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    • 82. 发明授权
    • Contact set for test apparatus for testing integrated circuit package
    • 集成电路封装测试装置接触件
    • US4686468A
    • 1987-08-11
    • US679911
    • 1984-12-10
    • Kenneth R. LeeErnest L. Kallander, Jr.
    • Kenneth R. LeeErnest L. Kallander, Jr.
    • G01R31/26G01R1/04H05K7/02
    • G01R1/0433
    • A planar contact set for use in a test fixture for receiving an integrated circuit package for facilitating the electrical connection thereof to test equipment so that electrical and electronic tests can be performed on the integrated circuit. The contact set includes a flexible insulating support member having a central aperture which supports a plurality of conductive contact strips which extend over the aperture in cantilever fashion. The support member includes a support sheet underlying the contact strips and a retaining sheet overlying the contact strips, the sheets maintaining the strips in the proper position to contact the leads of the integrated circuit package when in a test registration position and also to enable electrical connections to be made to the test apparatus. In an exemplary test fixture, the contact member is supported between a lower support and an upper guide member, the guide member having a guide aperture over the central aperture of the contact member's support sheet to expose the contact strips. A ram holding an integrated circuit package lowers it through the guide aperture to an advanced test position with the leads extending from the integrated circuit package in electrical contact with the contact strips. At the end of a test, the ram retracts to remove the integrated circuit package. A mechanical ejector is provided to help force the package from the test position in the fixture if the ram is unable to remove it.
    • 一种用于测试夹具的平面接触组件,用于接收集成电路封装,以便于其与测试设备的电连接,从而可以在集成电路上进行电气和电子测试。 接触组件包括柔性绝缘支撑构件,其具有支撑以悬臂方式在孔上延伸的多个导电接触带的中心孔。 支撑构件包括位于接触片下方的支撑片和覆盖接触片的保持片,当处于测试对准位置时,该片将条保持在适当位置以接触集成电路封装的引线,并且还能够实现电连接 制成测试仪器。 在示例性测试夹具中,接触构件被支撑在下支撑件和上引导构件之间,引导构件在接触构件的支撑片材的中心孔上具有引导孔,以露出接触片。 保持集成电路封装的柱塞通过引导孔将其降低到高级测试位置,其中从集成电路封装延伸的引线与接触片电接触。 在测试结束时,柱塞缩回以移除集成电路封装。 如果压头不能将其移除,则提供机械顶出器以帮助将包装从夹具中的测试位置强制。
    • 83. 发明授权
    • Cam actuated DIP test socket
    • 凸轮启动DIP测试插座
    • US4407555A
    • 1983-10-04
    • US245303
    • 1981-03-19
    • Joseph L. Lockard
    • Joseph L. Lockard
    • G01R1/04H05K7/10H01R13/193
    • H05K7/1007G01R1/0433
    • A DIP test socket is disclosed to provide a zero entry force receptacle for dual in-line packages. The receptacle comprises a transport block receiving a DIP package thereon, with rows of contact legs positioned to depend adjacent the sides of the transport block. A housing block is disclosed, loaded with dual parallel rows of contact members having upwardly directed spring finger portions receiving the transport block therebetween. The housing block is further adapted with camming means for influencing engagement between the DIP package contact legs and the contact spring finger portions as the transport block is inserted toward the housing block.
    • 公开了DIP测试插座,以提供用于双列直插式封装的零入口插座。 容器包括在其上接收DIP封装的输送块,其中一排接触腿被定位成邻近输送块的侧面。 公开了一种外壳块,其装载有两个平行的接触构件行,其具有在其间接收传输块的向上指向的弹簧指部分。 当输送块朝向壳体块插入时,壳体块还适于具有用于影响DIP封装接触腿和接触弹簧指部分之间的接合的凸轮装置。
    • 84. 发明授权
    • Test contactor system for semiconductor device handling apparatus
    • 用于半导体器件处理装置的测试接触器系统
    • US4047780A
    • 1977-09-13
    • US674498
    • 1976-04-07
    • Nicholas J. Cedrone
    • Nicholas J. Cedrone
    • G01R31/26G01R1/04G01R1/073G06F11/22H05K1/14
    • G01R1/07314G01R1/0433G01R1/073G01R31/2893
    • A plurality of elongated bridging contacts each extending in a first direction are mounted on a pair of support blocks that are driven in a symmetrical, reciprocating motion between first and second limit positions. In the first position each contact makes electrical connection at one end with a lead of a semiconductor device to be tested and at the other end with a contact pin that is connected directly to a load board. The contacts are preferably pivotable to a limited degree about a point intermediate the contacting ends and flex slightly when in the first position to develop a good contact force. In the second position the contacts are spaced from the leads and the pins. Driving means for the support blocks, as well as the support blocks themselves, are structured to provide a minimum separation along the first direction between the load board and the device (preferably less than 25 millimeters) and an unrestricted mating plane for the load board. In a preferred form, the support blocks mount on a pair of opposed cross heads which in turn mount on a pair of slidable rods. The symmetrical, reciprocating motion is generated by spring means that urges the cross heads together and cam means, acting through a pivoted arm linked to both slide rods, that urge the cross heads apart.
