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    • 4. 发明授权
    • System and method for AC performance tuning by thereshold voltage shifting in tubbed semiconductor technology
    • 通过液晶半导体技术中的阈值电压偏移进行交流性能调谐的系统和方法
    • US06487701B1
    • 2002-11-26
    • US09711744
    • 2000-11-13
    • Alvar A. DeanJerry D. HayesJoseph A. IadanzaEmory D. KellerSebastian T. Ventrone
    • Alvar A. DeanJerry D. HayesJoseph A. IadanzaEmory D. KellerSebastian T. Ventrone
    • G06F1750
    • G01R31/3163G01R31/2891
    • A system and method are described for separating the bulk connections for FETs on a semiconductor wafer from the supply rails, testing the wafer to determine if a shift in the threshold voltage, VT, of certain devices within the wafer, as defined by the bulk-wells, can remove an AC defect in the IC circuit, and tailoring the voltage or voltages applied to the bulk nodes, post-manufacture, such that the integrated circuit meets its performance targets or is sorted to a more valuable performance level. The method requires generating a gate level netlist of the IC's circuitry and performing timing calculations on these circuit netlists using static timing analyses, functional delay simulations, circuit activity analyses, and functional performance testing. The failures are then correlated to respective IC circuits, worst case slack circuits are investigated, and proposed changes to the threshold voltages are employed in the hardware.
    • 描述了一种系统和方法,用于将半导体晶片上的FET的体连接与电源轨分开,测试晶片以确定晶片内的某些器件的阈值电压VT是否偏移, 孔可以去除IC电路中的AC缺陷,并且定制施加到散装节点的电压或电压,后制造,使得集成电路满足其性能目标或被分类到更有价值的性能水平。 该方法需要生成IC电路的门级网表,并使用静态时序分析,功能延迟模拟,电路活动分析和功能性能测试来对这些电路网表执行定时计算。 然后将故障与相应的IC电路相关联,最坏情况下调查松弛电路,并且在硬件中采用提出的阈值电压的改变。
    • 9. 发明授权
    • Concurrent logical and physical construction of voltage islands for mixed supply voltage designs
    • 用于混合电源电压设计的并联电压岛的逻辑和物理构造
    • US06792582B1
    • 2004-09-14
    • US09713829
    • 2000-11-15
    • John M CohnAlvar A. DeanDavid J. HathawayDavid E. LackeyThomas M. LepsicSusan K. LichtensteigerScott A. TetreaultSebastian T. Ventrone
    • John M CohnAlvar A. DeanDavid J. HathawayDavid E. LackeyThomas M. LepsicSusan K. LichtensteigerScott A. TetreaultSebastian T. Ventrone
    • G06F1750
    • G06F17/5045G06F17/5068
    • Both logical and physical construction of voltage islands is disclosed. A semiconductor chip design is partitioned into “bins”, which are areas of the design. In this way, a semiconductor chip design may be “sliced” into various areas and the areas may then be assigned to various voltage levels. Each bin may be thought of as a voltage island. Circuits in the design can be added to or removed from the various bins, thereby increasing or decreasing the speed and power of the circuits: the speed and power increase if a circuit is placed into a bin assigned a higher voltage, and the speed and power decrease if a circuit is placed into a bin having a lower voltage. The size and location of the bins may also be changed. By iterating these steps, the optimum power consumption may be met while still meeting speed constraints and other criteria. The present invention is applicable to any placement environment, such as an annealing placement tool, that proceeds through successive refinement of the locations of the circuits on the design and in which the placement process may be interrupted to make changes in placement of the logic.
    • 公开了电压岛的逻辑和物理结构。 半导体芯片设计被划分为“箱”,这是设计的区域。 以这种方式,可以将半导体芯片设计“切片”成各种区域,然后将这些区域分配给各种电压电平。 每个仓可以被认为是电压岛。 设计中的电路可以添加到各个机箱中或从各个机箱中移除,从而增加或减少电路的速度和功率:如果将电路放入分配较高电压的箱体中,速度和功率会增加,速度和功率 如果将电路放置在具有较低电压的箱中,则减小。 还可以改变箱子的大小和位置。 通过迭代这些步骤,可以在满足速度限制和其他标准的同时满足最佳功耗。 本发明可应用于诸如退火放置工具的任何放置环境,其通过连续细化设计上的电路的位置并且其中可以中断放置过程以使逻辑的放置变化。