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    • 5. 发明申请
    • METHODS FOR USING ISOTOPICALLY ENRICHED LEVELS OF DOPANT GAS COMPOSITIONS IN AN ION IMPLANTATION PROCESS
    • 在离子植入过程中使用同位素浓度多种气体组合物的方法
    • US20140322902A1
    • 2014-10-30
    • US13869456
    • 2013-04-24
    • Ashwini K. SinhaChing I. Li
    • Ashwini K. SinhaChing I. Li
    • H01L21/265H01J27/02
    • H01J27/02H01J37/302H01J37/3171H01J2237/006H01J2237/08H01L21/26506H01L21/2658
    • A novel process for using enriched and highly enriched dopant gases is provided herein that eliminates the problems currently encountered by end-users from being able to realize the process benefits associated with ion implanting such dopant gases. For a given flow rate within a prescribed range, operating at a reduced total power level of the ion source is designed to reduce the ionization efficiency of the enriched dopant gas compared to that of its corresponding non-enriched or lesser enriched dopant gas. The temperature of the source filament is also reduced, thereby mitigating the adverse effects of fluorine etching and ion source shorting when a fluorine-containing enriched dopant gas is utilized. The reduced levels of total power in combination with a lower ionization efficiency and lower ion source temperature can interact synergistically to improve and extend ion source life, while beneficially maintaining a beam current that does not unacceptably deviate from previously qualified levels.
    • 本文提供了一种使用富集和高度富集的掺杂气体的新方法,其消除了终端用户目前遇到的问题,即能够实现与离子注入这种掺杂气体相关的工艺优点。 对于规定范围内的给定流速,在离子源的总功率水平降低的情况下操作,以减少富集的掺杂气体与其相应的非富集或较小浓度的掺杂气体相比的离子化效率。 源极丝的温度也降低,从而在使用富含氟的掺杂气体时减轻氟蚀刻和离子源短路的不利影响。 总功率的降低水平与较低的离子化效率和较低的离子源温度相结合可以相互协调地相互作用,以改善和延长离子源寿命,同时有利地保持不能接受地偏离先前合格水平的束流。