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    • 1. 发明授权
    • Implementing local evaluation of domino read SRAM with enhanced SRAM cell stability with minimized area usage
    • 实现对多米诺骨牌SRAM的局部评估,具有增强的SRAM单元稳定性,同时最小化区域使用率
    • US07724586B2
    • 2010-05-25
    • US12195151
    • 2008-08-20
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas FreiburgerDaniel Mark Nelson
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas FreiburgerDaniel Mark Nelson
    • G11C7/06G06F17/50
    • G11C11/413
    • A method and circuit for implementing domino static random access memory (SRAM) local evaluation with enhanced SRAM cell stability, and a design structure on which the subject circuit resides are provided. A SRAM local evaluation circuit enabling a read and write operations of an associated SRAM cell group includes true and complement bitlines, true and complement write data propagation inputs, a precharge signal, and a precharge write signal. A respective precharge device is connected between a voltage supply VDD and the true bitline and the complement bitline. A first passgate device is connected between the complement bitline and the true write data propagation input. A second passgate device is connected between the true bitline and the complement write data propagation input. The precharge write signal disables the passgate devices during a read operation. During write operations, the precharge write signal enables the passgate devices.
    • 一种用于实现具有增强的SRAM单元稳定性的多米诺骨牌静态随机存取存储器(SRAM)局部评估的方法和电路,以及提供主题电路所在的设计结构。 实现相关SRAM单元组的读和写操作的SRAM本地评估电路包括真和补补位线,真和补写写数据传播输入,预充电信号和预充电写信号。 相应的预充电装置连接在电压源VDD与真位线和补码位线之间。 第一传递门装置连接在补码位线和真实写入数据传播输入端之间。 第二个通路装置连接在真位线和补码写入数据传播输入之间。 在读取操作期间,预充电写信号禁用通路器件。 在写入操作期间,预充电写入信号使能通路装置。
    • 5. 发明授权
    • Pulse generator circuit and semiconductor device including same
    • 脉冲发生器电路和包括它的半导体器件
    • US07015600B2
    • 2006-03-21
    • US10268287
    • 2002-10-10
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas Freiburger
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas Freiburger
    • H03K3/00H03K3/64G06F1/12
    • H03K5/06H03K5/133
    • A pulse generator circuit is disclosed including a delay element coupled to a logic circuit. The delay element receives a clock signal CLK and a signal X and produces a signal XN dependent upon the clock signal CLK and the signal X. The logic circuit receives the clock signal CLK and the signal XN and produces a signal ACLK such that ACLK=CLK·XN′. The signal ACLK may include a series of positive pulses. The delay element may be, for example, one of multiple delay elements coupled in series, and signal X may be an output of a preceding one of the delay elements. A semiconductor device is described including the above pulse generator circuit and a self-resetting logic circuit. The self-resetting logic circuit receives the signal ACLK and one or more input signals and performs a logic operation using the one or more input signals during the positive pulses. The semiconductor device may include, for example, a random access memory (RAM) device, and the self-resetting logic circuit may form a part of a decoder circuit of the RAM device.
    • 公开了一种脉冲发生器电路,其包括耦合到逻辑电路的延迟元件。 延迟元件接收时钟信号CLK和信号X,并产生取决于时钟信号CLK和信号X的信号XN。逻辑电路接收时钟信号CLK和信号XN,并产生信号ACLK,使得ACLK = CLK .XN'。 信号ACLK可以包括一系列正脉冲。 延迟元件可以是例如串联耦合的多个延迟元件中的一个,并且信号X可以是先前的一个延迟元件的输出。 描述了包括上述脉冲发生器电路和自复位逻辑电路的半导体器件。 自复位逻辑电路接收信号ACLK和一个或多个输入信号,并在正脉冲期间使用一个或多个输入信号执行逻辑运算。 半导体器件可以包括例如随机存取存储器(RAM)器件,并且自复位逻辑电路可以形成RAM器件的解码器电路的一部分。
    • 6. 发明授权
    • Method and circuit for implementing enhanced SRAM write and read performance ring oscillator
    • 实现增强型SRAM写和读性能环形振荡器的方法和电路
    • US07684263B2
    • 2010-03-23
    • US12015806
    • 2008-01-17
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas FreiburgerTravis Reynold Hebig
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas FreiburgerTravis Reynold Hebig
    • G11C7/00
    • G11C11/413
    • A method and circuit for implementing an enhanced static random access memory (SRAM) read and write performance ring oscillator, and a design structure on which the subject circuit resides are provided. A plurality of SRAM base blocks is connected together in a chain. Each of the plurality of SRAM base blocks includes a SRAM cell, such as an eight-transistor (8T) static random access memory (SRAM) cell, and a local evaluation block coupled to the SRAM cell. The SRAM cell includes independent left wordline input and right wordline input. The SRAM cell includes a read wordline connected high, and a true and complement write bitline pair connected low. In the local evaluation circuit, one input of a NAND gate receiving the read bitline input is connected high. A control signal is combined with an inverted feedback signal to start and stop the ring oscillator.
    • 一种用于实现增强型静态随机存取存储器(SRAM)读写性能环形振荡器的方法和电路,以及设置有被摄体电路所在的设计结构。 多个SRAM基块在链中连接在一起。 多个SRAM基块中的每一个包括诸如八晶体管(8T)静态随机存取存储器(SRAM)单元的SRAM单元,以及耦合到SRAM单元的局部评估块。 SRAM单元包括独立的左字线输入和右字线输入。 SRAM单元包括一个连接到高电平的读字字线和一个连接低电平的真写补码写位线对。 在本地评估电路中,接收读取位线输入的NAND门的一个输入被连接得很高。 控制信号与反相反馈信号相结合,以启动和停止环形振荡器。
    • 10. 发明申请
    • Implementing Local Evaluation of Domino Read SRAM With Enhanced SRAM Cell Stability and Enhanced Area Usage
    • 实现具有增强的SRAM单元稳定性和增强区域使用的Domino读取SRAM的本地评估
    • US20100046278A1
    • 2010-02-25
    • US12195151
    • 2008-08-20
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas FreiburgerDaniel Mark Nelson
    • Chad Allen AdamsTodd Alan ChristensenPeter Thomas FreiburgerDaniel Mark Nelson
    • G11C11/00G11C7/00
    • G11C11/413
    • A method and circuit for implementing domino static random access memory (SRAM) local evaluation with enhanced SRAM cell stability, and a design structure on which the subject circuit resides are provided. A SRAM local evaluation circuit enabling a read and write operations of an associated SRAM cell group includes true and complement bitlines, true and complement write data propagation inputs, a precharge signal, and a precharge write signal. A respective precharge device is connected between a voltage supply VDD and the true bitline and the complement bitline. A first passgate device is connected between the complement bitline and the true write data propagation input. A second passgate device is connected between the true bitline and the complement write data propagation input. The precharge write signal disables the passgate devices during a read operation. During write operations, the precharge write signal enables the passgate devices.
    • 一种用于实现具有增强的SRAM单元稳定性的多米诺骨牌静态随机存取存储器(SRAM)局部评估的方法和电路,以及提供主题电路所在的设计结构。 实现相关SRAM单元组的读和写操作的SRAM本地评估电路包括真和补补位线,真和补写写数据传播输入,预充电信号和预充电写信号。 相应的预充电装置连接在电压源VDD与真位线和补码位线之间。 第一传递门装置连接在补码位线和真实写入数据传播输入端之间。 第二个通路装置连接在真位线和补码写入数据传播输入之间。 在读取操作期间,预充电写信号禁用通路器件。 在写入操作期间,预充电写入信号使能通路装置。