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1. 发明授权

US10714888B2 Pulsed electromagnetic-wave generator and measuring apparatus 有权
公开(公告)号：US10714888B2
公开(公告)日：2020-07-14
申请号：US16292381
申请日：2019-03-05
申请人： Toshiyuki Ikeoh , Yasuhiro Higashi , Yoshio Wada , Takumi Satoh , Hiroaki Minamide , Kouji Nawata , Yuma Takida
发明人： Toshiyuki Ikeoh , Yasuhiro Higashi , Yoshio Wada , Takumi Satoh , Hiroaki Minamide , Kouji Nawata , Yuma Takida
IPC分类号： H01S3/16 , H01S3/11 , G02F1/355 , H01S3/00
摘要： A pulsed electromagnetic-wave generator includes an excitation light source, a laser resonator, a pulse generating unit, and a wavelength converting unit. Excitation light from the excitation light source enters the laser resonator. The pulse generating unit is configured to generate a pulsed light group including at least two or more pulses with different frequencies (ω) and different oscillation timings (t) in one excitation process of the excitation light source, an oscillation frequency difference (Δω) between the pulses in the pulsed light group being an integral multiple of a Free Spectral Range (FSR) of the laser resonator. The pulsed light group enters the wavelength converting unit. The wavelength converting unit is configured to generate a pulsed electromagnetic wave in which a wavelength of each pulse in the pulsed light group is converted.

2. 发明申请

US20110057109A1 MONOCHROMATIC WAVELENGTH VARIABLE TERAHERTZ WAVE GENERATION/DETECTION SYSTEM AND METHOD 有权
标题翻译：单色波长变化TERAHERTZ波形发生/检测系统和方法
公开(公告)号：US20110057109A1
公开(公告)日：2011-03-10
申请号：US12874912
申请日：2010-09-02
申请人： Ruixiang GUO , Hiroaki MINAMIDE , Hiromasa ITO
发明人： Ruixiang GUO , Hiroaki MINAMIDE , Hiromasa ITO
IPC分类号： G01J5/02 , G01J5/00
CPC分类号： G01J3/42 , G01J3/0208 , G01N21/3581 , G02F1/39 , G02F2203/13
摘要： To provide a monochromatic wavelength variable terahertz wave generation/detection system that has high detection sensitivity at room temperature and that can quickly operate at the same time, excitation light of monochromatic wavelength generated from one excitation light source is inputted to a wavelength variable terahertz wave source and a nonlinear light conversion terahertz wave detector through an excitation light phase control optical system shown below. The excitation light phase control optical system includes, on a light path of the excitation light, an optical element capable of simultaneously changing an incidence angle of the excitation light to a generation point of a terahertz wave in the wavelength variable terahertz wave source and an incidence angle of the excitation light to an incidence point of the terahertz wave in the nonlinear light conversion terahertz wave detector to set both the generation point and the incidence point at the same time on the focal points in a confocal optical system.
摘要翻译：为了提供在室温下具有高检测灵敏度并可以同时快速操作的单色波长可变太赫兹波生成/检测系统，从一个激发光源产生的单色波长的激发光被输入到波长可变的太赫兹波源以及通过如下所示的激发光相位控制光学系统的非线性光转换太赫兹波检测器。激发光相位控制光学系统在激发光的光路上包括能够同时将激发光的入射角改变为波长可变太赫兹波源中的太赫兹波的产生点的光学元件和入射在非线性光转换太赫兹波检测器中激发光的角度与太赫兹波的入射点同时在共焦光学系统的焦点上同时设置发生点和入射点。

3. 发明申请

US20090251767A1 METHOD AND APPARATUS FOR GENERATING TERAHERTZ WAVE 失效
标题翻译：用于产生TERAHERTZ波的方法和装置
公开(公告)号：US20090251767A1
公开(公告)日：2009-10-08
申请号：US11721278
申请日：2005-12-06
申请人： Tomofumi Ikari , Hiroaki Minamide , Hiromasa Ito
发明人： Tomofumi Ikari , Hiroaki Minamide , Hiromasa Ito
IPC分类号： G02F1/39
CPC分类号： G02F1/39 , G02F1/3534 , G02F2203/023 , G02F2203/13
摘要： A method and an apparatus for generating a terahertz wave, wherein one end face 12a of a non-linear optical crystal 12 is positioned approximately orthogonally to a direction of generation of a terahertz wave 4, pump light 2 and idler light 3 are totally reflected at an approximately same point 13 on the end face, and the generated terahertz wave 4 is emitted roughly vertically to the end face.
摘要翻译：一种用于产生太赫兹波的方法和装置，其中非线性光学晶体12的一个端面12a大致垂直于太赫兹波4的产生方向定位，泵浦光2和空载光3在在端面上大致相同的点13，并且所生成的太赫兹波4大致垂直于端面发射。

