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1. 发明授权

US5581347A Optimization method and device for direct measurement of an optical component 失效
标题翻译：用于直接测量光学部件的优化方法和装置
公开(公告)号：US5581347A
公开(公告)日：1996-12-03
申请号：US308113
申请日：1994-09-16
申请人： Gilles Le Saux , Patrick Bertrand , Xavier Lippens , Christophe Lafay
发明人： Gilles Le Saux , Patrick Bertrand , Xavier Lippens , Christophe Lafay
IPC分类号： G01B11/24 , G01B11/255 , G01M11/00 , G01M11/02 , G01B9/00
CPC分类号： G01M11/025 , G01M11/0285
摘要： A method and device for measurement of the geometrical or optical structure of an optical component such as a lens or a mold for making lens are provided. The method comprises the steps of illuminating the optical component to be measured with incident light having a known wavefront, measuring, in a given plane, the maps of the wavefront slopes of the light, after reflection at or transmission by the optical component, and deducing the surface topography or refraction index map of the optical component to be measured from the measurements of the slope maps by the application of at least one calculating procedure.The calculating procedure comprises a step in which a result surface is initialized using a simple starting surface SD' and at least one optimization step; each optimization step involves calculation of the value of a merit function representative of the departure between the result surface and the surface to be measured of the optical component and, minimization of said value varying said result surface, said variation being expressed in the form of at least one intermediate surface S.sub.i.
摘要翻译：提供了用于测量诸如用于制造透镜的透镜或模具的光学部件的几何或光学结构的方法和装置。该方法包括以下步骤：用具有已知波前的入射光照射待测量的光学部件，在给定的平面中，在光学部件反射或透射之后测量光的波前斜率的映射，并推导出通过应用至少一个计算过程，从斜率图的测量中测量的光学部件的表面形貌或折射率图。计算过程包括使用简单起始面SD'和至少一个优化步骤对结果表面进行初始化的步骤; 每个优化步骤包括计算代表光学部件的结果表面和待测量表面之间的偏差的优值函数的值，并且使所述值的最小化改变所述结果表面，所述变化以表示为至少一个中间表面Si。

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