y02A50/473 , Y02A50/475 , Y02A50/478 , Y02A50/481
摘要： The present invention relates to polynucleotide and polypeptide molecules for zamp1, a novel member of the β-defensin family. The polypeptides, and polynucleotides encoding them, exhibit anti-microbial activity and may be used in the study or treatment of microbial infections. The present invention also includes antibodies to the zamp1 polypeptides.

3. 发明授权

US09170503B2 Method and apparatus for inspecting a substrate 有权
公开(公告)号：US09170503B2
公开(公告)日：2015-10-27
申请号：US11542822
申请日：2006-10-04
申请人： David Adler , Kirk Bertsche , Mark McCord , Stuart Friedman
发明人： David Adler , Kirk Bertsche , Mark McCord , Stuart Friedman
IPC分类号： G06K9/00 , G03F7/20 , G01N21/956 , G01N23/20 , G01N23/225 , G03F1/84 , G03F1/86 , H01J37/28
CPC分类号： G01N23/203 , G01N21/956 , G01N21/95607 , G01N23/20 , G01N23/2251 , G01N23/2252 , G01N2223/304 , G01N2223/611 , G01N2223/646 , G03F1/84 , G03F1/86 , G03F7/70616 , G03F7/7065 , H01J37/244 , H01J37/28 , H01J2237/2817
摘要： A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.

4. 发明授权

US08284394B2 Methods and systems for determining a characteristic of a wafer 有权
标题翻译：用于确定晶片特性的方法和系统
公开(公告)号：US08284394B2
公开(公告)日：2012-10-09
申请号：US11673150
申请日：2007-02-09
申请人： Michael D. Kirk , Christopher F. Bevis , David Adler , Kris Bhaskar
发明人： Michael D. Kirk , Christopher F. Bevis , David Adler , Kris Bhaskar
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/4738 , G01N21/55
摘要： Methods and systems for determining a characteristic of a wafer are provided. One method includes generating output responsive to light from the wafer using an inspection system. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The method also includes determining the characteristic of the wafer using the second output. One system includes an inspection subsystem configured to illuminate the wafer and to generate output responsive to light from the wafer. The output includes first output corresponding to defects on the wafer and second output that does not correspond to the defects. The system also includes a processor configured to determine the characteristic of the wafer using the second output.
摘要翻译：提供了用于确定晶片特性的方法和系统。一种方法包括使用检查系统响应来自晶片的光产生输出。输出包括对应于晶片上的缺陷的第一输出和不对应于缺陷的第二输出。该方法还包括使用第二输出确定晶片的特性。一个系统包括检查子系统，该检查子系统配置成照亮晶片并产生响应于来自晶片的光的输出。输出包括对应于晶片上的缺陷的第一输出和不对应于缺陷的第二输出。该系统还包括配置成使用第二输出来确定晶片的特性的处理器。

5. 发明申请

US20080052303A1 REDUCING INDEX SIZE FOR MULTI-LEVEL GRID INDEXES 失效
公开(公告)号：US20080052303A1
公开(公告)日：2008-02-28
申请号：US11931786
申请日：2007-10-31
申请人： David Adler , Knut Stolze
发明人： David Adler , Knut Stolze
IPC分类号： G06F7/00
CPC分类号： G06F17/30327 , G06F17/30259 , G06F17/30592 , Y10S707/955 , Y10S707/99942 , Y10S707/99943 , Y10S707/99944 , Y10S707/99945
摘要： The number of index entries in a grid index for indexing geometric shapes is reduced by establishing a pool storage area for geometric shapes, selecting a threshold number of grid cells which a geometric shape may overlap, storing the shape in the grid index if a geometric shape overlaps a number of grid cells not exceeding the threshold number, and storing the shape in the pool storage area if the geometric shape overlaps a number of grid cells which exceeds the threshold number.

6. 发明申请

US20070025610A1 Method and apparatus for inspecting a substrate 审中-公开
公开(公告)号：US20070025610A1
公开(公告)日：2007-02-01
申请号：US11542822
申请日：2006-10-04
申请人： David Adler , Kirk Bertsche , Mark McCord , Stuart Friedman
发明人： David Adler , Kirk Bertsche , Mark McCord , Stuart Friedman
IPC分类号： G06K9/00
CPC分类号： G01N23/203 , G01N21/956 , G01N21/95607 , G01N23/20 , G01N23/2251 , G01N23/2252 , G01N2223/304 , G01N2223/611 , G01N2223/646 , G03F1/84 , G03F1/86 , G03F7/70616 , G03F7/7065 , H01J37/244 , H01J37/28 , H01J2237/2817
摘要： A method and apparatus for inspection and review of defects is disclosed wherein data gathering is improved. In one embodiment, multiple or segmented detectors are used in a particle beam system.

