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1. 发明申请

US20210372928A1 MICROSCOPY METHOD AND SYSTEM 有权
公开(公告)号：US20210372928A1
公开(公告)日：2021-12-02
申请号：US17311182
申请日：2019-12-17
申请人： LUMICKS DSM HOLDING B.V.
发明人： Gerrit SITTERS , Mattijs DE GROOT
IPC分类号： G01N21/64 , G02B21/06 , G02B21/16 , G02B21/26 , G02B21/00
摘要： A method of excitation microscopy, in particular STimulated Emission Depletion (STED) microscopy,ins provided which comprises: providing a sample; trapping an object in the sample at a trapping position, in particular by applying a position dependent trapping force to the object; positioning, in particular focusing, a depletion beam at an interaction position in the sample for illumination of a portion of the sample associated with the trapped object. The method comprises at least one of controlling the depletion beam such that, at least when the depletion beam is positioned at the interaction position, an optical force exerted by the depletion beam on the object causes a displacement of the object less than the optical resolution, preferably less than half the optical resolution of an imaging system for observing a STED fluorescence; and controlling at least one of the depletion beam and the trapping force on the object such that, at least when the depletion beam is positioned at the interaction position, an optical force exerted by the depletion beam on the object is less than 5% of the trapping force, preferably less than 3%, more preferably less than 1%. An according system is also provided.

2. 发明授权

US11885809B2 Methods and devices for determining a guest structure on a host structure 有权
公开(公告)号：US11885809B2
公开(公告)日：2024-01-30
申请号：US17517381
申请日：2021-11-02
申请人： LUMICKS DSM HOLDING B.V.
发明人： Iddo Heller , Anna Elisabeth Christina Meijering , Gijs Jan Lodewijk Wuite , Erwin Johannes Gerard Peterman , Andreas Sebastian Biebricher
IPC分类号： G01N33/58 , G16B15/00 , G01N21/64 , G06V20/69
CPC分类号： G01N33/58 , G01N21/6402 , G01N21/6428 , G01N21/6458 , G06V20/693 , G16B15/00 , G01N2201/0633 , G01N2201/06113
摘要： A method for determining a presence of at least one guest structure at a host structure. The method comprises a light-sensitive system receiving light from the host structure. The host structure hosts one or more optically active entities at at least one part of the host structure. The at least one part does not host the at least one guest structure. Furthermore, the optically active entities cause light emission from the at least one part. The method also comprises the light-sensitive system outputting a signal based on the received light a step of determining a light value based on the output signal. The light value indicates an amount of light from the host structure incident on the light-sensitive system. The method also comprises determining on the basis of the light value at least one of a quantity and a position of the at least one guest structure.

3. 发明授权

US12013341B2 Microscopy method and system 有权
公开(公告)号：US12013341B2
公开(公告)日：2024-06-18
申请号：US17311182
申请日：2019-12-17
申请人： LUMICKS DSM HOLDING B.V.
发明人： Gerrit Sitters , Mattijs De Groot
IPC分类号： G01N21/64 , G02B21/00 , G02B21/06 , G02B21/16 , G02B21/26
CPC分类号： G01N21/6458 , G02B21/0076 , G02B21/008 , G02B21/06 , G02B21/16 , G02B21/26 , G02B21/0036
摘要： A method of excitation microscopy, in particular STimulated Emission Depletion (STED) microscopy, ins provided which comprises: providing a sample; trapping an object in the sample at a trapping position, in particular by applying a position dependent trapping force to the object; positioning, in particular focusing, a depletion beam at an interaction position in the sample for illumination of a portion of the sample associated with the trapped object. The method comprises at least one of controlling the depletion beam such that, at least when the depletion beam is positioned at the interaction position, an optical force exerted by the depletion beam on the object causes a displacement of the object less than the optical resolution, preferably less than half the optical resolution of an imaging system for observing a STED fluorescence; and controlling at least one of the depletion beam and the trapping force on the object such that, at least when the depletion beam is positioned at the interaction position, an optical force exerted by the depletion beam on the object is less than 5% of the trapping force, preferably less than 3%, more preferably less than 1%. An according system is also provided.

4. 发明授权

US11187656B2 Methods and devices for determining a guest structure on a host structure 有权
公开(公告)号：US11187656B2
公开(公告)日：2021-11-30
申请号：US16967111
申请日：2019-02-05
申请人： LUMICKS DSM HOLDING B.V.
发明人： Iddo Heller , Anna Elisabeth Christina Meijering , Gijs Jan Lodewijk Wuite , Erwin Johannes Gerard Peterman , Andreas Sebastian Biebricher
IPC分类号： C12Q1/68 , G01N15/06 , G01N33/00 , G01N21/00 , G01N21/64 , G01N21/66 , G01N35/00 , G16B15/00 , G06K9/00 , G06K9/32
摘要： One aspect of this disclosure relates to a method for determining a presence of at least one guest structure at a host structure. The method comprises a light-sensitive system receiving light from the host structure. The host structure hosts one or more optically active entities at at least one part of the host structure. Herein, the at least one part does not host the at least one guest structure. Furthermore, the optically active entities cause light emission from said at least one part. The method also comprises the light-sensitive system outputting a signal based on the received light. The method further comprises determining a light value based on the output signal. The light value indicates an amount of light from the host structure being incident on the light-sensitive system. The method also comprises determining on the basis of the light value at least one of a quantity and a position of the at least one guest structure at the host structure.

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