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    • 2. 发明申请
    • LOW TEMPERATURE CURABLE MATERIALS FOR OPTICAL APPLICATIONS
    • 用于光学应用的低温可固化材料
    • US20060027803A1
    • 2006-02-09
    • US10910673
    • 2004-08-03
    • Victor LuLei JinArlene SuedmeyerPaul Apen
    • Victor LuLei JinArlene SuedmeyerPaul Apen
    • H01L29/04H01L21/84
    • C09D183/04H01L21/02126H01L21/02216H01L21/02282H01L21/3122H01L21/3127H01L21/316H01L27/1292
    • The invention relates to low temperature curable spin-on glass materials which are useful for electronic applications, such as optical devices. A substantially crack-free and substantially void-free silicon polymer film is produced by (a) preparing a composition comprising at least one silicon containing pre-polymer having at least one organic group, a catalyst, and optionally water; (b) coating a substrate with the composition to form a film on the substrate, (c) crosslinking the composition by heating the composition at a temperature of about 250° C. or less for about 30 minutes or less, to produce a substantially crack-free and substantially void-free silicon polymer film, which silicon polymer has a weight ratio of organic groups to SiO groups of about 0.15:1 or more, and which silicon containing polymer film has a field breakdown voltage of about 2.5 MV/cm or more and a transparency to light in the range of about 400 nm to about 700 nm of about 95% or more.
    • 本发明涉及可用于电子应用的低温可固化旋涂玻璃材料,例如光学器件。 通过(a)制备包含至少一种具有至少一个有机基团的含硅预聚物,催化剂和任选的水的组合物来制备基本上无裂纹且基本上无空隙的硅聚合物膜; (b)用该组合物涂覆基材以在基材上形成膜,(c)通过在约250℃或更低的温度下加热该组合物约30分钟或更短时间来交联该组合物,以产生基本上裂纹 该硅聚合物的有机基团与SiO基的重量比为约0.15:1或更高,并且含硅聚合物膜的场击穿电压为约2.5MV / cm,或者 在约400nm至约700nm的范围内的光的透明度为约95%或更高。
    • 3. 发明授权
    • Low dielectric constant polyorganosilicon materials generated from polycarbosilanes
    • 由聚碳硅烷生成的低介电常数聚有机硅材料
    • US06841256B2
    • 2005-01-11
    • US10122400
    • 2002-04-11
    • Paul ApenHui-Jung Wu
    • Paul ApenHui-Jung Wu
    • B05D3/06B05D5/12C09D183/16H01L21/312B32B25/20
    • H01L21/02126B05D3/06B05D5/12C09D183/16H01L21/02203H01L21/02348H01L21/02351H01L21/3121Y10T428/31663
    • Methods are presented herein for forming thermally stable, adhesive, low dielectric constant polyorganosilicon dielectric films for use as semiconductor insulators and as adhesion promoters as and in conjunction with low k materials. Surprisingly, the methods described herein can provide polyorganosilicon materials, coatings and films having very low dielectric constants that are generated from specified polycarbosilane starting materials employing wet coating and standard high energy generating processes, without the need for exotic production techniques or incurring disadvantages found in other low k dielectric film-forming methods. The polycarbosilane compounds, polyorganosilane compounds, adhesion promoter materials and layered materials disclosed herein can be used in any suitable semiconductor or electronic application, including semiconductor devices, electronic devices, films and coatings.
