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    • 1. 发明授权
    • System for targeting cells or other materials
    • 用于靶向细胞或其他材料的系统
    • US08538120B2
    • 2013-09-17
    • US13114982
    • 2011-05-24
    • Kenneth Edward SalsmanUlrich BoettigerDmitry BakinCurtis W. Stith
    • Kenneth Edward SalsmanUlrich BoettigerDmitry BakinCurtis W. Stith
    • G06K9/00
    • G01N15/1012G01N15/1434G01N15/1459G01N15/1463G01N2015/1025G01N2015/1443
    • An image sensor integrated circuit may contain image sensor pixels. A channel containing a fluid with particles such as cells may be formed on top of the image sensor. Some of the image sensor pixels may form a calibration sensor and some of the image sensor pixels may form an imager. As the fluid and particles flow through the channel at a flow rate, the calibration sensor may measures the flow rate and illumination intensity in the channel. Based on calibration data such as measured flow rate and measured illumination intensity, adjustments may be made to ensure that the imager acquires satisfactory image data. The adjustments may include flow rate adjustments, image acquisition data rate adjustments, and illumination adjustments. A processing unit in the channel may contain a laser or other component to destroy selected cells. A flared region in the channel may be used as a chromatograph.
    • 图像传感器集成电路可以包含图像传感器像素。 可以在图像传感器的顶部上形成包含诸如细胞等颗粒的流体的通道。 一些图像传感器像素可以形成校准传感器,并且一些图像传感器像素可以形成成像器。 当流体和颗粒以流速流过通道时,校准传感器可以测量通道中的流量和照射强度。 基于诸如测量流量和测量的照射强度的校准数据,可以进行调整以确保成像器获得令人满意的图像数据。 调整可以包括流量调整,图像采集数据速率调整和照明调整。 通道中的处理单元可以包含用于摧毁所选择的单元的激光器或其他组件。 通道中的扩口区域可用作色谱仪。
    • 2. 发明申请
    • SPECTRALLY TUNED PLASMONIC LIGHT COLLECTORS
    • US20120326256A1
    • 2012-12-27
    • US13365067
    • 2012-02-02
    • Kenneth Edward SalsmanUlrich BoettigerDmitry BakinCurtis W. Stith
    • Kenneth Edward SalsmanUlrich BoettigerDmitry BakinCurtis W. Stith
    • H01L31/0232
    • H01L27/14625H01L27/14603
    • Electronic devices may be provided with imaging modules that include plasmonic light collectors. Plasmonic light collectors may be configured to exploit an interaction between incoming light and plasmons in the plasmonic light collector to alter the path of the incoming light. Plasmonic light collectors may include one or more spectrally tuned plasmonic image pixels configured to preferentially trap light of a given frequency. Spectrally tuned plasmonic image pixels may include plasmonic structures formed form a patterned metal layer over doped silicon layers. Doped silicon layers may be interposed between plasmonic structures and a reflective layer. Plasmonic image pixels may be used to absorb and detect as much as, or more than, ninety percent of incident light at wavelengths ranging from the infrared to the ultraviolet. Plasmonic image pixels that capture light of different colors may be arranged in patterned arrays to form imager modules or imaging spectrometers for optofluidic microscopes.
    • 电子设备可以设置有包括等离子体激光收集器的成像模块。 等离子体光收集器可以被配置为利用等离子体光收集器中的入射光和等离子体激元之间的相互作用来改变入射光的路径。 等离子体光收集器可以包括被配置为优先捕获给定频率的光的一个或多个频谱调谐等离子体像图像。 光谱调谐等离子体激元图像像素可以包括由掺杂硅层上的图案化金属层形成的等离子体结构。 掺杂的硅层可以介于等离子体激元结构和反射层之间。 等离子体像图像可用于吸收和检测多达或多于百分之九十的入射光,其范围从红外至紫外。 捕获不同颜色的光的等离子体像图像可以以图案化阵列布置以形成用于光流体显微镜的成像器模块或成像光谱仪。
    • 10. 发明申请
    • Method and apparatus for controlling radiation beam intensity directed to microlithograhic substrates
    • 用于控制针对微蚀刻基片的辐射束强度的方法和装置
    • US20060181692A1
    • 2006-08-17
    • US11397176
    • 2006-04-04
    • Ulrich BoettigerScott Light
    • Ulrich BoettigerScott Light
    • G03B27/72
    • G03F7/70083G03F7/70108G03F7/70141G03F7/70191G03F7/70558Y10S430/143
    • A method and apparatus for controlling an intensity distribution of a radiation beam directed to a microlithographic substrate. The method can include directing a radiation beam from a radiation source along the radiation path, with the radiation beam having a first distribution of intensity as the function of location in a plane generally transverse to the radiation path. The radiation beam impinges on an adaptive structure positioned in the radiation path and an intensity distribution of the radiation beam is changed from the first distribution to a second distribution by changing a state of the first portion of the adaptive structure relative to a second portion of the adaptive structure. For example, the transmissivity of the first portion, or inclination of the first portion can be changed relative to the second portion. The radiation is then directed away from the adaptive structure to impinge on the microlithographic substrate.
    • 一种用于控制指向微光刻基片的辐射束的强度分布的方法和装置。 该方法可以包括沿着辐射路径引导来自辐射源的辐射束,其中辐射束具有作为大致横向于辐射路径的平面中的位置的函数的强度的第一分布。 辐射束照射位于辐射路径中的自适应结构,并且辐射束的强度分布从第一分布改变到第二分布,通过改变自适应结构的第一部分相对于第二部分的第二部分的状态 自适应结构。 例如,第一部分的透射率或第一部分的倾斜度可以相对于第二部分改变。 然后将辐射导向远离自适应结构以照射到微光刻基板上。