专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06556492B2 System for testing fast synchronous semiconductor circuits 失效
公开(公告)号：US06556492B2
公开(公告)日：2003-04-29
申请号：US09907695
申请日：2001-07-18
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
IPC分类号： G11C700
CPC分类号： G11C29/56
摘要： The system enables testing fast synchronous semiconductor circuits, particularly semiconductor memory chips. Various test signals such as test data, data strobe signals, control/address signals are combined to form signal groups and controllable transmit driver and receiver elements allocated to them are in each case jointly activated or, respectively, driven by timing reference signals generated by programmable DLL delay circuits. A clock signal generated in a clock generator in the BOST semiconductor circuit is picked up at a tap in the immediate vicinity of the semiconductor circuit chip to be tested and fed back to a DLL circuit in the BOST chip where it is used for eliminating delay effects in the lines leading to the DUT and back to the BOST.

2. 发明授权

US06721904B2 System for testing fast integrated digital circuits, in particular semiconductor memory modules 失效
标题翻译：用于测试快速集成数字电路的系统，特别是半导体存储器模块
公开(公告)号：US06721904B2
公开(公告)日：2004-04-13
申请号：US09907693
申请日：2001-07-18
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
IPC分类号： H02H305
CPC分类号： G11C29/12015 , G11C29/48 , G11C29/56012
摘要： The invention relates to a system for testing fast integrated digital circuits, in particular semiconductor modules, such as for example SDRAMs. In order to achieve the necessary chronological precision in the testing even of DDR-SDRAMs, with at the same time the high degree of parallelism of the test system required for mass production, an additional semiconductor circuit module (BOST module) is inserted into the signal path between a standard testing device and the SDRAM to be tested. This additional module is set up so as to multiply the relatively slow clock frequency of the conventional testing device, and to determine the signal sequence for control signals, addresses, and data background with which the SDRAM module is tested, dependent on signals of the testing device and also on register contents, programmed before the test, in the BOST module.
摘要翻译：本发明涉及一种用于测试快速集成数字电路，特别是半导体模块（例如SDRAM）的系统。为了在DDR-SDRAM的测试中实现必要的按时间顺序的精度，同时大规模生产所需的测试系统的高度并行性，将额外的半导体电路模块（BOST模块）插入到信号中标准测试设备和要测试的SDRAM之间的路径。该附加模块被设置为乘以常规测试设备的相对较慢的时钟频率，并且根据测试信号来确定用于测试SDRAM模块的控制信号，地址和数据背景的信号序列设备以及在测试前编程的寄存器内容，在BOST模块中。

3. 发明授权

US06396752B2 Method of testing a memory cell having a floating gate 有权
标题翻译：测试具有浮动栅极的存储单元的方法
公开(公告)号：US06396752B2
公开(公告)日：2002-05-28
申请号：US09771451
申请日：2001-01-26
申请人： Jens Lüpke , Peter Pöchmüller
发明人： Jens Lüpke , Peter Pöchmüller
IPC分类号： G11C700
CPC分类号： G11C29/50 , G11C16/04
摘要： The memory cells with floating gates are tested by applying voltage surges to the source or the drain of a selection transistor.
摘要翻译：具有浮动栅极的存储单元通过向选择晶体管的源极或漏极施加电压冲击来测试。

4. 发明授权

US07117403B2 Method and device for generating digital signal patterns 有权
公开(公告)号：US07117403B2
公开(公告)日：2006-10-03
申请号：US09907777
申请日：2001-07-18
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
IPC分类号： G11C29/00 , G06F11/00 , G01R31/28
CPC分类号： G11C29/10 , G01R31/3183
摘要： The method and the device generate digital signal patterns. Signal patterns or signal pattern groups are stored in a very small buffer register. The position of a following signal pattern or following signal pattern group is also stored in the form of a branch address, together with each signal pattern or each signal pattern group. A simple control logic circuit receives a control signal and determines whether the content of the currently addressed group is output continuously or the following group given by the branch address stored in the register is output after the currently selected group has been completely output. The novel method and device can advantageously be used for testing semiconductor memories and implemented in a cost-effective semiconductor circuit which is remote from a conventional test system.

