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81. 发明授权

US08742038B2 Resist composition for immersion exposure, method of forming resist pattern using the same, and fluorine-containing compound 有权
标题翻译：用于浸渍曝光的抗蚀剂组合物，使用其形成抗蚀剂图案的方法和含氟化合物
公开(公告)号：US08742038B2
公开(公告)日：2014-06-03
申请号：US12360415
申请日：2009-01-27
申请人： Daiju Shiono , Takahiro Dazai , Sanae Furuya , Tomoyuki Hirano , Takayoshi Mori
发明人： Daiju Shiono , Takahiro Dazai , Sanae Furuya , Tomoyuki Hirano , Takayoshi Mori
IPC分类号： C08G61/04 , C07C69/52
CPC分类号： G03F7/0046 , C07C69/653 , C07C69/67 , C07C69/712 , C07C69/757 , C07C2603/00 , C07C2603/84 , C07C2603/86 , C08F12/20 , C08F12/22 , C08F12/32 , C08F220/22 , C08F220/24 , C08F220/26 , C08F220/28 , C09D125/14 , C09D125/18 , G03F7/0048 , G03F7/0382 , G03F7/0397 , G03F7/2041 , C08F212/14 , C08F2220/1833 , C08F212/32 , C08F2220/185 , C08F2220/283 , C08F220/06
摘要： A resist composition for immersion exposure, including a base component (A) that exhibits changed solubility in an alkali developing solution under action of acid, an acid generator component (B) that generates acid upon exposure, and a fluorine-containing compound (C) represented by a general formula (c-1) shown below that is decomposable in an alkali developing solution: wherein R1 represents an organic group which may contain a polymerizable group, with the proviso that said polymerizable group has a carbon-carbon multiple bond, and the carbon atoms forming the multiple bond are not directly bonded to the carbon atom within the —C(═O)— group in general formula (c-1); and R2 represents an organic group having a fluorine atom.
摘要翻译：一种用于浸渍曝光的抗蚀剂组合物，包括在酸作用下在碱性显影液中显示出改变的溶解性的基础组分（A），暴露时产生酸的酸产生剂组分（B）和含氟化合物（C）由下述通式（c-1）表示，其可在碱性显影液中分解：其中R1表示可含有可聚合基团的有机基团，条件是所述可聚合基团具有碳 - 碳多重键，以及形成多重键的碳原子不直接键合在通式（c-1）中的-C（= O） - 基团中的碳原子上; R2表示具有氟原子的有机基团。

82. 发明授权

US08735045B2 Positive resist composition, method of forming resist pattern, and polymeric compound 有权
标题翻译：正型抗蚀剂组合物，形成抗蚀剂图案的方法和聚合物
公开(公告)号：US08735045B2
公开(公告)日：2014-05-27
申请号：US12911411
申请日：2010-10-25
申请人： Tomoyuki Hirano , Daiju Shiono , Daichi Takaki
发明人： Tomoyuki Hirano , Daiju Shiono , Daichi Takaki
IPC分类号： G03F7/00 , C08F228/02 , C08F226/02 , C08F220/10
CPC分类号： C08F20/18 , C08F128/02 , G03F7/0045 , G03F7/0397 , G03F7/2041
摘要： A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) including a polymeric compound (A1) containing a structural unit (a0) represented by general formula (a0-1) shown below and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group.
摘要翻译：一种正性抗蚀剂组合物，其包含在酸的作用下在碱性显影液中显示出增加的溶解度的碱成分（A）和暴露时产生酸的酸产生剂组分（B），所述碱成分（A）包含高分子化合物 A1），其含有由下述通式（a0-1）表示的结构单元（a0）和由含有酸解离的溶解抑制基团的丙烯酸酯衍生的结构单元（a1）。

83. 发明授权

US08658343B2 Resist composition, and method of forming resist pattern 有权
标题翻译：抗蚀剂组合物和形成抗蚀剂图案的方法
公开(公告)号：US08658343B2
公开(公告)日：2014-02-25
申请号：US13373965
申请日：2011-12-05
申请人： Masatoshi Arai , Junichi Tsuchiya , Daiju Shiono , Tomoyuki Hirano , Daichi Takaki
发明人： Masatoshi Arai , Junichi Tsuchiya , Daiju Shiono , Tomoyuki Hirano , Daichi Takaki
IPC分类号： G03F7/004 , G03F7/039
CPC分类号： G03F7/0045 , G03F7/0382 , G03F7/0397 , G03F7/2041
摘要： A resist composition including a base component (A) which exhibits changed solubility in a developing solution under the action of acid, and an acid generator component (B) which generates acid upon exposure, wherein the base component (A) contains a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In formula (a5-1), R represents a hydrogen atom, an alkyl group or a halogenated alkyl group, X represents single bond or divalent linking group, W represents a cyclic alkylene group which may include an oxygen atom at arbitrary position, each of Ra and Rb independently represents a hydrogen atom or an alkyl group which may include an oxygen atom at arbitrary position, or alternatively, Ra and Rb may be bonded to each other to form a ring together with the nitrogen atom in the formula, and p represents integer of 1 to 3.
摘要翻译：一种抗蚀剂组合物，其包含在酸的作用下在显影溶液中显示出改变的溶解性的碱成分（A）和曝光时产生酸的酸产生剂成分（B），其中，所述碱成分（A）含有高分子化合物 A1）具有由通式（a5-1）表示的结构单元（a5）。式（a5-1）中，R表示氢原子，烷基或卤代烷基，X表示单键或二价连接基，W表示可以在任意位置含有氧原子的环状亚烷基， Ra和Rb独立地表示氢原子或可以在任意位置包含氧原子的烷基，或者Ra和Rb可以与式中的氮原子一起形成环，p表示 1〜3的整数。