4. 发明申请

US20130108853A1 BNA CRYSTAL 有权
标题翻译： BNA水晶
公开(公告)号：US20130108853A1
公开(公告)日：2013-05-02
申请号：US13807187
申请日：2011-06-10
申请人： Mikiko Saito , Takashi Notake , Hiroaki Minamide , Hiromasa Ito
发明人： Mikiko Saito , Takashi Notake , Hiroaki Minamide , Hiromasa Ito
IPC分类号： C30B7/08 , G02F1/355
CPC分类号： C30B7/08 , C07B2200/13 , C07C211/52 , C30B7/00 , C30B7/005 , C30B29/54 , G02F1/3551
摘要： An object of the present invention is to produce a non-conventional high-quality BNA single crystal. Another object of the present invention is to provide a process for producing the above-described high-quality BNA single crystal. Specifically, the present invention provides a BNA crystal characterized by having a half-value width of diffraction peak X-ray intensity of 100 seconds or less in a rocking curve measurement by X-ray diffraction method.
摘要翻译：本发明的目的是生产非传统的高品质BNA单晶。本发明的另一个目的是提供一种制备上述高品质BNA单晶的方法。具体地，本发明提供一种特征在于通过X射线衍射法的摇摆曲线测定中的衍射峰X射线强度的半值宽度为100秒以下的BNA晶体。

5. 发明申请

US20110058155A1 MOBILITY MEASURING APPARATUS, METHOD THEREFOR, AND RESISTIVITY MEASURING APPARATUS AND METHOD THEREFOR 有权
标题翻译：移动性测量装置，其方法和电阻测量装置及其方法
公开(公告)号：US20110058155A1
公开(公告)日：2011-03-10
申请号：US12872385
申请日：2010-08-31
申请人： Seigo Ohno , Hiromasa Ito , Hiroaki Minamide , Akihide Hamano
发明人： Seigo Ohno , Hiromasa Ito , Hiroaki Minamide , Akihide Hamano
IPC分类号： G01J3/00 , G01R27/08
CPC分类号： H01L22/12 , G01N21/3563 , G01N21/3581 , H01L22/14 , H01L2924/014
摘要： A mobility measuring apparatus includes a storage unit that respectively stores a relationship between the mobility μ of carriers in a semiconductor and a decay constant γ of the carriers and a relationship between a reflectivity R of the semiconductor to a terahertz light and the decay constant γ of the carriers, a light radiating unit that radiates a terahertz light to the semiconductor as a sample, a detecting unit that detects a reflected light of the sample to the radiated terahertz light, a reflectivity calculating unit that calculates the reflectivity Rexp of the sample by determining a ratio of an intensity of the reflected light relative to an intensity of the radiated terahertz light, an obtaining unit that obtains the decay constant γexp of the sample corresponding to the reflectivity Rexp of the sample by making reference to the stored relationship between the reflectivity R and the decay constant γ of the carriers, and a mobility calculating unit that calculates the mobility μexp of the sample from the stored relationship between the mobility μ and the decay constant γ on the basis of the obtained decay constant γexp.
摘要翻译：移动性测量装置包括存储单元，其分别存储半导体中的载流子迁移率μ与载流子的衰减常数γ之间的关系以及半导体与太赫兹光的反射率R和衰变常数γ之间的关系所述载体，将作为样品向所述半导体照射太赫兹光的光照射单元，检测所述样品的反射光到所述辐射太赫兹光的检测单元，反射率计算单元，其通过确定所述样品的反射率Rexp来计算反射光的强度相对于照射的太赫兹光的强度的比率;获得单元，其通过参照所存储的反射率R的关系来获得与样品的反射率Rexp相对应的样品的衰变常数γexp 和载波的衰减常数γ，以及计算m的移动性计算单元根据获得的衰减常数γexp，从存储的迁移率μ与衰减常数γ之间的关系得到的样本的能力μexp。

