会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Programmable transducer amplifier circuit
    • 可编程传感器放大器电路
    • US5534816A
    • 1996-07-09
    • US421956
    • 1995-04-14
    • Dennis M. KoglinMark B. Kearney
    • Dennis M. KoglinMark B. Kearney
    • G01D3/02G01D3/028H03F1/30H03K17/96H01L35/00H03K3/42
    • G01D3/02G01D3/028H03F1/302H03K17/9625
    • In accordance with the teachings of the present invention, a programmable integrated transducer amplifier circuit is provided which receives differential outputs from a transducer, such as a pressure or accelerometer transducer. The programmable integrated transducer amplifier circuit includes binary adjustable circuits that are programmed in response to binary coded signals. The binary adjustable circuits generate binary weighted currents that are employed to adjust the operating characteristics of the amplifier circuit. The binary coded signals are received from a programmable memory array which includes a plurality of memory cells that store binary information. Each of the memory cells are programmed when coupled to a programming signal. Additionally, the memory array has pretest capability for testing outputs of the memory cells prior to permanently programming the respective memory cells. Additionally, the integrated transducer amplifier circuit automatically compensates for variations in the operating temperature of the amplifier circuit. The method of temperature compensation is accomplished by operating the programmable integrated transducer amplifier circuit at a first temperature such that a temperature compensation voltage is "nulled" or is forced to equal zero. Thereafter, the integrated transducer amplifier circuit is operated at other temperatures such that the temperature compensation voltage is generated in a manner representing the difference between the first operating temperatures and the current operating temperature.
    • 根据本发明的教导,提供了可编程集成换能器放大器电路,其接收来自诸如压力传感器或加速度计换能器的换能器的差分输出。 可编程集成传感器放大器电路包括响应于二进制编码信号编程的二进制可调电路。 二进制可调电路产生二进制加权电流,用于调整放大器电路的工作特性。 从包括存储二进制信息的多个存储器单元的可编程存储器阵列接收二进制编码信号。 当耦合到编程信号时,每个存储器单元被编程。 此外,存储器阵列具有用于在对各个存储单元进行永久编程之前测试存储器单元的输出的预测试能力。 此外,集成的换能器放大器电路自动补偿放大器电路的工作温度变化。 温度补偿的方法是通过在第一温度下操作可编程的积分换能器放大器电路来实现的,使得温度补偿电压被“零”或被迫等于零。 此后,集成的换能器放大器电路在其它温度下工作,使得以表示第一工作温度和当前工作温度之间的差异的方式产生温度补偿电压。
    • 6. 发明授权
    • Stackable voltage comparator circuit for a multiple voltage window
detector
    • 用于多电压窗口检测器的可堆叠电压比较器电路
    • US5532627A
    • 1996-07-02
    • US422433
    • 1995-04-14
    • Mark B. KearneyDennis M. Koglin
    • Mark B. KearneyDennis M. Koglin
    • H03K5/24H03K5/153
    • H03K5/2418
    • A stackable voltage comparator circuit that may be used in an analog voltage address decoder circuit for performing voltage window comparisons. The voltage comparator circuit includes a plurality of voltage comparator circuit cells, each of which includes a differential input stage made up of a pair of transistors which receives a current source. A first comparator circuit cell includes a differential input pair of transistors with one of the transistors having a first collector and a second collector, with the second collector being coupled to an output line. The first comparator circuit cell compares an input window with a first threshold voltage and produces an output at the output line. A second comparator circuit cell compares the input voltage with a second threshold voltage and includes a second differential input pair of transistors. The second comparator circuit cell has an input coupled to the output line of the first comparator circuit for receiving current when the input voltage is less than the first threshold voltage and provides an output indicative of whether the input voltage is within a voltage window bounded by the first and second threshold voltages.
    • 可以在用于执行电压窗口比较的模拟电压地址解码器电路中使用的可堆叠电压比较器电路。 电压比较器电路包括多个电压比较器电路单元,每个电压单元包括由接收电流源的一对晶体管构成的差分输入级。 第一比较器电路单元包括差分输入对晶体管,其中一个晶体管具有第一集电极和第二集电极,其中第二集电极耦合到输出线。 第一比较器电路单元将输入窗口与第一阈值电压进行比较,并在输出线处产生输出。 第二比较器电路单元将输入电压与第二阈值电压进行比较,并且包括第二差分输入对晶体管。 第二比较器电路单元具有耦合到第一比较器电路的输出线的输入端,用于当输入电压小于第一阈值电压时接收电流,并提供指示输入电压是否在由 第一和第二阈值电压。
    • 7. 发明授权
    • Leak-testing technique for differential pressure sensor array
    • 差压传感器阵列泄漏检测技术
    • US07174773B2
    • 2007-02-13
    • US11109315
    • 2005-04-19
    • Hamid R. BorzabadiDennis M. Koglin
    • Hamid R. BorzabadiDennis M. Koglin
    • G01M3/26G01L19/14
    • G01M3/186
    • A leak-testing technique and apparatus for differential pressure sensor arrays is provided. A reference pressure sensor array is provided, wherein a seal is disposed between the reference pressure sensor array and a target differential pressure sensor array. A probe socket is utilized to communicate with each individual sensor in the reference pressure sensor array. The target pressure sensor array and the reference pressure sensor array are sealed via a pressure plate and plunger assembly. The target pressure sensor array, seal, and reference pressure sensor array are exposed to a first pressure. The target differential pressure sensor array, seal, and reference pressure sensor array are then exposed to a second pressure. The probe socket verifies that all reference pressure sensors continue to output the first pressure. If the probe socket identifies a reference pressure sensor that reads the second pressure, then the corresponding target pressure sensor is identified as being defective because of leakage.
    • 提供了用于差压传感器阵列的泄漏测试技术和设备。 提供了一种参考压力传感器阵列,其中密封件设置在参考压力传感器阵列和目标差压传感器阵列之间。 探头插座用于与参考压力传感器阵列中的每个单独的传感器通信。 目标压力传感器阵列和参考压力传感器阵列通过压力板和柱塞组件密封。 目标压力传感器阵列,密封件和参考压力传感器阵列暴露于第一压力。 然后将目标差压传感器阵列,密封件和参考压力传感器阵列暴露于第二压力。 探头插座验证所有参考压力传感器是否继续输出第一压力。 如果探头插座识别出读取第二压力的参考压力传感器,则相应的目标压力传感器由于泄漏而被识别为有缺陷的。