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1. 发明申请

US20060043287A1 Method of approaching probe and apparatus for realizing the same 有权
标题翻译：接近探头的方法及其实现方法
公开(公告)号：US20060043287A1
公开(公告)日：2006-03-02
申请号：US11208830
申请日：2005-08-22
申请人： Masanao Munekane
发明人： Masanao Munekane
IPC分类号： G01N23/00
CPC分类号： G01N23/04 , G01N1/32 , H01J2237/31749 , Y10S977/851 , Y10S977/881
摘要： A probe is moved to a direction where the tip of the probe and the tip of a shadow of the probe coincide at a target position on a display of the charged particle beam microscope while observing the distance between the tip of the probe and the target position during approaching the tip of the probe to the target position by use of a charged particle beam microscope with the probe tilted.
摘要翻译：将探针移动到探针的尖端和探针的阴影尖端的方向在观察到探针的尖端与目标位置之间的距离的同时在带电粒子束显微镜的显示器上的目标位置处重合通过使用探头倾斜的带电粒子束显微镜将探针的尖端接近目标位置。

2. 发明申请

US20050211922A1 Minute three dimensional structure producing apparatus and method 审中-公开
标题翻译：分钟三维结构制作装置及方法
公开(公告)号：US20050211922A1
公开(公告)日：2005-09-29
申请号：US11086492
申请日：2005-03-22
申请人： Masanao Munekane , Kouji Iwasaki
发明人： Masanao Munekane , Kouji Iwasaki
IPC分类号： B81C99/00 , A61N5/00 , B82B3/00 , G21G5/00 , H01J37/30 , H01J37/31 , H01J37/317
CPC分类号： H01J37/20 , B23K15/08 , B23P15/32 , B81C99/0095 , B81C2201/0143 , H01J37/3056 , H01J37/31 , H01J2237/20214 , H01J2237/206 , H01J2237/31732 , H01J2237/31735 , H01J2237/3174
摘要： A structure having arbitrary rotational symmetry is produced by attaching a sample stage (turntable) to a precision rotational shaft that is continuously rotated as high precision, performing FIB deposition inside an FIB chamber while causing continuous rotation of the sample stage, or performing cut-way processing from a side surface or upper surface, like a general purpose lathe, using FIB etching.
摘要翻译：具有任意旋转对称性的结构通过将样品台（转盘）附接到精度高的连续旋转的精密旋转轴上，在FIB室内进行FIB沉积，同时使样品台连续旋转，或进行切割使用FIB蚀刻从侧表面或上表面加工，如通用车床。

3. 发明授权

US07736893B2 Nanobio device of imitative anatomy structure 有权
标题翻译：模拟解剖结构的Nanobio装置
公开(公告)号：US07736893B2
公开(公告)日：2010-06-15
申请号：US11353603
申请日：2006-02-14
申请人： Masanao Munekane , Hiroyuki Wada , Kouji Iwasaki , Toshiaki Fujii , Takahiro Ochiya , Yusuke Yamamoto , Takumi Teratani
发明人： Masanao Munekane , Hiroyuki Wada , Kouji Iwasaki , Toshiaki Fujii , Takahiro Ochiya , Yusuke Yamamoto , Takumi Teratani
IPC分类号： C12N5/00
CPC分类号： G01N33/5088 , Y10T436/11
摘要： Objects to be achieved by the invention are to provide a nanobio device in which cultured cells are organized at a high-level in a state near in vivo, and to provide a method of using the nanobio device of imitative anatomy structure. The nanobio device of imitative anatomy structure of the invention is obtained by manufacturing a substrate with a bio-compatible substance and arranging a plurality of types of cells thereon in a desired array. A method of manufacturing a nanobio device in the invention includes a step of manufacturing a substrate for a nanobio device by a micromachine processing technique and a step of arranging a plurality of cultured cells on the substrate in a desired array with laser optical tweezers.
摘要翻译：通过本发明实现的目的是提供一种纳米生物装置，其中培养细胞在体内接近的状态下组织在高水平，并提供使用模拟解剖结构的纳米装置的方法。本发明的模拟解剖结构的纳米装置通过用生物相容性物质制造衬底并以期望的阵列布置多种类型的细胞而获得。在本发明中制造纳米装置的方法包括通过微机械加工技术制造纳米装置用基板的步骤，以及使用激光光学镊子以期望的阵列在基板上排列多个培养细胞的步骤。

