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    • 3. 发明授权
    • Reducing processing bias in a soft forward error correction (FEC) decoder
    • 降低软前向纠错(FEC)解码器中的处理偏差
    • US08631305B2
    • 2014-01-14
    • US13435823
    • 2012-03-30
    • Stanley H. BlakeyHan Henry SunYuejian Wu
    • Stanley H. BlakeyHan Henry SunYuejian Wu
    • H03M13/00
    • H04B10/00H04L1/0045
    • A system is configured to receive a word that includes a group of samples; randomly select a subset of the samples; identify first samples, from the subset, with a lowest level of reliability; select another subset of the samples; identify second samples, from the other subset, with a lowest level of reliability; and create a merged subset based on selected first samples and selected second samples. The system is also configured to select a further subset of the samples; identify third samples, from the further subset, with a lowest level of reliability; identify fourth samples, from the merged subset, associated with a lowest level of reliability; create another merged subset based on a greater probability that fourth samples than third samples are included in the other merged subset; and generate another word based a sample from the other merged subset; and process the word using the other word.
    • 系统被配置为接收包括一组样本的单词; 随机选择样本的一个子集; 从子集中识别具有最低可靠性水平的第一个样本; 选择样品的另一个子集; 从另一个子集中识别具有最低可靠性水平的第二个样本; 并基于所选择的第一样本和所选择的第二样本创建合并的子集。 该系统还被配置为选择样本的另一子集; 从另一个子集中确定具有最低可靠性水平的第三个样本; 从合并的子集中确定与最低可靠性相关联的第四个样本; 基于第四个样本比第三个样本包含在另一个合并子集中更大的概率,创建另一个合并子集; 并根据来自其他合并子集的样本生成另一个单词; 并使用其他单词处理单词。
    • 4. 发明申请
    • REDUCING PROCESSING BIAS IN A SOFT FORWARD ERROR CORRECTION (FEC) DECODER
    • 在软前向纠错(FEC)解码器中减少处理偏差
    • US20130259492A1
    • 2013-10-03
    • US13435823
    • 2012-03-30
    • Stanley H. BlakeyHan Henry SunYuejian Wu
    • Stanley H. BlakeyHan Henry SunYuejian Wu
    • H04B10/06
    • H04B10/00H04L1/0045
    • A system is configured to receive a word that includes a group of samples; randomly select a subset of the samples; identify first samples, from the subset, with a lowest level of reliability; select another subset of the samples; identify second samples, from the other subset, with a lowest level of reliability; and create a merged subset based on selected first samples and selected second samples. The system is also configured to select a further subset of the samples; identify third samples, from the further subset, with a lowest level of reliability; identify fourth samples, from the merged subset, associated with a lowest level of reliability; create another merged subset based on a greater probability that fourth samples than third samples are included in the other merged subset; and generate another word based a sample from the other merged subset; and process the word using the other word.
    • 系统被配置为接收包括一组样本的单词; 随机选择样本的一个子集; 从子集中确定具有最低可靠性水平的第一个样本; 选择样品的另一个子集; 从另一个子集中识别具有最低可靠性水平的第二个样本; 并基于所选择的第一样本和所选择的第二样本创建合并的子集。 该系统还被配置为选择样本的另一子集; 从另一个子集中确定具有最低可靠性水平的第三个样本; 从合并的子集中确定与最低可靠性相关联的第四个样本; 基于第四个样本比第三个样本包含在另一个合并子集中更大的概率,创建另一个合并子集; 并根据来自其他合并子集的样本生成另一个单词; 并使用其他单词来处理该单词。
    • 7. 发明授权
    • Delay fault testing with IEEE 1149.1
    • 延迟故障测试与IEEE 1149.1
    • US06286119B1
    • 2001-09-04
    • US09218427
    • 1998-12-22
    • Yuejian WuPaul P. Soong
    • Yuejian WuPaul P. Soong
    • G01R3128
    • G01R31/31858
    • An interconnect delay test uses the IEEE 1149.1 standard test access port (TAP) controller. No modification of standard boundary cells is required. Since the standard boundary scan cells are used, circuit board and/or backplane interconnect delay tests do not affect ASIC (application specific integrated circuit) designs. It allows board and system designers to add new interconnect AC tests for any signals at any time without modification of ASICs. Since the method has no impact on the operations of the standard TAP controller, it is possible to use available test softwares for interconnect DC tests to perform the proposed delay test. The method can also be integrated as part of in-system interconnect tests.