6. 发明申请

US20190280454A1 PULSED ELECTROMAGNETIC-WAVE GENERATOR AND MEASURING APPARATUS 审中-公开
公开(公告)号：US20190280454A1
公开(公告)日：2019-09-12
申请号：US16292381
申请日：2019-03-05
申请人： Toshiyuki IKEOH , Yasuhiro Higashi , Yoshio Wada , Takumi Satoh , Hiroaki Minamide , Kouji Nawata , Yuma Takida
发明人： Toshiyuki IKEOH , Yasuhiro Higashi , Yoshio Wada , Takumi Satoh , Hiroaki Minamide , Kouji Nawata , Yuma Takida
IPC分类号： H01S3/11 , H01S3/16 , H01S3/00 , G02F1/355
摘要： A pulsed electromagnetic-wave generator includes an excitation light source, a laser resonator, a pulse generating unit, and a wavelength converting unit. Excitation light from the excitation light source enters the laser resonator. The pulse generating unit is configured to generate a pulsed light group including at least two or more pulses with different frequencies (ω) and different oscillation timings (t) in one excitation process of the excitation light source, an oscillation frequency difference (Δω) between the pulses in the pulsed light group being an integral multiple of a Free Spectral Range (FSR) of the laser resonator. The pulsed light group enters the wavelength converting unit. The wavelength converting unit is configured to generate a pulsed electromagnetic wave in which a wavelength of each pulse in the pulsed light group is converted.

7. 发明授权

US09034463B2 BNA crystal 有权
标题翻译： BNA晶体
公开(公告)号：US09034463B2
公开(公告)日：2015-05-19
申请号：US13807187
申请日：2011-06-10
申请人： Mikiko Saito , Takashi Notake , Hiroaki Minamide , Hiromasa Ito
发明人： Mikiko Saito , Takashi Notake , Hiroaki Minamide , Hiromasa Ito
IPC分类号： C30B29/54 , C07C205/06 , C30B7/08 , C30B7/00 , C07C211/52 , G02F1/355
CPC分类号： C30B7/08 , C07B2200/13 , C07C211/52 , C30B7/00 , C30B7/005 , C30B29/54 , G02F1/3551
摘要： An object of the present invention is to produce a non-conventional high-quality BNA single crystal. Another object of the present invention is to provide a process for producing the above-described high-quality BNA single crystal. Specifically, the present invention provides a BNA crystal characterized by having a half-value width of diffraction peak X-ray intensity of 100 seconds or less in a rocking curve measurement by X-ray diffraction method.
摘要翻译：本发明的目的是生产非传统的高品质BNA单晶。本发明的另一个目的是提供一种制备上述高品质BNA单晶的方法。具体地，本发明提供一种特征在于通过X射线衍射法的摇摆曲线测定中的衍射峰X射线强度的半值宽度为100秒以下的BNA晶体。

8. 发明授权

US07710637B2 Method and apparatus for generating terahertz wave 失效
标题翻译：用于产生太赫兹波的方法和装置
公开(公告)号：US07710637B2
公开(公告)日：2010-05-04
申请号：US11721278
申请日：2005-12-06
申请人： Tomofumi Ikari , Hiroaki Minamide , Hiromasa Ito
发明人： Tomofumi Ikari , Hiroaki Minamide , Hiromasa Ito
IPC分类号： G02F1/35 , G02F2/02
CPC分类号： G02F1/39 , G02F1/3534 , G02F2203/023 , G02F2203/13
摘要： A method and an apparatus for generating a terahertz wave, wherein one end face 12a of a non-linear optical crystal 12 is positioned approximately orthogonally to a direction of generation of a terahertz wave 4, pump light 2 and idler light 3 are totally reflected at an approximately same point 13 on the end face, and the generated terahertz wave 4 is emitted roughly vertically to the end face.
摘要翻译：一种用于产生太赫兹波的方法和装置，其中非线性光学晶体12的一个端面12a大致垂直于太赫兹波4的产生方向定位，泵浦光2和空载光3在在端面上大致相同的点13，并且所生成的太赫兹波4大致垂直于端面发射。

