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1. 发明授权

US06326778B1 Method and apparatus for transmitting speed information and other additional information detected by a sensing device 有权
标题翻译：用于传送由感测装置检测到的速度信息和其它附加信息的方法和装置
公开(公告)号：US06326778B1
公开(公告)日：2001-12-04
申请号：US09270961
申请日：1999-03-16
申请人： Ulrich Helmut Hummel
发明人： Ulrich Helmut Hummel
IPC分类号： G01P348
CPC分类号： G08C15/00 , B60T8/171 , G01P3/489 , H04L7/0008
摘要： A method and a sensing device transmit speed information and additional information over a transmission channel. For this purpose, the transmission clock cycle is selected to reflect the speed and is detected by the sensing device. The additional information is transmitted as a modulation of the transmission clock cycle.
摘要翻译：方法和感测装置通过传输信道发送速度信息和附加信息。为此，选择传输时钟周期以反映速度并由感测装置检测。作为传输时钟周期的调制发送附加信息。

2. 发明授权

US06968484B2 Method for parametrizing an integrated circuit and an integrated circuit therefor 有权
标题翻译：用于参数化集成电路的方法及其集成电路
公开(公告)号：US06968484B2
公开(公告)日：2005-11-22
申请号：US10604579
申请日：2003-07-31
申请人： Ulrich Helmut Hummel
发明人： Ulrich Helmut Hummel
IPC分类号： H01L21/82 , H01L21/66 , G11C29/00
CPC分类号： H01L22/22
摘要： A method is described for parametrizing an integrated circuit by applying a digital start command signal followed by a parametrization data signal to the supply voltage terminal and/or the output terminal of the integrated circuit. During the parametrization process, the voltage level applied to the supply voltage terminal and/or the output terminal is kept above the normal operating voltage level and detected by a detector device provided in integrated circuit. The integrated circuit includes the supply voltage terminal, a reference potential terminal, and the output terminal, as well as an internal memory which is preferably non-volatile. The adjustment specification for parametrizing the integrated circuit is stored in the memory and activated by the parametrization data signal.
摘要翻译：描述了通过将数字启动命令信号和参数化数据信号施加到集成电路的电源电压端子和/或输出端子来参数化集成电路的方法。在参数化过程中，施加到电源电压端子和/或输出端子的电压电平保持在正常工作电压电平以上，并由集成电路中提供的检测器件检测。集成电路包括电源电压端子，参考电位端子和输出端子，以及优选地是非易失性的内部存储器。用于参数化集成电路的调整规范存储在存储器中并由参数化数据信号激活。

3. 发明授权

US06738940B1 Integrated circuit including a test signal generator 有权
标题翻译：集成电路包括一个测试信号发生器
公开(公告)号：US06738940B1
公开(公告)日：2004-05-18
申请号：US09674413
申请日：2000-12-26
申请人： Ulrich Helmut Hummel , Jonathan Bradford
发明人： Ulrich Helmut Hummel , Jonathan Bradford
IPC分类号： G01R3128
CPC分类号： G01R31/318385 , G01R31/2884 , G01R31/3167 , G01R31/318522
摘要： An integrated circuit (IC) includes a first lead, a second lead and a sensor element that provides a sensed signal. The IC also includes a test signal generator that provides a test signal, a signal processing unit, and a switching device that selectively applies the sensed signal or the test signal to the signal processing unit in response to a command signal, wherein the signal processing unit provides processed data. In response to a test command input signal, the IC generates the command signal, wherein when the test input signal is active the command signal is set to command the switching device to input the test signal to the signal processing unit. A check sum calculator receives the processed data and provides a signal indicative of a check sum value on the second lead when the command signal is set to command the switching device to input the test signal to the signal processing unit.
摘要翻译：集成电路（IC）包括提供感测信号的第一引线，第二引线和传感器元件。 IC还包括测试信号发生器，其提供测试信号，信号处理单元和切换装置，其响应于命令信号选择性地将感测信号或测试信号施加到信号处理单元，其中信号处理单元提供处理数据。响应于测试命令输入信号，IC产生命令信号，其中当测试输入信号有效时，命令信号被设置为命令切换装置将测试信号输入到信号处理单元。当命令信号被设置为命令切换装置将测试信号输入到信号处理单元时，校验和计算器接收处理的数据并提供表示第二引线上的校验和值的信号。

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