5. 发明授权

US06839397B2 Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits 有权
标题翻译：用于产生用于测试高频同步数字电路的控制信号的电路配置
公开(公告)号：US06839397B2
公开(公告)日：2005-01-04
申请号：US09907784
申请日：2001-07-18
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
IPC分类号： G11C29/14 , G06M3/00
CPC分类号： G11C29/14
摘要： A circuit configuration for generating control signals for testing high-frequency synchronous digital circuits, especially memory chips, is described. A p-stage shift register which is clocked at a clock frequency corresponding to the high clock frequency of the digital circuit to be tested has connected to its parallel loading inputs p logical gates which logically combine a static control word with a dynamic n-position test word. The combined logical value is loaded into the shift register at a low-frequency loading clock rate so that a control signal, the value of which depends on the information loaded into the shift register in each clock cycle of the clock frequency of the latter is generated at the serial output of the shift register.
摘要翻译：描述用于产生用于测试高频同步数字电路，特别是存储器芯片的控制信号的电路配置。以对应于要测试的数字电路的高时钟频率的时钟频率计时的p级移位寄存器连接到其并行加载输入p逻辑门，逻辑门逻辑地将静态控制字与动态n位置测试字。组合的逻辑值以低频加载时钟速率被加载到移位寄存器中，使得其值取决于在后者的时钟频率的每个时钟周期中加载到移位寄存器中的信息的控制信号在移位寄存器的串行输出。

6. 发明授权

US06268718B1 Burn-in test device 有权
标题翻译：老化测试设备
公开(公告)号：US06268718B1
公开(公告)日：2001-07-31
申请号：US09401390
申请日：1999-09-22
申请人： Jens Lüpke , Frank Weber , Joseph Sillup
发明人： Jens Lüpke , Frank Weber , Joseph Sillup
IPC分类号： G01R3128
CPC分类号： G11C29/48 , G01R31/31905 , G11C29/56 , H01L2924/0002 , H01L2924/00
摘要： The burn-in test device has a multiplicity of test receptacles (101, 102, 103, 104 . . . ) in a test board for receiving semiconductor memories. The test board is wired alternately in such a way that burn-in pulses can be applied to the semiconductor modules in dependence on its organization, with the result that the burn-in pulses are applied in each case to the total number of input/output lines.
摘要翻译：老化测试装置在用于接收半导体存储器的测试板中具有多个测试插座（101,102,103,104 ...）。测试板交替地布线，使得可以根据其组织将老化脉冲施加到半导体模块，结果是在每种情况下将老化脉冲施加到输入/输出的总数线条。

7. 发明授权

US07117404B2 Test circuit for testing a synchronous memory circuit 有权
标题翻译：用于测试同步存储器电路的测试电路
公开(公告)号：US07117404B2
公开(公告)日：2006-10-03
申请号：US10106414
申请日：2002-03-26
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Peter Poechmüller , Jochen Mueller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Peter Poechmüller , Jochen Mueller , Michael Schittenhelm
IPC分类号： G11C29/00
CPC分类号： G11C29/48
摘要： Test circuit for testing a synchronous memory circuit having a frequency multiplication circuit which multiplies a clock frequency of a low-frequency clock signal received from an external test unit by a particular frequency multiplication factor a test data generator which produces test data on the basis of data control signals received from the external test unit and outputs them to a data output driver a first signal delay circuit for delaying the test data which are output by the test data generator by an adjustable first delay time, a second signal delay circuit for delaying data which are read out of the synchronous memory circuit and are received by a data input driver in the test circuit by an adjustable second delay time, and having a data comparison circuit which compares the test data produced by the test data generator with the data read out of the memory circuit and, on the basis of the comparison result, outputs an indicator signal to the external test unit which indicates whether the synchronous memory circuit to be tested is operable.
摘要翻译：用于测试具有倍频电路的同步存储电路的测试电路，该倍频电路将从外部测试单元接收的低频时钟信号的时钟频率乘以特定的倍频因子，该测试数据生成器基于数据产生测试数据从外部测试单元接收的控制信号并将它们输出到数据输出驱动器第一信号延迟电路，用于将由测试数据发生器输出的测试数据延迟可调节的第一延迟时间;第二信号延迟电路，用于延迟数据，从同步存储器电路中读出并由测试电路中的数据输入驱动器接收可调节的第二延迟时间，并具有数据比较电路，该数据比较电路将由测试数据发生器产生的测试数据与从存储器电路，并且基于比较结果，向指示的外部测试单元输出指示符信号 s被测试的同步存储器电路是否可操作。

