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    • 1. 发明授权
    • Enhancement-depletion mode inverter with two transistor architectures
    • 具有两个晶体管架构的增强耗尽型逆变器
    • US09368490B2
    • 2016-06-14
    • US14526634
    • 2014-10-29
    • Carolyn Rae EllingerShelby Forrester Nelson
    • Carolyn Rae EllingerShelby Forrester Nelson
    • H01L27/088H01L29/786
    • H01L27/0883H01L27/1225H01L27/1251H01L29/7869
    • An enhancement-depletion-mode inverter includes a load transistor and a drive transistor. The load transistor has a top gate architecture with a first source, a first drain, a load channel region, a first semiconductor layer, and a first gate electrode. A load gate dielectric is in the load channel region, and has a load dielectric thickness. The load transistor is configured to operate in a depletion mode. The drive transistor has a bottom gate architecture with a second source, a second drain, a drive channel region, a second semiconductor layer, and a second gate electrode. A drive gate dielectric is in the drive channel region, and has a drive dielectric thickness that is different from the load dielectric thickness. The drive transistor is configured to operate in a normal mode or an enhancement mode. The first source is electrically connected to the second drain and the first gate.
    • 增强耗尽型逆变器包括负载晶体管和驱动晶体管。 负载晶体管具有顶栅结构,其具有第一源极,第一漏极,负载沟道区域,第一半导体层和第一栅极电极。 负载栅极电介质位于负载沟道区域中,并具有负载介质厚度。 负载晶体管被配置为在耗尽模式下工作。 驱动晶体管具有底栅结构,其具有第二源极,第二漏极,驱动沟道区,第二半导体层和第二栅电极。 驱动栅极电介质位于驱动沟道区域中,并且具有不同于负载介质厚度的驱动电介质厚度。 驱动晶体管被配置为在正常模式或增强模式下操作。 第一源电连接到第二漏极和第一栅极。
    • 3. 发明授权
    • Bottom gate TFT with multilayer passivation
    • 底栅TFT多层钝化
    • US09299853B1
    • 2016-03-29
    • US14487161
    • 2014-09-16
    • Carolyn Rae EllingerShelby Forrester Nelson
    • Carolyn Rae EllingerShelby Forrester Nelson
    • H01L29/12H01L29/786
    • H01L29/78696H01L29/7869
    • A transistor includes a gate in contact with a substrate. A gate insulating layer is in contact with at least the gate. An inorganic semiconductor layer is in contact with the gate insulating layer. There is a source electrode in contact with a first portion of the inorganic semiconductor layer and a drain electrode in contact with a second portion of the inorganic semiconductor layer, and the source electrode and the drain electrode are separated by a gap. There is a multilayer insulating structure in contact with at least the inorganic semiconductor layer in the gap. The multilayer structure includes an inorganic dielectric layer having a first pattern defining a first area; and a polymer structure having a second pattern defining a second area. The second area is located within the first area and the polymer structure is in contact with the semiconductor layer in the gap.
    • 晶体管包括与衬底接触的栅极。 栅极绝缘层至少与栅极接触。 无机半导体层与栅极绝缘层接触。 存在与无机半导体层的第一部分接触的源电极和与无机半导体层的第二部分接触的漏电极,并且源电极和漏电极被间隙分开。 存在与间隙中的至少无机半导体层接触的多层绝缘结构。 多层结构包括具有限定第一区域的第一图案的无机介电层; 以及具有限定第二区域的第二图案的聚合物结构。 第二区域位于第一区域内,聚合物结构与间隙中的半导体层接触。
    • 5. 发明授权
    • VTFT with polymer core
    • VTFT与聚合物芯
    • US09117914B1
    • 2015-08-25
    • US14198628
    • 2014-03-06
    • Carolyn Rae EllingerShelby Forrester Nelson
    • Carolyn Rae EllingerShelby Forrester Nelson
    • H01L29/78H01L29/786
    • H01L29/78642H01L29/78603H01L29/7869
    • A transistor includes a polymeric material post on a substrate. An inorganic material cap, covering the post, extends beyond an edge of the post to define a reentrant profile. A conformal conductive material gate layer is over the edge of the post in the reentrant profile. A conformal insulating material layer is on the gate layer in the reentrant profile. A conformal semiconductor material layer is on the insulating material layer in the reentrant profile. A first electrode is in contact with a first portion of the semiconductor layer over the cap. A second electrode is in contact with a second portion of the semiconductor layer over the substrate and not over the post, and adjacent to the edge of the post in the reentrant profile such that a distance between the first electrode and second electrode is greater than zero when measured orthogonally to the substrate surface.
