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    • 5. 发明授权
    • Coating and developing apparatus, substrate processing method, and storage medium
    • 涂布显影装置,基板处理方法和存储介质
    • US07955011B2
    • 2011-06-07
    • US11733441
    • 2007-04-10
    • Nobuaki MatsuokaYasushi HayashidaShinichi Hayashi
    • Nobuaki MatsuokaYasushi HayashidaShinichi Hayashi
    • G03D5/04
    • H01L21/67745H01L21/67178
    • A coating and developing apparatus is provided which requires a smaller occupation space even when it incorporates a substrate inspection unit, while eliminating a disadvantageous layout. A coating film forming part B3 including a plurality of process units and transfer mechanisms A3 and A4, and a developing part B1 including a plurality of process units 31 and a transfer mechanism A1 are vertically arranged in a process block S2. There are disposed in the process block S2 on a side of a carrier block S1, a plurality of vertically arranged transfer units TRS for transferring a substrate W between the same and transfer mechanisms for the respective parts, and a vertically movable transfer mechanism D1 for the transfer unit for transferring a substrate between these transfer units. At least one of the coating film forming part and the developing part includes a substrate inspection unit 43 for inspecting a substrate transferred by the transfer mechanism for the corresponding part.
    • 提供了一种涂覆和显影装置,即使当其包含基板检查单元时也需要较小的占用空间,同时消除不利的布局。 包括多个处理单元和转印机构A3和A4的涂膜形成部分B3和包括多个处理单元31和转印机构A1的显影部分B1垂直地布置在处理块S2中。 在载体块S1的一侧设置有处理块S2,多个垂直设置的传送单元TRS,用于将基板W传送到相应部件的传送机构和用于各部件的传送机构之间, 转印单元,用于在这些转印单元之间转印衬底。 涂膜形成部和显影部中的至少一个包括用于检查由相应部分的转印机构转印的基板的基板检查单元43。
    • 8. 发明授权
    • Coating and developing apparatus, and coating and developing method
    • 涂层和显影装置,以及涂层和显影方法
    • US07661894B2
    • 2010-02-16
    • US11523015
    • 2006-09-19
    • Nobuaki MatsuokaMitsuhiro TanoueShinji Okada
    • Nobuaki MatsuokaMitsuhiro TanoueShinji Okada
    • G03D5/00G03B27/32B05C11/02B05C13/02
    • H01L21/67178H01L21/67184H01L21/67201H01L21/67745
    • A processing block S2 includes unit blocks, a BCT layer B3, COT layer B4 and TCT layer B5, for forming coating films, and further includes DEV layers B1, B2 layered with the unit blocks B3, B4, B5 and used as unit blocks for a developing process. Beside the unit blocks B1 to B5, a group G of transfer sections comprising transfer sections adapted to transfer each wafer W with each main arm A1 to A5 of the unit block B1 to B5 and hydrophobicity rendering units adapted to provide a hydrophobicity rendering process to the wafer W is provided. The wafer W is transferred by a transfer arm D between the transfer sections and the hydrophobicity rendering units. In this case, since it is not necessary to transfer the wafer W to the hydrophobicity rendering unit by using, for example, a main arm A4 of a COT layer B4, the load on the arm A4 can be reduced, thereby enhancing the carrying throughput.
    • 处理块S2包括用于形成涂膜的单元块,BCT层B3,COT层B4和TCT层B5,并且还包括与单元块B3,B4,B5分层的DEV层B1,B2,并用作单元块 一个发展过程。 除了单元块B1至B5之外,传送部分组G包括适于将单元块B1至B5的每个主臂A1至A5传送每个晶片W的转移部分和适用于向单元块B1至B5提供疏水性渲染处理的疏水性渲染单元 提供晶片W。 晶片W在转印部分和疏水性渲染单元之间由转印臂D转印。 在这种情况下,由于不需要使用例如COT层B4的主臂A4将晶片W转移到疏水性呈现单元,所以能够降低臂A4上的负荷,从而提高承载量 。