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1. 发明授权

US07075741B1 System and method for automatically determining magnetic eccentricity of a disk 失效
标题翻译：自动确定磁盘的磁偏心率的系统和方法
公开(公告)号：US07075741B1
公开(公告)日：2006-07-11
申请号：US10867609
申请日：2004-06-14
申请人： Ronny Soetarman , Vamsi M. Velidandla , Jimmy Leung , Steven W. Meeks
发明人： Ronny Soetarman , Vamsi M. Velidandla , Jimmy Leung , Steven W. Meeks
IPC分类号： G11B5/02
CPC分类号： G11B5/59627
摘要： An embodiment of the present invention includes receiving a disk having a servo pattern and automatically identifying the center of the servo pattern. The present invention also automatically identifies the center of the physical disk and then automatically identifying the variance between the servo center and physical disk center.
摘要翻译：本发明的实施例包括接收具有伺服模式的盘并自动识别伺服模式的中心。本发明还自动识别物理磁盘的中心，然后自动识别伺服中心和物理磁盘中心之间的方差。

2. 发明授权

US07417722B2 System and method for controlling light scattered from a workpiece surface in a surface inspection system 失效
标题翻译：用于控制表面检查系统中从工件表面散射的光的系统和方法
公开(公告)号：US07417722B2
公开(公告)日：2008-08-26
申请号：US11311904
申请日：2005-12-17
申请人： Richard Earl Bills , James Peter McNiven
发明人： Richard Earl Bills , James Peter McNiven
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N21/21 , G01N21/47 , G01N21/4738 , G01N21/474 , G01N21/55 , G01N21/88 , G01N21/8806 , G01N21/95 , G01N21/956 , G01N2021/4707 , G01N2021/4711 , G01N2021/4792 , G01N2021/556 , G01N2021/8809 , G01N2021/8848 , G01N2021/8864 , G01N2021/8877 , G01N2021/8896 , G01N2201/0612 , G01N2201/105 , G06T7/0004 , G06T2207/30148 , Y10T29/49826
摘要： A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features masking positioned in the collection and detection subsystem arranged to selectively prevent a portion of scattered light from passing through. Also included is a scatter absorbing system having a series of scatter absorbing elements for minimizing unrelated to the scatter associated with a desired location on the surface.
摘要翻译：提供了表面检查系统，以及相关的部件和方法。表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。该系统具有位于收集和检测子系统中的掩蔽，该收集和检测子系统布置成选择性地防止一部分散射光通过。还包括具有一系列散射吸收元件的散射吸收系统，用于最小化与与表面上的期望位置相关联的散射无关。

3. 发明授权

US08068983B2 Virtual environment systems and methods 有权
标题翻译：虚拟环境系统和方法
公开(公告)号：US08068983B2
公开(公告)日：2011-11-29
申请号：US12137348
申请日：2008-06-11
申请人： John L. Vian , Emad W. Saad , Stefan R. Bieniawski , el-Hadi M. Aggoune
发明人： John L. Vian , Emad W. Saad , Stefan R. Bieniawski , el-Hadi M. Aggoune
IPC分类号： G01C21/30 , G05D3/00
CPC分类号： G09B9/003 , G06T15/00
摘要： Representing vehicles in a customizable virtual environment is disclosed. One embodiment includes a controlled environment including prototype vehicles and a virtual environment including virtual representations of the prototype vehicles. The virtual environment is a display that includes an environment scenario, a number of virtual objects, and the various represented vehicles. The represented vehicles are linked to the prototype vehicles by communicating kinematic data from the prototype vehicles to the virtual vehicles real-time. The positions of the represented vehicles are updated based on the communicated kinematic data such that the virtual environment is a realistic visualization of the prototype vehicles. In addition, the virtual environment is highly customizable. In an embodiment, customizing the virtual environment includes generating reference views for the represented vehicles, editing the environment scenario, editing the virtual objects, editing the represented vehicles, and generating a mission scenario of the reference views.
摘要翻译：公开了可定制的虚拟环境中的车辆。一个实施例包括受控环境，包括原型车辆和包括原型车辆的虚拟表示的虚拟环境。虚拟环境是包括环境场景，多个虚拟对象以及各种代表的车辆的显示器。通过将原型车辆的运动学数据实时地传送到虚拟车辆，代表的车辆与原型车辆相连。基于通信的运动学数据来更新所代表的车辆的位置，使得虚拟环境是原型车辆的真实可视化。此外，虚拟环境是高度可定制的。在一个实施例中，定制虚拟环境包括为所代表的车辆生成参考视图，编辑环境场景，编辑虚拟对象，编辑所表示的车辆以及生成参考视图的任务场景。

