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    • 2. 发明授权
    • Memory with an output register for test data and process for testing a memory and memory module
    • 具有用于测试数据的输出寄存器和用于测试存储器和存储器模块的过程的存储器
    • US07757132B2
    • 2010-07-13
    • US11752907
    • 2007-05-23
    • Wolfgang SpirklMartin Brox
    • Wolfgang SpirklMartin Brox
    • G11C29/00
    • G11C29/12G11C2029/0405G11C2029/3602
    • The invention relates to a memory with a memory array with memory cells, with an input/output circuit which is connected to the memory cells and which interchanges data with the memory cells, with an output register which is connected to the input/output circuit, with the output register being used to output data via a data output, having an input register which is connected to a data input and to the input/output circuit, with the data input and the input register being used to input data into the memory cells, with test data being written to the output register in a test mode. The invention furthermore relates to a process for testing a memory and to a memory module.
    • 本发明涉及具有存储器单元的存储器阵列的存储器,其中输入/输出电路连接到存储器单元并且与存储器单元交换数据,以及连接到输入/输出电路的输出寄存器, 其中输出寄存器用于经由数据输出输出数据,具有连接到数据输入端和输入/输出电路的输入寄存器,数据输入端和输入寄存器用于将数据输入存储单元 测试数据以测试模式写入输出寄存器。 本发明还涉及一种用于测试存储器和存储器模块的过程。
    • 3. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07489153B2
    • 2009-02-10
    • US11159026
    • 2005-06-22
    • Wolfgang Spirkl
    • Wolfgang Spirkl
    • G01R31/26G01R31/02
    • G11C29/48G11C29/1201
    • The invention relates to a semiconductor memory device, which can be operated in a normal operating mode and a test mode, comprising: data terminals and data clock terminals; input receivers for processing the signal arriving via the respective terminal, a respective input receiver being assigned to a data terminal and/or data clock terminal; at least one test circuit, a respective test circuit being assigned to an input receiver and the test circuit being designed for determining at least one predetermined property of the assigned input receiver.
    • 本发明涉及可以在正常工作模式和测试模式下操作的半导体存储器件,包括:数据端子和数据时钟端子; 用于处理经由相应终端到达的信号的输入接收器,分配给数据终端和/或数据时钟端的相应输入接收器; 至少一个测试电路,相应的测试电路被分配给输入接收器,并且所述测试电路被设计用于确定所分配的输入接收器的至少一个预定属性。
    • 6. 发明申请
    • Self test for the phase angle of the data read clock signal DQS
    • 自检相位角的数据读时钟信号DQS
    • US20060064620A1
    • 2006-03-23
    • US11227714
    • 2005-09-15
    • Justus KuhnWolfgang Spirkl
    • Justus KuhnWolfgang Spirkl
    • G01R31/28G06F11/00
    • G11C29/028G11C29/1201G11C29/50G11C29/50012
    • The invention relates to a semiconductor memory apparatus having at least one clock input contact for inputting an external clock signal, at least one clock output contact for outputting a data read clock signal for reading data stored in the semiconductor memory apparatus, at least one data contact for outputting data stored in the semiconductor memory apparatus, at least one phase adjustment device which is designed for approximately adjusting a phase of the data read clock signal on the basis of a phase of the external clock signal at least one phase difference test device which is designed for approximately detecting a phase difference between the phase of the data read clock signal and the phase of the external clock signal and for outputting a test result on the basis of the detected phase difference.