7. 发明授权

US4891074A Multiple cell photoresponsive amorphous alloys and devices 失效
标题翻译：多单元光响应非晶合金和器件
公开(公告)号：US4891074A
公开(公告)日：1990-01-02
申请号：US710947
申请日：1985-03-13
申请人： Stanford R. Ovshinsky , David Adler
发明人： Stanford R. Ovshinsky , David Adler
IPC分类号： C23C14/00 , C23C14/06 , C23C16/24 , H01L25/04 , H01L29/16 , H01L31/0376 , H01L31/07 , H01L31/20
CPC分类号： H01L31/076 , C23C14/0026 , C23C14/06 , C23C16/24 , H01L29/1604 , H01L31/03762 , H01L31/043 , H01L31/07 , H01L31/202 , H01L2924/0002 , Y02E10/548 , Y02P70/521
摘要： The production of improved multiple cell photoresponsive amorphous devices, such as photovoltaic, photoreceptive devices and the like; having improved wavelength threshold characteristics is made possible by adding one or more band gap adjusting elements to the alloys in one or more cells of the device. The adjusting element or elements are added at least to the active photoresponsive regions of amorphous cells containing silicon and fluorine, and preferably hydrogen. One adjusting element is germanium which narrows the band gap from that of the materials without the adjusting element incorporated therein. Other adjusting elements can be used such as carbon or nitrogen to increase the band gap. The silicon and adjusting elements are concurrently combined and deposited as amorphous alloys by vapor deposition, sputtering or glow discharge decomposition. The addition of fluorine bonding and electronegativity to the cell alloy acts as a compensating or altering element to reduce the density of states in the energy gap thereof. The fluorine bond strength allows the adjusting element(s) to be added to the alloy cells to adjust the band gap without reducing the electronic qualities of the cell alloy. Hydrogen also acts as a compensating or altering element to compliment fluorine when utilized therewith. The compensating or altering element(s) can be added to the alloy during deposition of the cells or following deposition. The addition of the adjusting element(s) to the cell alloys adjusts the band gap to a selected optimum wavelength threshold for particular cells to increase the photoabsorption efficiency to enhance the device photoresponsive without adding states in the gap of the cells which decrease the efficiency of the devices. The adjusting element(s) can be added in varying amounts, in discrete layers or in substantially constant amounts in the cell alloys.
摘要翻译：改进的多单元光响应非晶体器件如光伏，感光器件等的生产; 通过将一个或多个带隙调节元件添加到该器件的一个或多个单元中的合金，可以实现改进的波长阈值特性。至少将调整元素添加到含硅和氟，优选氢的非晶体的活性光响应区域中。一个调节元件是锗，其带隙与材料的带隙相比较窄，而调节元件并入其中。可以使用其它调节元件，例如碳或氮来增加带隙。硅和调节元件通过气相沉积，溅射或辉光放电分解同时组合并沉积为非晶态合金。向电池合金中添加氟键和电负性作为补偿或改变元素，以降低其间隙中的状态密度。氟键强度允许调节元件添加到合金电池中以调节带隙，而不降低电池合金的电子质量。当与其一起使用时，氢也充当补偿或改变元素以补充氟。补偿或更换元件可以在沉积电池或沉积之后添加到合金中。将调节元件添加到电池合金中将带隙调整到特定电池的选定的最佳波长阈值，以增加光吸收效率以增强器件的光响应，而不会在电池间隙中增加状态，从而降低电池的效率设备。调节元件可以以不同的量以不连续的层或基本恒定的量添加到电池合金中。

8. 发明申请

US20050198008A1 Index exploitation for spatial data 审中-公开
标题翻译：索引利用空间数据
公开(公告)号：US20050198008A1
公开(公告)日：2005-09-08
申请号：US10792446
申请日：2004-03-02
申请人： David Adler
发明人： David Adler
IPC分类号： G06F17/30
CPC分类号： G06F16/2458
摘要： Provided is a technique for index exploitation. A spatial region query referencing a spatial region is received. The spatial region is divided into intervals. Search ranges are generated for each interval. An index scan is performed for each interval.
摘要翻译：提供了一种用于索引开发的技术。接收引用空间区域的空间区域查询。空间区域划分为间隔。每个间隔都会生成搜索范围。对每个间隔执行索引扫描。

