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    • 3. 发明授权
    • Method and apparatus for the examination of specimens
    • 检测标本的方法和装置
    • US07593158B2
    • 2009-09-22
    • US11330384
    • 2006-01-12
    • Stefan WilhelmEva SimbürgerMichael Kempe
    • Stefan WilhelmEva SimbürgerMichael Kempe
    • G02B21/06
    • G01N21/6458G02B21/0032G02B21/0076G02B21/008G02B21/16Y10S359/90
    • A method in which specimens are examined using a microscope. For an illuminated specimen, spatially coherent light with at least one continuous wavelength range or a continuously tunable wavelength range is generated, and one or more wavelengths or wavelength ranges in the illumination light are selected in dependence on the prespecified method of examination. The specimen is then illuminated with the illumination light with the selected wavelengths or wavelength ranges, the illumination light and the emission light coming from the specimen are then subsequently separated, whereby the back radiated illumination light is suppressed in the detection beam before the detection and the emission light is detected. In such a method, the selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the separation of the detection light and the illumination light and the suppression of the illumination light in such a manner that a prespecified control variable (R) is optimized.
    • 使用显微镜检查样品的方法。 对于照射的样本,产生具有至少一个连续波长范围或连续可调波长范围的空间相干光,并且根据预先指定的检查方法来选择照明光中的一个或多个波长或波长范围。 然后用所选择的波长或波长范围的照明光照射样本,随后分离照明光和来自样本的发射光,从而在检测之前在检测光束中抑制背面照射光,并且 检测出发光。 在这种方法中,通过检测光和照明光的分离以及照明光的抑制来调节照明光的波长或波长范围的选择,使得预先指定的控制变量( R)优化。
    • 4. 发明授权
    • Method and configuration for optically detecting an illuminated specimen
    • 用于光学检测被照射样品的方法和结构
    • US08280131B2
    • 2012-10-02
    • US12323123
    • 2008-11-25
    • Michael KempeRalf Wolleschensky
    • Michael KempeRalf Wolleschensky
    • G06K9/00G01J1/42G02B21/00
    • G02B21/0032G02B21/0048G02B21/0056
    • A configuration for the optical detection of a specimen, wherein the specimen or at least part of the specimen is scanned by means of linear illumination by scanning means, means for linear beam shaping of the illuminating light are provided, and the illuminating light has a preferably periodic structure in at least one spatial direction in that means for generating the structure are disposed in the illuminating beam path, light coming from the specimen is detected and images of the specimen are generated therefrom, at least one optical sectional image through the specimen and/or one image with increased resolution is/are calculated from the images, and means for generating the structure are disposed downstream of the scanning means in the direction of the illumination.
    • 提供了一种用于通过扫描装置通过线性照明扫描样本或样本的至少一部分的样本的光学检测的结构,用于照明光的线性光束成形的装置,并且照明光具有优选的 在所述照明光束路径中设置用于产生所述结构的装置中的至少一个空间方向上的周期性结构,并且检测来自所述样本的光并且从其产生所述样本的图像,通过所述样本的至少一个光学截面图像和/ 或者从图像计算一个具有增加的分辨率的图像,并且用于产生该结构的装置设置在扫描装置的照明方向的下游。