4. 发明授权

US07356900B2 Manipulator needle portion repairing method 有权
标题翻译：机械手针部修复方法
公开(公告)号：US07356900B2
公开(公告)日：2008-04-15
申请号：US10973796
申请日：2004-10-26
申请人： Masanao Munekane
发明人： Masanao Munekane
IPC分类号： B23P6/00 , B23P25/00 , B23P13/00
CPC分类号： H01J37/3056 , Y10T29/49718 , Y10T29/4973 , Y10T29/49732 , Y10T29/49746 , Y10T29/49885 , Y10T29/49995
摘要： In a manipulator needle portion defect repairing method, the existence of an abrasion or a fracture in a needle portion for holding a sample at an end of a manipulator disposed in an FIB device is confirmed using a microscope function of the FIB device. The abrasion or the fracture in the needle portion is then repaired by chemical vapor deposition using a focused ion beam of the FIB device.
摘要翻译：在机械手针部缺陷修复方法中，使用FIB装置的显微镜功能来确认在设置在FIB装置中的机械手的端部处保持样品的针部的磨损或断裂的存在。然后通过使用FIB装置的聚焦离子束的化学气相沉积来修复针部分中的磨损或断裂。

5. 发明申请

US20070029266A1 Small thin piece holder using elastic material 审中-公开
标题翻译：使用弹性材料的小薄片夹
公开(公告)号：US20070029266A1
公开(公告)日：2007-02-08
申请号：US11488265
申请日：2006-07-18
申请人： Masanao Munekane
发明人： Masanao Munekane
IPC分类号： A47F7/00
CPC分类号： H01J37/20 , B81C99/002 , H01J2237/2007
摘要： To provide a small thin piece holder which can reduce damage due to contact with an adhesive and bend or damage generated in detachment, and can stably, detachably hold or carry only one part of a small thin piece, a sheet shaped member having elasticity is provided with a cut into which one part of a small thin piece can be detachably inserted and which can hold it.
摘要翻译：为了提供一种可以减少由于与粘合剂的接触而产生的损伤的小型薄片夹持器，并且能够分离地产生的弯曲或损坏，并且可以稳定地，可拆卸地保持或携带一小部分薄片，提供具有弹性的片状构件具有可以可拆卸地插入并且可以容纳它的小薄片的一部分的切口。

6. 发明申请

US20060010968A1 Probe and small sample pick up mechanism 有权
标题翻译：探头和小样品拾取机制
公开(公告)号：US20060010968A1
公开(公告)日：2006-01-19
申请号：US11182108
申请日：2005-07-15
申请人： Masanao Munekane , Kouji Iwasaki , Takashi Konno , Hiroki Hayashi
发明人： Masanao Munekane , Kouji Iwasaki , Takashi Konno , Hiroki Hayashi
IPC分类号： G01N19/02
CPC分类号： H01J37/20 , B25J7/00 , B25J15/12 , G01N1/32 , H01J2237/20264
摘要： A probe mechanism and a sample pick up mechanism of the invention are provided at an observing apparatus or an analyzing apparatus and characterized in including a tip member comprising a needle-like member brought into contact with a sample, including a driving electrostatic actuator and means for monitoring a change in an electrostatic capacitance between electrodes of the electrostatic actuator, and capable of sensing that the probe is brought into contact with a sample by the monitor
摘要翻译：本发明的探针机构和取样机构设置在观察装置或分析装置中，其特征在于，包括：尖端部件，包括与样品接触的针状部件，所述针状部件包括驱动静电致动器和用于监测静电致动器的电极之间的静电电容的变化，并且能够感测到探针通过监视器与样品接触

7. 发明授权

US07951303B2 Method of fabricating grabbing face of sample grabbing portion 有权
标题翻译：样品抓取部分抓取面的制作方法
公开(公告)号：US07951303B2
公开(公告)日：2011-05-31
申请号：US11960304
申请日：2007-12-19
申请人： Masanao Munekane
发明人： Masanao Munekane
IPC分类号： C23F1/00
CPC分类号： H01J37/3056 , H01J37/20 , H01J2237/2007 , H01J2237/204 , H01J2237/31745
摘要： By working a grabbing portion by a charged particle beam of FIB or the like, the grabbing portion in parallel with the beam can be formed, and also dust adhered to the grabbing portion is removed. When a small sample represented by a TEM sample is fabricated by being cut out by etching by a charged particle beam and is carried at inside of an apparatus of irradiating a charged particle beam, the sample is etched in a direction of irradiating the charged particle beam, and therefore, a mechanism pinched by a grabbing face of a grabbing portion can be worked in a direction the same as that in working the sample, and therefore, a change in an attitude can be reduced when the sample and the grabbing face are fabricated by parallel faces.
摘要翻译：通过利用FIB等的带电粒子束来抓取部分，可以形成与梁平行的抓取部分，并且除去附着在抓取部分上的灰尘。当由TEM样品表示的小样品通过用带电粒子束蚀刻而切割并在照射带电粒子束的装置的内部被携带时，沿着照射带电粒子束的方向来蚀刻样品因此，可以在与加工样品相同的方向上加工由抓取部分的抓握面夹持的机构，因此当制造样品和抓取面时可以降低姿态的变化通过平行面。

