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    • 3. 发明授权
    • Docking station for a surface measuring apparatus
    • US11060966B2
    • 2021-07-13
    • US16626444
    • 2018-06-15
    • BYK-GARDNER GMBH
    • Peter Schwarz
    • G01N21/25G01B11/25G01N21/27G01N21/57
    • The invention relates to a docking station 2 for a surface measuring apparatus 1, more particularly an optical surface measuring apparatus. The docking station has a reference measuring surface 4 which can be brought into a covered state in which it is covered from the environment of the docking station 2 and an uncovered state in which it is not covered from the environment of the docking station 2. When the surface measuring apparatus 1 is in the docking station 2 and the reference measuring surface 4 is in the uncovered state, the surface measuring apparatus 1 can perform a reference measurement of the reference measuring surface 4 and can calibrate the surface measuring apparatus 1 using the reference measurement. In contrast, when the reference measuring surface 4 is in the covered state, it is not exposed to the environment of the docking station 2 and is therefore protected from, for example, dust, light, moisture or mechanical impacts. The covered and uncovered states of the reference measuring surface 4 are preferably reached through a movement of the reference measuring surface 4 itself or through a movement of a cover for the reference measuring surface 4.