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    • 4. 发明授权
    • Gapfill using deposition-etch sequence
    • Gapfill使用沉积蚀刻序列
    • US07329586B2
    • 2008-02-12
    • US11166357
    • 2005-06-24
    • Manoj VellaikalHemant P. MungekarYoung S. LeeYasutoshi OkunoHiroshi Yuasa
    • Manoj VellaikalHemant P. MungekarYoung S. LeeYasutoshi OkunoHiroshi Yuasa
    • H01L21/76
    • H01L21/31612C23C16/045H01L21/02164H01L21/02274
    • Methods deposit a film on a substrate disposed in a substrate processing chamber. The substrate has a gap formed between adjacent raised surfaces. Flows of first precursor deposition gases are provided to the substrate processing chamber. A first high-density plasma is formed from the flows of first deposition gases to deposit a first portion of the film over the substrate and within the gap with a first deposition process that has simultaneous deposition and sputtering components until after the gap has closed. A sufficient part of the first portion of the film is etched back to reopen the gap. Flows of second precursor deposition gases are provided to the substrate processing chamber. A second high-density plasma is formed from the flows of second precursor deposition gases to deposit a second portion of the film over the substrate and within the reopened gap with a second deposition process that has simultaneous deposition and sputtering components.
    • 方法在设置在基板处理室中的基板上沉积膜。 基板在相邻的凸起表面之间形成间隙。 将第一前体沉积气体的流动提供给基板处理室。 由第一沉积气体流形成第一高密度等离子体,以在第一沉积工艺和第二沉积工艺之后,在第一沉积工艺之后在膜上沉积薄膜的第一部分,直到间隙闭合为止。 将膜的第一部分的足够部分回蚀刻以重新打开间隙。 向基板处理室提供第二前体沉积气体的流动。 第二高密度等离子体由第二前体沉积气体的流形成,以便在具有同时沉积和溅射部件的第二沉积工艺的基础上沉积薄膜的第二部分并且在重新打开的间隙内。