    • 晶体管包括在基板上的聚合材料柱。 覆盖柱的无机材料帽延伸超过柱的边缘以限定折返轮廓。 保形导电材料栅极层位于折返轮廓中的柱的边缘上。 在凹凸轮廓中的栅极层上保形绝缘材料层。 保形半导体材料层位于折入型材中的绝缘材料层上。 第一电极与帽上的半导体层的第一部分接触。 第二电极与衬底上的半导体层的第二部分接触,而不是在柱上,并且邻近在折返轮廓中的柱的边缘,使得第一电极和第二电极之间的距离大于零 当与基底表面正交测量时。
    • 6. 发明授权
    • Enhancement mode inverter with variable thickness dielectric stack
    • 具有可变厚度电介质叠层的增强型逆变器
    • US09368491B2
    • 2016-06-14
    • US14526675
    • 2014-10-29
    • Carolyn Rae EllingerShelby Forrester Nelson
    • Carolyn Rae EllingerShelby Forrester Nelson
    • H01L29/786H01L27/088H01L27/07
    • H01L27/0883H01L27/0705H01L27/1237H01L29/7869
    • An enhancement-mode inverter includes a load transistor and a drive transistor. The load transistor has a bottom gate architecture with a first source, a first drain, a load channel region, a first semiconductor layer, and a first gate electrode. A load gate dielectric is in the load channel region, and has a load dielectric thickness. The drive transistor has a bottom gate architecture with a second source, a second drain, a drive channel region, a second semiconductor layer, and a second gate electrode. A drive gate dielectric is in the drive channel region, and has a drive dielectric thickness less than the load dielectric thickness. The first source is electrically connected to the second drain and the first gate is electrically connected to the first drain. The load gate dielectric and the drive gate dielectric are part of a common shared dielectric stack.
    • 增强型逆变器包括负载晶体管和驱动晶体管。 负载晶体管具有底栅结构,其具有第一源极,第一漏极,负载沟道区域,第一半导体层以及第一栅极电极。 负载栅极电介质位于负载沟道区域中,并具有负载介质厚度。 驱动晶体管具有底栅结构,其具有第二源极,第二漏极,驱动沟道区,第二半导体层和第二栅电极。 驱动栅极电介质位于驱动沟道区域中,并且具有小于负载电介质厚度的驱动电介质厚度。 第一源电连接到第二漏极,并且第一栅极电连接到第一漏极。 负载栅极电介质和驱动栅电介质是公共共用电介质叠层的一部分。
    • 9. 发明申请
    • VTFT WITH POST, CAP, AND ALIGNED GATE
    • VTFT与POST,CAP和对齐门
    • US20150255623A1
    • 2015-09-10
    • US14198633
    • 2014-03-06
    • Shelby Forrester NelsonCarolyn Rae Ellinger
    • Shelby Forrester NelsonCarolyn Rae Ellinger
    • H01L29/786H01L29/10H01L29/423
    • H01L29/78642H01L29/1037H01L29/42384H01L29/7869
    • A thin film transistor includes a post on a substrate. The post has a height dimension extending away from the substrate to a top, and an edge along the height dimension. A cap covers the top of the post and extends to a distance beyond the edge of the post to define a reentrant profile. A conformal conductive gate layer is located on the edge of the post in the reentrant profile and not over the cap, and includes a portion that extends along the substrate. A conformal insulating layer is on the gate layer in the reentrant profile. A conformal semiconductor layer is on the insulating layer in the reentrant profile. First and second electrodes are located in contact with a first portion of the semiconductor layer over the cap and a second portion of the semiconductor layer not over the post, respectively.
    • 薄膜晶体管包括在基板上的柱。 该柱具有从基板延伸到顶部的高度尺寸和沿着高度尺寸的边缘。 帽盖覆盖柱的顶部并且延伸到距离柱的边缘的距离以定义可重入的轮廓。 共形导电栅极层位于折返轮廓中的柱的边缘上并且不在盖上,并且包括沿着衬底延伸的部分。 保形绝缘层位于折返轮廓中的栅极层上。 保形半导体层位于凹凸轮廓中的绝缘层上。 第一和第二电极分别与帽上的半导体层的第一部分接触并且半导体层的第二部分分别不在柱上。
    • 10. 发明申请
    • VTFT FORMATION USING SELECTIVE AREA DEPOSITION
    • 使用选择区沉积的VTFT形成
    • US20150255579A1
    • 2015-09-10
    • US14198636
    • 2014-03-06
    • Shelby Forrester NelsonCarolyn Rae Ellinger
    • Shelby Forrester NelsonCarolyn Rae Ellinger
    • H01L29/66H01L21/28
    • H01L29/66742H01L29/42384H01L29/66969H01L29/78642H01L29/7869
    • A method of producing a vertical transistor includes providing a conductive gate structure having a reentrant profile on a substrate. A conformal insulating material layer is formed on the conductive gate structure. A conformal semiconductor material layer is formed on the insulating material layer. A deposition inhibiting material is deposited over a portion of the substrate and the conductive gate structure including filling the reentrant profile. A portion of the deposition inhibiting material is removed without removing all of the deposition inhibiting material from the reentrant profile. A plurality of electrodes is formed by depositing an electrically conductive material layer on portions of the semiconductor material layer using a selective area deposition process in which the electrically conductive material layer is not deposited on the deposition inhibiting material remaining in the reentrant profile.
    • 制造垂直晶体管的方法包括提供在衬底上具有折入轮廓的导电栅极结构。 在导电栅结构上形成保形绝缘材料层。 在绝缘材料层上形成保形半导体材料层。 沉积抑制材料沉积在衬底的一部分上,并且导电栅极结构包括填充折入轮廓。 除去沉积抑制材料的一部分,而不从所述折入轮廓中除去所有沉积抑制材料。 通过使用选择性区域沉积工艺在半导体材料层的部分上沉积导电材料层来形成多个电极,其中导电材料层未沉积在残留在折入轮廓中的沉积抑制材料上。