专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US10634611B2 Measuring apparatus 有权
公开(公告)号：US10634611B2
公开(公告)日：2020-04-28
申请号：US15785753
申请日：2017-10-17
申请人： CANON KABUSHIKI KAISHA
发明人： Hiroshi Kawanago
IPC分类号： G01N21/55 , G01N21/47 , H04N7/18 , G01N21/57
CPC分类号： G01N21/55 , G01N21/474 , H04N7/183 , G01N21/57
摘要： The present invention provides a measuring apparatus having a housing in which an opening is formed, and measuring a reflection characteristic of a target region to be measured via the opening, the apparatus comprising an imaging device provided in the housing, and configured to capture an image of an imaging region via the opening, a detector configured to detect light reflected from the target region, which is a portion of the imaging region, a processor configured to obtain a reflection characteristic of the target region based on the light detected by the detecting unit, and a display unit configured to display the image of the imaging region captured by the imaging unit, wherein the image of the imaging region displayed by the display unit includes information indicating the target region.

2. 发明申请

US20190323958A1 MEASUREMENT APPARATUS, INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM 审中-公开
公开(公告)号：US20190323958A1
公开(公告)日：2019-10-24
申请号：US16502617
申请日：2019-07-03
申请人： CANON KABUSHIKI KAISHA
发明人： Hiroshi Kawanago , Yukie Kuroki
IPC分类号： G01N21/47 , G01N21/57
摘要： The present invention provides a measurement apparatus comprising: a measurement unit configured to measure a reflection characteristic of a first region in a surface; an image capturing unit configured to obtain an image of a second region that is larger than the first region and includes the first region, by image-capturing the second region in a state of illuminating the first region so as to be brighter than a region other than the first region in the second region; and a control unit configured to cause a display unit to display a plurality of measurement results obtained by a plurality of times of measurement by the measurement unit, wherein the control unit causes the display unit to display the image which corresponds to a measurement result selected from the plurality of measurement results, together with the plurality of measurement results.

3. 发明授权

US09140642B2 Spectrophotometer 有权
标题翻译：分光光度计
公开(公告)号：US09140642B2
公开(公告)日：2015-09-22
申请号：US14578625
申请日：2014-12-22
申请人： CANON KABUSHIKI KAISHA
发明人： Hiroshi Kawanago
IPC分类号： G01N21/25 , G01J3/42 , G01J3/10 , G01J3/46 , G01J3/50
CPC分类号： G01N21/251 , G01J3/10 , G01J3/42 , G01J3/465 , G01J3/502 , G01N2201/062 , G01N2201/0686
摘要： The spectrophotometer of the present invention measures a spectral reflectance of an object to be measured to thereby determine a color value of the object to be measured based on a color-matching function of an XYZ color system and the spectral reflectance. The spectrophotometer includes an irradiation unit configured to irradiate the object to be measured with light having a spectral intensity distribution in which a relative intensity at a wavelength at which the value of z reaches its peak in the color-matching function is equal to or greater than 0.5.
摘要翻译：本发明的分光光度计测量待测物体的光谱反射率，由此基于XYZ色系的色匹配函数和光谱反射率确定待测物体的色值。分光光度计包括：照射单元，被配置为用具有光谱强度分布的光照射被测量物体，其中在色彩匹配函数中z达到其峰值的波长处的相对强度等于或大于 0.5。

4. 发明授权

US10697887B2 Optical characteristic measuring apparatus 有权
公开(公告)号：US10697887B2
公开(公告)日：2020-06-30
申请号：US15209072
申请日：2016-07-13
申请人： CANON KABUSHIKI KAISHA
发明人： Yusuke Kasai , Hiroshi Kawanago , Takashi Seki
IPC分类号： G01N21/27 , G01N21/57 , G01N21/84 , G01N21/47 , G01N21/55
摘要： A measuring apparatus that measures an optical characteristic of a surface in accordance with a standard selected from a plurality of standards is provided. The apparatus includes an illumination device configured to illuminate the surface with light from a light source, an imaging device configured to image the light source with reflected light from the surface illuminated by the illumination device, and a processor configured to process image data having number of pixels obtained by reducing number of pixels of the imaging device by a reduction rate to obtain the optical characteristic of the surface. The processor is configured to determine the reduction rate based on the selected standard.

5. 发明申请

US20180113073A1 MEASURING APPARATUS 审中-公开
公开(公告)号：US20180113073A1
公开(公告)日：2018-04-26
申请号：US15785753
申请日：2017-10-17
申请人： CANON KABUSHIKI KAISHA
发明人： Hiroshi Kawanago
IPC分类号： G01N21/55 , H04N7/18
CPC分类号： G01N21/55 , G01N21/474 , G01N21/57 , H04N7/183
摘要： The present invention provides a measuring apparatus having a housing in which an opening is formed, and measuring a reflection characteristic of a target region to be measured via the opening, the apparatus comprising an imaging device provided in the housing, and configured to capture an image of an imaging region via the opening, a detector configured to detect light reflected from the target region, which is a portion of the imaging region, a processor configured to obtain a reflection characteristic of the target region based on the light detected by the detecting unit, and a display unit configured to display the image of the imaging region captured by the imaging unit, wherein the image of the imaging region displayed by the display unit includes information indicating the target region.

6. 发明申请

US20170024895A1 OPTICAL CHARACTERISTIC MEASURING APPARATUS 审中-公开
标题翻译：光学特性测量装置
公开(公告)号：US20170024895A1
公开(公告)日：2017-01-26
申请号：US15209072
申请日：2016-07-13
申请人： CANON KABUSHIKI KAISHA
发明人： Yusuke Kasai , Hiroshi Kawanago , Takashi Seki
IPC分类号： G06T7/00
摘要： A measuring apparatus that measures an optical characteristic of a surface in accordance with a standard selected from a plurality of standards is provided. The apparatus includes an illumination device configured to illuminate the surface with light from a light source, an imaging device configured to image the light source with reflected light from the surface illuminated by the illumination device, and a processor configured to process image data having number of pixels obtained by reducing number of pixels of the imaging device by a reduction rate to obtain the optical characteristic of the surface. The processor is configured to determine the reduction rate based on the selected standard.
摘要翻译：提供了一种根据从多个标准中选择的标准来测量表面的光学特性的测量装置。该装置包括被配置为用来自光源的光来照射表面的照明装置，被配置为用来自照明装置照射的表面的反射光对光源进行成像的成像装置，以及处理器，被配置为处理具有通过减少成像装置的像素数减少获得的像素，以获得表面的光学特性。处理器被配置为基于所选择的标准来确定减少率。

7. 发明授权

US08947667B2 Spectrophotometer 有权
公开(公告)号：US08947667B2
公开(公告)日：2015-02-03
申请号：US13934459
申请日：2013-07-03
申请人： Canon Kabushiki Kaisha
发明人： Hiroshi Kawanago
IPC分类号： G01N21/25 , G01J3/42 , G01J3/10 , G01J3/46 , G01J3/50
CPC分类号： G01N21/251 , G01J3/10 , G01J3/42 , G01J3/465 , G01J3/502 , G01N2201/062 , G01N2201/0686
摘要： The spectrophotometer of the present invention measures a spectral reflectance of an object to be measured to thereby determine a color value of the object to be measured based on a color-matching function of an XYZ color system and the spectral reflectance. The spectrophotometer includes an irradiation unit configured to irradiate the object to be measured with light having a spectral intensity distribution in which a relative intensity at a wavelength at which the value of z reaches its peak in the color-matching function is equal to or greater than 0.5.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式