    • 沿着第一方向延伸的多个细长桥接接头安装在一对支撑块上,所述一对支撑块在第一和第二极限位置之间以对称的往复运动驱动。 在第一位置,每个触点在一端与待测试的半导体器件的引线进行电连接,而在另一端处具有直接连接到负载板的接触引脚。 优选的是,接触点在接触端的中间点可以有限度地可枢转,并且在第一位置稍微弯曲以产生良好的接触力。 在第二位置,触点与引线和引脚间隔开。 用于支撑块的驱动装置以及支撑块本身被构造成沿着装载板和装置之间的第一方向(优选小于25毫米)和用于装载板的不受限制的配合平面提供最小间隔。 在优选的形式中,支撑块安装在一对相对的十字头上,后者又安装在一对可滑动的杆上。 通过弹簧装置产生对称的往复运动,弹簧装置将十字头推到一起,凸轮装置通过连接到两个滑动杆的枢转臂起作用,促使十字头分开。
    • 85. 发明授权
    • Measuring device for electrical components
    • 电气元件测量装置
    • US3801909A
    • 1974-04-02
    • US25457272
    • 1972-05-18
    • LICENTIA GMBH
    • HAMANN GZSCHIESCHANK G
    • G01R1/04G01R31/00G01R31/22
    • G01R1/0433
    • A measuring device for electrical components with strip or wire formed leads parallel to each other comprises a measuring mounting and a component receiver having a frame co-operating with the measuring mounting for centering purposes, a plurality of insulating members within the frame, arranged in laminar abutting formed and each having a surface for supporting a component lead, spring pivot means for urging the frame and insulating members to pivot in a direction perpendicular to the support surfaces of the insulating members and further pivot means for enabling pivoting movement of the frame and the insulating members in the plane of the support surfaces.
    • 用于具有彼此平行的带状或导线的电气部件的测量装置包括测量安装件和部件接收器,其具有与测量安装件配合的框架,用于定心目的,框架内的多个绝缘构件布置成层流 邻接形成并且每个具有用于支撑部件引线的表面,弹簧枢转装置,用于推动框架和绝缘构件沿垂直于绝缘构件的支撑表面的方向枢转,以及枢转装置,用于使框架和 绝缘构件在支撑表面的平面中。
    • 86. 发明授权
    • Connector
    • 连接器
    • US3676832A
    • 1972-07-11
    • US3676832D
    • 1970-12-28
    • IBM
    • JUDGE ROBERT LPEARSON EUGENE S
    • G01R1/04H01R12/88H01R13/193H01R13/62
    • H01R13/193G01R1/0433H01R12/88Y10T29/53183Y10T29/53257Y10T29/53283Y10T29/53978
    • A female connector for insertion into a printed circuit board and the like, the connector comprising an axially extending conductive tubular body portion having a loop-type receptacle at one terminal end of the body portion, the loop having a greater dimension than the diameter of a male connector-type pin so as to permit essentially zero axial force insertion of the pin into the receptacle. The receptacle includes a pair of resilient, radially projecting arms which converge from the receptacle and in conjunction with the receptacle define a converging path between the receptacle and the arms whereby relative lateral motion between the pin and female connector causes the pin to be engaged and retained by and between the pair of resilient arms. Also disclosed is apparatus for shifting one of or creating relative lateral movement between the pin and connector when the connectors are mounted respectively in a module element and a substrate element.
    • 用于插入印刷电路板等的阴连接器,所述连接器包括轴向延伸的导电管状主体部分,该主体部分在主体部分的一个端部处具有环形插座,该环具有比直径 公连接器型销,以便允许销的基本上零轴向力插入到容器中。 插座包括一对弹性的径向突出的臂,其从插座会聚并与插座一起限定在插座和臂之间的会聚路径,由此销和母连接器之间的相对横向运动导致销接合并保持 由一对弹性臂之间和之间。 还公开了当连接器分别安装在模块元件和基板元件中时,用于移动销和连接器之间的一个或产生相对横向移动的装置。