9. 发明申请

US20050139767A1 Multiple directional scans of test structures on semiconductor integrated circuits 有权
标题翻译：半导体集成电路测试结构的多方向扫描
公开(公告)号：US20050139767A1
公开(公告)日：2005-06-30
申请号：US11058943
申请日：2005-02-15
申请人： Gustavo Pinto , Brian Leslie , David Adler , Akella Satya , Robert Long , David Walker
发明人： Gustavo Pinto , Brian Leslie , David Adler , Akella Satya , Robert Long , David Walker
IPC分类号： G01N21/66 , G01N21/95 , G01N21/956 , G01N23/04 , G01Q30/16 , G01Q60/44 , G01R31/28 , G01R31/307 , H01L23/544 , A61N5/00 , G21K7/00
CPC分类号： H01L22/34 , G01N21/66 , G01N21/956 , G01N23/04 , G01R31/2884 , G01R31/307 , H01J2237/2817 , Y10S977/849
摘要： Disclosed is a method of inspecting a sample. The sample is scanned in a first direction with at least one particle beam. The sample is scanned in a second direction with at least one particle beam. The second direction is at an angle to the first direction. The number of defects per an area of the sample are found as a result of the first scan, and the position of one or more of the found defects is determined from the second scan. In a specific embodiment, the sample includes a test structure having a plurality of test elements thereon. A first portion of the test elements is exposed to the beam during the first scan to identify test elements having defects, and a second portion of the test elements is exposed during the second scan to isolate and characterize the defect.
摘要翻译：公开了一种检查样品的方法。用至少一个粒子束沿第一方向扫描样品。用至少一个粒子束在第二个方向上扫描样品。第二方向与第一方向成一个角度。作为第一扫描的结果，发现样品的每个区域的缺陷数，并且从第二次扫描确定发现的一个或多个缺陷的位置。在具体实施例中，样本包括其上具有多个测试元件的测试结构。测试元件的第一部分在第一次扫描期间暴露于光束以识别具有缺陷的测试元件，并且第二部分测试元件在第二次扫描期间暴露以分离和表征缺陷。

10. 发明授权

US4954182A Multiple cell photoresponsive amorphous photo voltaic devices including graded band gaps 失效
标题翻译：多重细胞光响应无定形光伏器件，包括分级带隙
公开(公告)号：US4954182A
公开(公告)日：1990-09-04
申请号：US301916
申请日：1989-03-13
申请人： Stanford R. Ovshinsky , David Adler
发明人： Stanford R. Ovshinsky , David Adler
IPC分类号： C23C14/00 , C23C14/06 , H01L25/04 , H01L29/16 , H01L31/0376 , H01L31/07 , H01L31/20
CPC分类号： H01L31/076 , C23C14/0026 , C23C14/06 , H01L29/1604 , H01L31/03762 , H01L31/043 , H01L31/07 , H01L31/202 , H01L2924/0002 , Y02E10/548 , Y02P70/521
摘要： The production of improved multiple cell photovoltaic amorphous silicon devices having improved wavelength threshold characteristics is made possible by adding one or more band gap adjusting elements to the silicon alloy material in one or more cells of the device. The adjusting element or elements are added at least to the active photoresponsive regions of constituent amorphous silicon cells, which regions preferably further include at least one of fluorine and hydrogen. One adjusting element is germanium which narrows the band gap from that of the silicon alloy materials without the adjusting element incorporated thereinto. Other adjusting elements can be used, such as carbon or nitrogen to widen the band gap. The silicon and adjusting elements are concurrently combined and deposited as amorphous silicon alloys by glow discharge decomposition techniques.
摘要翻译：通过在器件的一个或多个单元中的硅合金材料中添加一个或多个带隙调节元件，可以制造具有改进的波长阈值特性的改进的多单元光伏非晶硅器件。至少将调整元素添加到构成非晶硅电池的活性光响应区域，该区域优选还包括氟和氢中的至少一个。一个调节元件是锗，其与无合金调节元件的硅合金材料的带隙变窄。可以使用其它调节元件，例如碳或氮来扩大带隙。硅和调节元件通过辉光放电分解技术同时组合并沉积为非晶硅合金。

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