    • 互连延迟测试使用IEEE 1149.1标准测试访问端口(TAP)控制器。 不需要对标准边界单元进行修改。 由于使用标准边界扫描单元,电路板和/或背板互连延迟测试不影响ASIC(专用集成电路)设计。 它允许电路板和系统设计人员随时为任何信号添加新的互连AC测试,而无需修改ASIC。 由于该方法对标准TAP控制器的操作没有影响,因此可以使用可用的测试软件进行互连直流测试来执行所提出的延迟测试。 该方法也可以作为系统互连测试的一部分进行集成。
    • 9. 发明申请
    • METHOD, SYSTEM, AND APPARATUS FOR FILTER IMPLEMENTATION USING HERMITIAN CONJUGATES
    • 方法,系统和装置,使用HERMITIAN CONJUGATES进行过滤器实现
    • US20110182577A1
    • 2011-07-28
    • US12785679
    • 2010-05-24
    • Yuejian Wu
    • Yuejian Wu
    • H04J14/00
    • H04B10/2513
    • Filter implementation using Hermitian conjugates and time division multiplexing (TDM) is disclosed to more efficiently compensate for chromatic dispersion of optical signals transmitted over a fiber optic medium. Embodiments for an input, filter, and output sections of a Digital Signal Processor (DSP) are described. The disclosed methods, and corresponding apparatus and systems enables a substantial reduction in the complexity of the hardware needed to implement CD compensation in the DSP. According to another embodiment, Inverse-Fourier transform circuits receive TDM data from the filter section and assemble the TDM data format back to a non-TDM format.
    • 公开了使用埃米特共轭和时分复用(TDM)的滤波器实现,以更有效地补偿通过光纤介质传输的光信号的色散。 描述了数字信号处理器(DSP)的输入,滤波器和输出部分的实施例。 所公开的方法和相应的装置和系统能够显着降低在DSP中实现CD补偿所需的硬件的复杂性。 根据另一实施例,逆傅立叶变换电路从滤波器部分接收TDM数据,并将TDM数据格式组合成非TDM格式。
    • 10. 发明授权
    • System and method for testing TDM sRAMs
    • 用于测试TDM sRAM的系统和方法
    • US06563751B1
    • 2003-05-13
    • US09749945
    • 2000-12-29
    • Yuejian Wu
    • Yuejian Wu
    • G11C700
    • G11C29/14G11C8/16G11C11/41
    • A technique for testing a static random access memory comprising at least the first port and a second port is disclosed. In one embodiment, the technique may be realized by testing the memory with values through the first port while applying one of a shadow write and a shadow read from the second port and testing the memory through the second port while applying one of the shadow write and the shadow read from the first port. The shadow write may be designed to write specified values into cells of the memory not being tested where the specified values are opposite to values used in testing the memory. The shadow read may be designed to read values from memory that are opposite to the values used in testing the memory.
    • 公开了一种用于测试包括至少第一端口和第二端口的静态随机存取存储器的技术。 在一个实施例中,该技术可以通过在从第二端口施加影子写入和阴影读取中的一个的情况下通过第一端口测试存储器来实现,并且通过第二端口测试存储器,同时施加阴影写入和 从第一个港口读取影子。 影子写入可能被设计为将指定的值写入未测试的存储器的单元格中,其中指定值与测试存储器中使用的值相反。 影子读取可以被设计为从存储器读取与用于测试存储器的值相反的值。