    • 本文提出了用于形成用作半导体绝缘体的热稳定性,粘合性低介电常数聚有机硅介电膜的方法,以及与低k材料结合使用的粘合促进剂。 令人惊奇的是,本文所述的方法可以提供具有非常低的介电常数的聚有机硅材料,涂层和薄膜,这些材料是使用湿式涂层和标准的高能量生成方法从指定的聚碳硅烷起始材料产生的,而不需要外来的生产技术或产生其他的缺点 低k电介质成膜方法。 本文公开的聚碳硅烷化合物,聚有机硅烷化合物,粘合促进剂材料和分层材料可用于任何合适的半导体或电子应用,包括半导体器件,电子器件,膜和涂层。
    • 4. 发明申请
    • Organic compositions
    • 有机成分
    • US20070155997A1
    • 2007-07-05
    • US10536884
    • 2003-12-31
    • Bo LiKreisler LauPaul Apen
    • Bo LiKreisler LauPaul Apen
    • C07C13/615
    • C07C17/10C07C13/615C07C13/64C07C17/269C07C2603/74C07C2603/90C08G61/06C07C23/46C07C25/22
    • Compositions and methods of forming and using those compositions are provided herein where the composition comprises at least one oligomer or polymer of Formula I wherein E is a cage compound; each Q is the same or different and selected from aryl, branched aryl, and substituted aryl wherein the substituents include hydrogen, halogen, alkyl, aryl, substituted aryl, heteroaryl, aryl ether, alkenyl, alkynyl, alkoxyl, hydroxyalkyl, hydroxyaryl, hydroxyalkenyl, hydroxyalkynyl, hydroxyl, or carboxyl; A is substituted or unsubstituted aryl with substituted or unsubstituted arylalkynyl group (substituents include hydrogen, halogen, alkyl, phenyl or substituted aryl; and aryl includes phenyl, biphenyl, naphthyl, terphenyl, anthracenyl, polyphenylene, polyphenylene ether, or substituted aryl); h is from 0 to 10; i is from 0 to 10; j is from 0 to 10; and w is 0 or 1.
    • 本文提供了组合物和形成和使用这些组合物的方法,其中组合物包含至少一种式I的低聚物或聚合物,其中E是笼形化合物; 每个Q相同或不同,选自芳基,支链芳基和取代芳基,其中取代基包括氢,卤素,烷基,芳基,取代的芳基,杂芳基,芳基醚,烯基,炔基,烷氧基,羟基烷基,羟基芳基,羟基烯基, 羟基炔基,羟基或羧基; A是取代或未取代的具有取代或未取代的芳基炔基的芳基(取代基包括氢,卤素,烷基,苯基或取代的芳基;芳基包括苯基,联苯基,萘基,三联苯基,蒽基,聚亚苯基,聚苯醚或取代的芳基)。 h为0〜10; 我是从0到10; j为0〜10; w为0或1。
    • 8. 发明申请
    • Electrical properties of shallow trench isolation materials via high temperature annealing in the presence of reactive gases
    • 浅沟槽隔离材料的电性能在反应气体存在下通过高温退火
    • US20060051929A1
    • 2006-03-09
    • US10934068
    • 2004-09-03
    • Lei JinVictor LuWenya FanPaul Apen
    • Lei JinVictor LuWenya FanPaul Apen
    • H01L21/76
    • H01L21/02129H01L21/0212H01L21/02164H01L21/02216H01L21/02282H01L21/02337H01L21/3121H01L21/316H01L21/76224
    • The present invention relates to semiconductor device fabrication and more specifically to a method and material for forming high density shallow trench isolation structures in integrated circuits having improved electrical properties. A silica dielectric film is formed on a substrate (a) preparing a composition comprising a silicon containing pre-polymer, a metal-ion-free catalyst, and optionally water; (b) coating a substrate with the composition to form a film, (c) crosslinking the composition by first heating the composition in a nitrogen atmosphere at a temperature of from about 750° C. to about 850° C. for from about 30 minutes to about 120 minutes; and thereafter heating the composition in an oxygen atmosphere at a temperature of from about 850° C. to about 1000° C. for from about 30 minutes to about 120 minutes, effective to produce a substantially crack-free, and substantially void-free silica dielectric film having a density of from about 1.8 to about 2.3 g/ml, a dielectric constant of about 4.0 or less, a breakdown voltage of about 3 MV/cm or more.
    • 本发明涉及半导体器件制造,更具体地涉及在具有改进的电性能的集成电路中形成高密度浅沟槽隔离结构的方法和材料。 在基材(a)上形成二氧化硅电介质膜,制备包含含硅预聚物,不含金属离子的催化剂和任选的水的组合物; (b)用组合物涂覆基材以形成膜,(c)通过在氮气气氛中在约750℃至约850℃的温度下首先加热该组合物约30分钟来交联该组合物 至约120分钟; 然后在氧气氛中在约850℃至约1000℃的温度下加热组合物约30分钟至约120分钟,有效地产生基本上无裂纹且基本上无空隙的二氧化硅 绝缘膜的密度为约1.8至约2.3g / ml,介电常数为约4.0或更小,击穿电压为约3MV / cm以上。