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    • 1. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US08964449B2
    • 2015-02-24
    • US13355781
    • 2012-01-23
    • Tae Sik YunKang Seol Lee
    • Tae Sik YunKang Seol Lee
    • G11C11/24G11C11/4076G11C11/4091G11C11/4099
    • G11C11/4076G11C11/4091G11C11/4099
    • A semiconductor memory device selects one of a plurality of memory cells as a dummy memory cell. The dummy memory cell is connected to a bit line that is complementary to a bit line connected to a selected memory cell. This technique advantageously compensates capacitance of the bit line. The semiconductor memory device comprises a selected memory cell connected to a first bit line and a first word line, a dummy memory cell connected to a second bit line complementary to the first bit line and a second word line, and a sense amplifier connected to the first and second bit lines and configured to read data stored in the selected memory cell by simultaneously enablement of the first and second word lines.
    • 半导体存储器件选择多个存储单元中的一个作为虚拟存储单元。 虚拟存储器单元连接到与连接到所选存储单元的位线互补的位线。 该技术有利地补偿位线的电容。 半导体存储器件包括连接到第一位线和第一字线的选定存储器单元,连接到与第一位线互补的第二位线和第二字线的虚拟存储器单元,以及连接到第一位线的读出放大器 第一和第二位线,并且被配置为通过同时启用第一和第二字线来读取存储在所选存储单元中的数据。
    • 2. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US08724409B2
    • 2014-05-13
    • US12947441
    • 2010-11-16
    • Kang Seol LeeJae Hyuk Im
    • Kang Seol LeeJae Hyuk Im
    • G11C7/00G11C29/00G05F3/16G05F3/20
    • H03K19/00384
    • A semiconductor integrated circuit includes an internal reference voltage generation unit configured to generate an internal reference voltage; a high voltage generation unit configured to pump an external driving voltage based on the internal reference voltage applied from the internal reference voltage generation unit, and generate a high voltage having a specified level; and a reference voltage transfer unit configured to generate a test reference voltage from a reference voltage in a package test mode to correspond to a change in a driving operation of the external driving voltage applied from outside, and monitor and force the internal reference voltage.
    • 半导体集成电路包括:内部参考电压生成单元,被配置为产生内部参考电压; 高电压产生单元,被配置为基于从内部参考电压产生单元施加的内部参考电压来泵浦外部驱动电压,并产生具有指定电平的高电压; 以及参考电压传送单元,被配置为在封装测试模式下从参考电压产生测试参考电压,以对应于从外部施加的外部驱动电压的驱动操作的变化,并监视和强制内部参考电压。
    • 4. 发明申请
    • INTERNAL VOLTAGE GENERATING CIRCUIT AND TESTING METHOD OF INTEGRATED CIRCUIT USING THE SAME
    • 内部电压产生电路及其集成电路的测试方法
    • US20120218019A1
    • 2012-08-30
    • US13117045
    • 2011-05-26
    • Kang-Seol LEESang-Mook Oh
    • Kang-Seol LEESang-Mook Oh
    • H03L5/00H02J1/00
    • G11C5/145G11C11/40G11C29/12005
    • An internal voltage generating circuit of a semiconductor device includes a normal reference voltage generating unit configured to generate a normal reference voltage having a constant voltage level without regard to PVT variations, a test reference voltage generating unit configured to generate a test reference voltage by dividing a voltage level between an external power supply voltage and the normal reference voltage at a set ratio, an operation reference voltage generating unit configured to generate an operation reference voltage by selecting one of the normal reference voltage and the test reference voltage in response to a test signal, and an internal voltage generating unit configured to generate an internal voltage whose voltage level is determined based on the level of the operation reference voltage.
    • 半导体器件的内部电压产生电路包括:正常参考电压生成单元,被配置为在不考虑PVT变化的情况下生成具有恒定电压电平的正常参考电压;测试参考电压产生单元,被配置为通过将 操作基准电压产生单元,被配置为通过响应于测试信号选择正常参考电压和测试参考电压中的一个来产生操作参考电压 以及内部电压产生单元,被配置为基于所述操作参考电压的电平来产生其电压电平被确定的内部电压。
    • 6. 发明授权
    • Internal voltage generating circuit
    • 内部电压发生电路
    • US07978003B2
    • 2011-07-12
    • US12630657
    • 2009-12-03
    • Kang-Seol LeeJae-Hyuk Im
    • Kang-Seol LeeJae-Hyuk Im
    • G05F1/10G05F3/02
    • G11C5/14
    • There is an internal voltage generating circuit for providing a stable high voltage by making a response time short. The internal voltage generating circuit includes a charge pump unit for generate a high voltage being higher than an external voltage in response to pumping control signals and a supply driving control signal; a pumping control signal generating unit for outputting the pumping control signals to the charge pump unit based on a driving signal; and a supply driving control unit for receiving the driving signal to generate the supply driving control signal to the charge pump unit.
    • 存在内部电压产生电路,用于通过使响应时间短而提供稳定的高电压。 内部电压产生电路包括电荷泵单元,用于响应于泵送控制信号和电源驱动控制信号而产生高于外部电压的高电压; 泵送控制信号产生单元,用于基于驱动信号将泵送控制信号输出到电荷泵单元; 以及电源驱动控制单元,用于接收驱动信号以向电荷泵单元产生电源驱动控制信号。
    • 7. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR DRIVING THE SAME
    • 半导体存储器件及其驱动方法
    • US20110158023A1
    • 2011-06-30
    • US12829987
    • 2010-07-02
    • Tae-Sik YunKang-Seol Lee
    • Tae-Sik YunKang-Seol Lee
    • G11C7/06
    • G11C11/4091G11C7/08G11C7/1048G11C11/4087G11C2207/005
    • A semiconductor memory device includes a cell block including a first bit line, a sense amplifier unit including a second bit line and configured to amplify a data signal applied to the second bit line, a connection unit configured to selectively connect the first bit line and the second bit line, a connection control unit configured to receive a control signal for driving the sense amplifier unit and a selection signal for selecting the cell block and generate a connection signal for activating the connection unit at a first time, and a sense amplifier driving control unit configured to receive the control signal and generate a sense amplifier driving signal for driving the sense amplifier unit at a second time after the first time.
    • 半导体存储器件包括:包括第一位线的单元块,包括第二位线的读出放大器单元,用于放大施加到第二位线的数据信号;连接单元,被配置为选择性地将第一位线和 第二位线,连接控制单元,被配置为接收用于驱动读出放大器单元的控制信号和用于选择单元块的选择信号,并且在第一时间产生用于激活连接单元的连接信号,以及读出放大器驱动控制 被配置为接收控制信号并且在第一次之后的第二时间产生用于驱动读出放大器单元的读出放大器驱动信号。