8. 发明授权

US06871306B2 Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested 有权
标题翻译：用于读取和检查从要测试的存储器模块读出的数据响应信号的时间位置的方法和装置
公开(公告)号：US06871306B2
公开(公告)日：2005-03-22
申请号：US09907692
申请日：2001-07-18
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
IPC分类号： G11C29/50 , G11C29/56 , G11C29/00
CPC分类号： G11C29/50 , G11C29/56
摘要： A method and a device for reading and for checking the time position of a data response read out from a memory module to be tested, in particular a DRAM memory operating in DDR operation. In a test receiver, the data response from the memory module to be tested is latched into a data latch with a data strobe response signal that has been delayed. A symmetrical clock signal is generated as a calibration signal. The calibration signal is used to calibrate the time position of the delayed data strobe response signal with respect to the data response. The delayed data strobe response signal is used for latching the data response. The delay time is programmed into a delay device during the calibration operation and also supplies a measure for testing precise time relationships between the data strobe response signal (DQS) and the data response.
摘要翻译：一种用于读取和检查从要测试的存储器模块读出的数据响应的时间位置的方法和装置，特别是在DDR操作中操作的DRAM存储器。在测试接收机中，要测试的存储器模块的数据响应被锁存到具有被延迟的数据选通响应信号的数据锁存器中。产生对称时钟信号作为校准信号。校准信号用于校准相对于数据响应的延迟数据选通响应信号的时间位置。延迟的数据选通响应信号用于锁存数据响应。延迟时间在校准操作期间被编程到延迟器件中，并且还提供测量数据选通响应信号（DQS）和数据响应之间的精确时间关系。

9. 发明授权

US06515319B2 Field-effect-controlled transistor and method for fabricating the transistor 有权
公开(公告)号：US06515319B2
公开(公告)日：2003-02-04
申请号：US09861431
申请日：2001-05-18
申请人： Dietrich Widmann , Armin Wieder , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pochmüller , Michael Schittenhelm
发明人： Dietrich Widmann , Armin Wieder , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pochmüller , Michael Schittenhelm
IPC分类号： H01L31119
CPC分类号： H01L29/78 , B82Y10/00 , H01L29/66439 , H01L29/66568 , H01L29/66787
摘要： An active surface with a source area, a channel area and a drain area is provided in a semiconductor substrate. Each of the areas lie adjacent to a main surface of the semiconductor substrate. At least one trench is provided in the main surface of the semiconductor substrate. The trench is adjacent to the channel area and is situated in the gate electrode part. The gate electrode preferably has two opposite parts which are each adjacent to the channel area. The transistor is produced using standard process steps.

10. 发明授权

US07062690B2 System for testing fast synchronous digital circuits, particularly semiconductor memory chips 失效
公开(公告)号：US07062690B2
公开(公告)日：2006-06-13
申请号：US09907786
申请日：2001-07-18
申请人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
发明人： Wolfgang Ernst , Gunnar Krause , Justus Kuhn , Jens Lüpke , Jochen Müller , Peter Pöchmüller , Michael Schittenhelm
IPC分类号： G01R31/28
CPC分类号： G11C29/48 , G01R31/31905 , G11C29/56
摘要： A system and a method for testing fast synchronous digital circuit with an additional built outside self test semiconductor chip disposed between a test device and circuit under test. The chip has a switching/detection unit that tests the chip based on external criteria between a first normal operating mode in which the chip tests the circuit to be tested, and a second operating mode in which programmable registers of the register unit of a receiver of the chip are programmed by the external test device. The registers store constants and variables for generating the test signals and for evaluating them. The chip generates test signals and transceiver for sending the test signals and receiving response signals generated thereby.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式