    • 本发明涉及具有用于输入外部时钟信号的至少一个时钟输入触点的半导体存储装置,至少一个时钟输出触点,用于输出用于读取存储在半导体存储装置中的数据的数据读取时钟信号,至少一个数据触点 用于输出存储在所述半导体存储装置中的数据,所述至少一个相位调整装置被设计为基于所述外部时钟信号的相位近似地调整所述数据读取时钟信号的相位,所述至少一个相位差测试装置是 设计用于近似地检测数据读时钟信号的相位与外部时钟信号的相位之间的相位差,并且用于基于检测到的相位差输出测试结果。
    • 7. 发明申请
    • Method and arrangement for testing output circuits of high speed semiconductor memory devices
    • 用于测试高速半导体存储器件输出电路的方法和装置
    • US20050030781A1
    • 2005-02-10
    • US10843383
    • 2004-05-12
    • Stefan SommerWolfgang Spirkl
    • Stefan SommerWolfgang Spirkl
    • G11C29/48G11C11/22
    • G11C29/48G11C2029/3202
    • For testing or for characterizing output drivers of output circuits of high-speed semiconductor memory devices under conditions close to an application, scan elements are provided at the inputs of the output circuits. The scan elements in each case have a register function and are cascaded to form a scan chain. Via the scan chain, test data signals are applied to the inputs of the output circuits whilst bypassing a memory cell array of the semiconductor memory devices. The characterization of data signals of the high-speed semiconductor memory devices that are output by the output circuits requires only a test memory controller not connected to the data signal terminals and a passive load simulation of the application memory controller.
    • 为了在接近应用的条件下测试或表征高速半导体存储器件的输出电路的输出驱动器,在输出电路的输入处提供扫描元件。 每种情况下的扫描元件都具有寄存器功能,并且级联以形成扫描链。 通过扫描链,测试数据信号被施加到输出电路的输入端,同时旁路半导体存储器件的存储单元阵列。 由输出电路输出的高速半导体存储器件的数据信号的表征仅需要不连接到数据信号端子的测试存储器控制器和应用存储器控制器的被动负载仿真。
    • 8. 发明授权
    • Concept for reducing crosstalk
    • 减少串扰的概念
    • US07957254B2
    • 2011-06-07
    • US12050522
    • 2008-03-18
    • Wolfgang SpirklHolger Steffens
    • Wolfgang SpirklHolger Steffens
    • H04J1/12H04J3/10
    • G11C7/02G11C11/4076G11C11/4096G11C11/4097
    • A device for reducing mutual crosstalk of a signal routed across a first line and a second signal routed across a second line, wherein by the mutual crosstalk at an output of the first line a first interfered signal may be obtained and at an output of the second line a second interfered signal may be obtained, comprising a modifier for modifying the first interfered signal that is interfered by crosstalk due to the second signal, and for modifying the second interfered signal that is interfered by crosstalk due to the first signal, wherein the modifier is adapted to model an interference due to the mutual crosstalk, and a combiner for combining the first interfered signal with the modified second interfered signal to obtain a first corrected signal and for combining the second interfered signal with the modified first interfered signal to obtain a second corrected signal.
    • 一种用于减少跨越第一线路路由的信号的相互串扰的设备和跨越第二线路路由的第二信号,其中通过第一线路的输出处的相互串扰可以获得第一干扰信号,并且在第二线路的输出端 可以获得第二干扰信号,包括用于修改由于第二信号而被串扰干扰的第一干扰信号的修改器,以及用于修改由于第一信号而被串扰干扰的第二干扰信号,其中修饰符 适于对由于相互串扰造成的干扰进行建模,以及用于将第一干扰信号与修改的第二干扰信号组合以获得第一校正信号并将第二干扰信号与修改的第一干扰信号组合以获得第二干扰信号的组合器 校正信号。
    • 9. 发明授权
    • Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data
    • 存储器电路,动态随机存取存储器,包括存储器和浮点单元的系统以及用于存储数字数据的方法
    • US07515456B2
    • 2009-04-07
    • US11530858
    • 2006-09-11
    • Peter MayerWolfgang SpirklMarkus BalbChristoph BilgerMartin BroxThomas HeinMichael Richter
    • Peter MayerWolfgang SpirklMarkus BalbChristoph BilgerMartin BroxThomas HeinMichael Richter
    • G11C11/00
    • G11C7/16G11C7/1006G11C7/1051G11C7/1069G11C7/1078G11C7/1096G11C11/4085G11C11/4096
    • A memory circuit comprises a D/A converter connected with an input/output circuit and with a writing circuit, wherein the D/A converter converts a digital data with at least two digital bits received from the input/output circuit to one analog value and forwards the analog value to the writing circuit, wherein the digital data is at least a part of a floating point number, wherein the writing circuit writes the analog value in at least one selected memory cell, and an A/D converter connected with a reading circuit and with the input/output circuit, wherein the reading circuit reads an analog value from a selected memory cell and forwards the analog value to the A/D converter, wherein the A/D converter converts the analog value to digital data, and wherein the A/D converter forwards the digital data to the input/output circuit. Furthermore, a method is provided for reading data from at least one memory cell of a memory, wherein an analog value is read from the memory cell and the analog value is corrected according to a correction factor representing a storage time the analog value was stored and wherein the corrected analog value is converted to digital data.