9. 发明申请

US20060268945A1 Tera-hertz wave transmitting optical component, tera-hertz wave optical system, tera-hertz band wave processing device and method 审中-公开
标题翻译：太赫兹波发射光学元件，赫赫兹波光学系统，赫赫兹波带波处理装置和方法
公开(公告)号：US20060268945A1
公开(公告)日：2006-11-30
申请号：US10553004
申请日：2004-04-09
申请人： Hiroaki Minamide , Hiromasa Ito , Akihito Kudo
发明人： Hiroaki Minamide , Hiromasa Ito , Akihito Kudo
IPC分类号： H01S3/30
CPC分类号： G01N21/3581 , G02B1/04 , C08L65/00
摘要： A tera-hertz band wave processing device includes a tera-hertz wave generator for generating a specified tera-hertz wave, and an optics optical plane composed of a high-function resin and provided ahead of the advancing direction of a generated tera-hertz wave. A translucent plate is formed as the optics optical plane. The optical axis between the plate and the generator is regulated by a first translucence regulator to transmit a tera-hertz wave on the optical axis and reflect a light beamed at a specified incident angle off the plate. Second translucence regulators are provided on the optical axis between the plate and on Si bolometer. A specified visible light is shone to the plate as a pilot light and is allowed to reflect off the plate to superimpose the optical axis of the reflected visible light on the optical axis of a tera-hertz wave.
摘要翻译：泰勒赫兹波处理装置包括用于产生特定赫兹波的泰赫波发生器，以及由高功能树脂组成的光学光学平面，并在所产生的赫赫兹波的前进方向之前提供。形成透光板作为光学光学平面。板和发生器之间的光轴由第一半透明调节器调节，以在光轴上传输紫外波，并将以指定入射角度射出的光反射出来。第二个半透明调节器设置在板和Si辐射热计之间的光轴上。指定的可见光作为指示灯照射到板上，并且被允许从板反射，以将反射的可见光的光轴叠加在紫外波的光轴上。

10. 发明授权

US08619243B2 Mobility measuring apparatus, method therefor, and resistivity measuring apparatus and method therefor 有权
标题翻译：移动性测量装置及其方法，以及电阻率测量装置及其方法
公开(公告)号：US08619243B2
公开(公告)日：2013-12-31
申请号：US12872385
申请日：2010-08-31
申请人： Seigo Ohno , Hiromasa Ito , Hiroaki Minamide , Akihide Hamano
发明人： Seigo Ohno , Hiromasa Ito , Hiroaki Minamide , Akihide Hamano
IPC分类号： G01J3/00 , H01L29/04 , H01L27/14 , H01L29/12
CPC分类号： H01L22/12 , G01N21/3563 , G01N21/3581 , H01L22/14 , H01L2924/014
摘要： A mobility measuring apparatus includes a storage unit that respectively stores a relationship between the mobility μ of carriers in a semiconductor and a decay constant γ of the carriers and a relationship between a reflectivity R of the semiconductor to a terahertz light and the decay constant γ of the carriers, a light radiating unit that radiates a terahertz light to the semiconductor as a sample, a detecting unit that detects a reflected light of the sample to the radiated terahertz light, a reflectivity calculating unit that calculates the reflectivity Rexp of the sample by determining a ratio of an intensity of the reflected light relative to an intensity of the radiated terahertz light, an obtaining unit that obtains the decay constant γexp of the sample corresponding to the reflectivity Rexp of the sample by making reference to the stored relationship between the reflectivity R and the decay constant γ of the carriers, and a mobility calculating unit that calculates the mobility μexp of the sample from the stored relationship between the mobility μ and the decay constant γ on the basis of the obtained decay constant γexp.
摘要翻译：移动性测量装置包括存储单元，其分别存储半导体中的载流子迁移率μ和载流子的衰变常数γ之间的关系，以及半导体与太赫兹光的反射率R和衰变常数γ之间的关系所述载体，将作为样品向所述半导体照射太赫兹光的光照射单元，检测所述样品的反射光到所述辐射太赫兹光的检测单元，反射率计算单元，其通过确定所述样品的反射率Rexp来计算反射光的强度相对于辐射太赫兹光的强度的比率;获得单元，其通过参考存储的反射率R之间的关系来获得与样品的反射率Rexp相对应的样品的衰减常数γexp 和载流子的衰减常数γ，以及迁移率计算单元根据获得的衰减常数γexp，从迁移率μ和衰变常数γ之间的存储关系中的样本的迁移率muexp。

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