4. 发明授权

US07269754B2 Method and apparatus for flexible and programmable clock crossing control with dynamic compensation 有权
标题翻译：用于灵活可编程时钟交叉控制与动态补偿的方法和装置
公开(公告)号：US07269754B2
公开(公告)日：2007-09-11
申请号：US10335418
申请日：2002-12-30
申请人： Sridhar Ramaswamy , Amit Bodas , Zohar B. Bogin , David E. Freker , Suryaprasad R. Kareenahalli
发明人： Sridhar Ramaswamy , Amit Bodas , Zohar B. Bogin , David E. Freker , Suryaprasad R. Kareenahalli
IPC分类号： G06F1/02
CPC分类号： G06F5/06 , G11C7/22 , G11C7/222
摘要： A system and method for crossing clocks from a source clock to a destination clock is disclosed. In one embodiment, a source clock phase enable signal is used to enable a set of latch components to selectively input a source clock pulse. The outputs of the latch components may be selected by a multiplexor according to the phases of the destination clock. In another embodiment, a time delay may be passed into the destination clock domain and may be calculated by a number of destination clock cycle time periods. In certain circumstances, the time delay may be adjusted to compensate for longer delays in the clock crossing process.
摘要翻译：公开了一种从源时钟到目的地时钟的时钟交叉的系统和方法。在一个实施例中，源时钟相位使能信号用于使得一组锁存器组件能够选择性地输入源时钟脉冲。锁存器组件的输出可以由多路复用器根据目的时钟的相位来选择。在另一个实施例中，可以将时间延迟传递到目的时钟域，并且可以通过多个目的地时钟周期时间周期来计算。在某些情况下，可以调整时间延迟以补偿时钟跨越处理中的更长的延迟。

5. 发明授权

US08618719B2 Autonomous power generation unit for auxiliary system on an airborne platform 有权
标题翻译：机载平台辅助系统自主发电机组
公开(公告)号：US08618719B2
公开(公告)日：2013-12-31
申请号：US13536939
申请日：2012-06-28
申请人： Arvin Shmilovich , Michael A. Carralero
发明人： Arvin Shmilovich , Michael A. Carralero
IPC分类号： H01L41/08
CPC分类号： B64C21/04 , B64C21/08 , B64D41/00 , H02N2/185 , Y02T50/166 , Y02T50/53
摘要： A power generation device that provides power to an auxiliary system on an airborne platform, includes a piezoelectric energy harvesting device and an energy storage unit, including a battery and a power conditioner. The device extracts energy generated by turbulent airflow around the platform and stores the energy to meet future power requirements. The piezoelectric energy harvesting device is located on a portion of an inner surface of an outward shell of the platform. The stand-alone power generation device is electrically connected to the auxiliary system. The stand-alone power generation device also includes a router that connects the power generation unit to the platform electrical distribution system. Excess power generated by the device may be delivered to the platform electrical distribution system for use by other platform systems.
摘要翻译：向空中平台上的辅助系统提供电力的发电装置包括压电能量收集装置和包括电池和功率调节器的能量存储单元。该设备提取由平台周围的湍流气流产生的能量，并存储能量以满足未来的功率要求。压电能量收集装置位于平台的外壳的内表面的一部分上。独立发电装置电连接到辅助系统。独立发电装置还包括将发电单元连接到平台配电系统的路由器。由设备产生的过多功率可以被传送到平台配电系统以供其他平台系统使用。

6. 发明授权

US07274445B1 Confocal scatterometer and method for single-sided detection of particles and defects on a transparent wafer or disk 有权
标题翻译：用于单面检测透明晶片或磁盘上的颗粒和缺陷的共焦散射仪和方法
公开(公告)号：US07274445B1
公开(公告)日：2007-09-25
申请号：US11078462
申请日：2005-03-11
申请人： Steven W. Meeks
发明人： Steven W. Meeks
IPC分类号： G01N21/00 , G01B27/40
CPC分类号： G01N21/958 , G01N21/9501 , G01N2021/8967
摘要： A problem in the inspection of transparent wafers and disks is the detection of top surface particles. More precisely, it is being able to assign a scattering site as being due to a particle at the top or bottom surface of a transparent wafer. A method of the present invention is to use an elliptical mirror, with a pinhole at its top focus, together with a focused beam. The focused beam will diverge as it passes through the transparent wafer and as a result any particle on the bottom surface will see a lower optical intensity and will appear weaker than a top surface particle. The suppression of scattered light from the bottom surface occurs because the source of the scattered light (the bottom surface) is far from the bottom foci of the elliptical mirror. This means that the light from the bottom surface, which arrives inside the ellipsoid, will be out of focus at the top foci of the ellipsoid and as a result very little light from the bottom surface will pass through the pinhole at the top foci of the elliptical mirror. This reduction of light from the bottom surface can be further improved by making the pinhole diameter to be substantially less than the thickness of the transparent wafer.
摘要翻译：检查透明晶片和盘片的问题是检测顶表面颗粒。更准确地说，它能够将散射位置分配为由于在透明晶片的顶表面或底表面处的颗粒。本发明的一种方法是使用椭圆镜与其聚焦光束一起在其顶焦点处具有针孔。聚焦光束在透过透明晶片时会发散，因此底面上的任何颗粒将会看到较低的光学强度，并且会比顶表面颗粒显得更弱。由于散射光源（底面）远离椭圆镜的底部焦点，因此抑制来自底面的散射光。这意味着来自底面的光到达椭圆体的内部将会在椭圆顶部的焦点处失焦，因此来自底面的很少的光将穿过位于椭圆体的顶部焦点处的针孔椭圆镜。通过使针孔直径基本上小于透明晶片的厚度，可以进一步提高来自底面的光的这种减少。

7. 发明授权

US07110097B2 Combined high speed optical profilometer and ellipsometer 有权
公开(公告)号：US07110097B2
公开(公告)日：2006-09-19
申请号：US11268214
申请日：2005-11-07
申请人： Steven W. Meeks , Rusmin Kudinar
发明人： Steven W. Meeks , Rusmin Kudinar
IPC分类号： G01N21/00
CPC分类号： G01B11/0616 , G01N21/211 , G01N21/94 , G01N21/9501 , H01L22/12
摘要： A system and method for measuring defects, film thickness, contamination, particles and height of a thin film disk or a silicon wafer.

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