    • 存储电路包括与输入/输出电路和写入电路连接的D / A转换器,其中D / A转换器将具有从输入/输出电路接收的至少两个数字位的数字数据转换成一个模拟值, 将模拟值转发到写入电路,其中数字数据是浮点数的至少一部分,其中写入电路将模拟值写入至少一个选择的存储单元,以及与读取器连接的A / D转换器 电路和输入/输出电路,其中读取电路从所选择的存储器单元读取模拟值并将模拟值转发到A / D转换器,其中A / D转换器将模拟值转换为数字数据,其中 A / D转换器将数字数据转发到输入/输出电路。 此外,提供一种用于从存储器的至少一个存储单元读取数据的方法,其中从存储器单元读取模拟值,并且根据表示存储模拟值的存储时间的校正因子来校正模拟值,以及 其中所述经修正的模拟值被转换为数字数据。
    • 10. 发明申请
    • CLOCK SIGNAL SYNCHRONIZING DEVICE WITH INHERENT DUTY-CYCLE CORRECTION CAPABILITY
    • 具有足够的周期校正能力的时钟信号同步器件
    • US20090045856A1
    • 2009-02-19
    • US11838634
    • 2007-08-14
    • Wolfgang SpirklMartin BroxHolger Steffens
    • Wolfgang SpirklMartin BroxHolger Steffens
    • H03L7/06
    • H03L7/0814
    • One aspect relates to a clock signal synchronizing device, in particular to a delayed locked loop (DLL) with capability to correct static duty-cycle offset and to filter clock-jitter. One aspect relates to a clock signal synchronizing method with capability to correct static duty-cycle offset and to filter clock-jitter. In accordance one aspect, there is provided a clock signal synchronizing device including a delay circuit having a variable delay time and delaying an incoming clock signal or a signal generated therefrom to output a delayed clock signal. Also included is a negator for inverting the delayed clock signal to output an inverted delayed clock signal. Also included is a delay control circuit for controlling the delay circuit to adjust the phase relation between the incoming clock signal and the inverted delayed clock signal and a phase interpolator. The phase interpolator is activated when the incoming clock signal and the inverted delayed clock signal are substantially in phase and adds the incoming clock signal multiplied with a factor of substantially (1−p) to the inverted delayed clock signal multiplied with a factor of substantially p to output a compound signal to the delay circuit, p being a real number greater than or equal to 0 and smaller than or equal to 1.
    • 一个方面涉及一种时钟信号同步装置,特别涉及具有校正静态占空比偏移和滤波时钟抖动能力的延迟锁定环(DLL)。 一个方面涉及具有校正静态占空比偏移和滤波时钟抖动能力的时钟信号同步方法。 根据一个方面,提供了一种时钟信号同步装置,其包括具有可变延迟时间并延迟输入时钟信号或由其产生的信号的延迟电路以输出延迟的时钟信号。 还包括用于反相延迟时钟信号以输出反相延迟时钟信号的否定器。 还包括延迟控制电路,用于控制延迟电路以调整输入时钟信号和反相延迟时钟信号之间的相位关系以及相位插值器。 当输入时钟信号和反相延迟时钟信号基本上同相时,相位内插器被激活,并将输入时钟信号乘以基本上为(1-p)的因子到反相延迟的时钟信号乘以基本上为p的因子 将复合信号输出到延迟电路,p是大于或等于0且小于或等于1的实数。