8. 发明授权

US07923267B2 Method of measuring length of measurement object article in micro-structure 失效
标题翻译：微观结构测量物品长度测量方法
公开(公告)号：US07923267B2
公开(公告)日：2011-04-12
申请号：US11346826
申请日：2006-02-03
申请人： Masanao Munekane , Junichi Tashiro
发明人： Masanao Munekane , Junichi Tashiro
IPC分类号： G01R31/26
CPC分类号： H01L22/12
摘要： A substrate comprises a substrate main body having a surface on which a measurement object article is to be formed. A reference scale is disposed on the surface of the substrate main body in the vicinity of a region of the surface where the measurement object article is to be formed. The reference scale has adjacent graduations spaced-apart a preselected distance from one another.
摘要翻译：基板包括具有要在其上形成测量对象物品的表面的基板主体。在要形成测量对象物品的表面的区域附近，在基板主体的表面上设置基准刻度。参考刻度具有彼此间隔开预定距离的相邻刻度。

9. 发明申请

US20080302961A1 SAMPLE RELOCATION METHOD IN CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM APPARATUS AS WELL AS SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE 有权
标题翻译：充电颗粒光束装置和充电颗粒光束装置的样品转移方法，如传输电子显微镜样品
公开(公告)号：US20080302961A1
公开(公告)日：2008-12-11
申请号：US12047022
申请日：2008-03-12
申请人： Junichi Tashiro , Masanao Munekane
发明人： Junichi Tashiro , Masanao Munekane
IPC分类号： G01N23/00 , G01N23/04
CPC分类号： H01J37/20 , H01J37/3056 , H01J2237/2007 , H01J2237/20278 , H01J2237/31735 , H01L21/68707
摘要： In a chamber of a charged particle beam apparatus, the sample on the sample substrate is gripped and carried to the sample holder, and there is controlled the attitude of the sample when the sample is fixed on the sample holder. There possesses a marking process applying, in the chamber, a marking to a surface of the sample Wb existing on the sample substrate by a beam, a carriage process gripping the sample by a sample gripping means and carrying it from the sample substrate to the sample holder, and an attitude control process controlling, when fixing the sample to the sample holder, the attitude of the sample while observing the marking applied to the surface of the sample.
摘要翻译：在带电粒子束装置的室中，将样品基板上的样品夹持并携带到样品架上，并且当将样品固定在样品架上时，控制样品的姿态。具有标记过程，在室中通过光束在样品基板上存在于样品Wb的表面上的标记，通过样品夹持装置夹持样品并将其从样品基底携带到样品的标记以及姿态控制处理，当将样品固定到样品保持器上时，控制样品的姿态，同时观察施加到样品表面的标记。

10. 发明申请

US20060188946A1 Nanobio device of imitative anatomy structure 有权
标题翻译：模拟解剖结构的Nanobio装置
公开(公告)号：US20060188946A1
公开(公告)日：2006-08-24
申请号：US11353603
申请日：2006-02-14
申请人： Masanao Munekane , Hiroyuki Wada , Kouji Iwasaki , Toshiaki Fujii , Takahiro Ochiya , Yusuke Yamamoto , Takumi Teratani
发明人： Masanao Munekane , Hiroyuki Wada , Kouji Iwasaki , Toshiaki Fujii , Takahiro Ochiya , Yusuke Yamamoto , Takumi Teratani
IPC分类号： G01N33/567 , G01N33/53
CPC分类号： G01N33/5088 , Y10T436/11
摘要： objects to be achieved by the invention are to provide a nanobio device in which cultured cells are organized at a high-level in a state near in vivo, and to provide a method of using the nanobio device of imitative anatomy structure. The nanobio device of imitative anatomy structure of the invention is obtained by manufacturing a substrate with a bio-compatible substance and arranging a plurality of types of cells thereon in a desired array. A method of manufacturing a nanobio device in the invention includes a step of manufacturing a substrate for a nanobio device by a micromachine processing technique and a step of arranging a plurality of cultured cells on the substrate in a desired array with laser optical tweezers.
摘要翻译：本发明要实现的目的是提供一种纳米生物装置，其中培养细胞在体内接近的状态下组织成高水平，并且提供使用模拟解剖结构的纳米装置的方法。本发明的模拟解剖结构的纳米装置通过用生物相容性物质制造衬底并以期望的阵列布置多种类型的细胞而获得。在本发明中制造纳米装置的方法包括通过微机械加工技术制造纳米装置用基板的步骤，以及使用激光光学镊子以期望的阵列在基板上排列多个培养细胞的步骤。

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