84. 发明申请

US20140004467A1 METHOD OF FORMING RESIST PATTERN AND NEGATIVE TONE-DEVELOPMENT RESIST COMPOSITION 有权
标题翻译：形成电阻图案和负极色调发展电阻组合物的方法
公开(公告)号：US20140004467A1
公开(公告)日：2014-01-02
申请号：US14003708
申请日：2012-03-07
申请人： Tomoyuki Hirano , Daichi Takaki , Daiju Shiono , Kenri Konno , Isamu Takagi
发明人： Tomoyuki Hirano , Daichi Takaki , Daiju Shiono , Kenri Konno , Isamu Takagi
IPC分类号： G03F7/32
CPC分类号： G03F7/325 , C08F220/24 , C08F220/28 , C08F220/38 , C08F224/00 , C08F226/02 , C08F228/06 , G03F7/0045 , G03F7/0046 , G03F7/0397 , G03F7/2041
摘要： A method of forming a resist pattern including: forming a resist film on a substrate using a resist composition containing a base component (A) which exhibits decreased solubility in an organic solvent by action of an acid; exposing the resist film; and patterning by a negative-tone development using a developing solution containing the organic solvent, wherein the base component (A) contains a resin component (A1) having a structural unit (a0) which generates acid upon exposure and a structural unit (a1) derived from an acrylate ester which may have the hydrogen atom bonded to the carbon atom on the α-position substituted with a substituent and contains an acid decomposable group which exhibits increased polarity by the action of acid, and the developing solution contains a nitrile solvent.
摘要翻译：一种形成抗蚀剂图案的方法，包括：使用含有通过酸作用在有机溶剂中溶解度降低的基础组分（A）的抗蚀剂组合物在基材上形成抗蚀剂膜; 曝光抗蚀膜; 以及使用含有有机溶剂的显影液进行负色发展的图案化，其中，所述基材（A）含有具有曝光时产生酸的结构单元（a0）的树脂成分（A1）和结构单元（a1）衍生自可以具有与被取代基取代的在α位上的碳原子键合的氢原子的丙烯酸酯，并且含有通过酸作用显示出极性增加的酸分解基团，显影液含有腈溶剂。

85. 发明申请

US20120329969A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN 有权
标题翻译：正电阻组合物和形成电阻图案的方法
公开(公告)号：US20120329969A1
公开(公告)日：2012-12-27
申请号：US13539558
申请日：2012-07-02
申请人： Tasuku MATSUMIYA , Daiju Shiono , Tomoyuki Hirano , Takahiro Dazai , Kotaro Endo
发明人： Tasuku MATSUMIYA , Daiju Shiono , Tomoyuki Hirano , Takahiro Dazai , Kotaro Endo
IPC分类号： C08F228/06
CPC分类号： G03F7/0397 , G03F7/0045 , G03F7/0046 , Y10S430/111
摘要： A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) including a polymeric compound (A1) containing a structural unit (a0) represented by general formula (a0-1), a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group, and a structural unit (a3) derived from an acrylate ester containing a hydroxy group-containing aliphatic hydrocarbon group represented by general formula (a3-1), and the amount of the structural unit (a3) based on the combined total of all structural units constituting the polymeric compound (A1) being in the range of 1 to 30 mol %.
摘要翻译：一种正性抗蚀剂组合物，其包含在酸的作用下在碱性显影液中显示出增加的溶解度的碱成分（A）和暴露时产生酸的酸产生剂组分（B），所述碱成分（A）包含高分子化合物 A1），由通式（a0-1）表示的结构单元（a0），由含有酸解离性，溶解抑制基团的丙烯酸酯衍生的结构单元（a1）和来自丙烯酸酯的结构单元（a3）含有由通式（a3-1）表示的含羟基的脂族烃基的酯和基于构成聚合化合物（A1）的所有结构单元的总和的结构单元（a3）的量在该范围内为1〜30摩尔％。

86. 发明授权

US08329378B2 Positive resist composition, method of forming resist pattern, and polymeric compound 有权
标题翻译：正型抗蚀剂组合物，形成抗蚀剂图案的方法和聚合物
公开(公告)号：US08329378B2
公开(公告)日：2012-12-11
申请号：US12721240
申请日：2010-03-10
申请人： Tomoyuki Hirano , Tasuku Matsumiya , Daiju Shiono , Takahiro Dazai
发明人： Tomoyuki Hirano , Tasuku Matsumiya , Daiju Shiono , Takahiro Dazai
IPC分类号： G03F7/004 , G03F7/30
CPC分类号： G03F7/2041 , C08F212/08 , C08F212/14 , C08F212/32 , C08F220/24 , C08F220/28 , C08F220/30 , C08F2220/1891 , C08F2220/382 , G03F7/0045 , G03F7/0046 , G03F7/0397
摘要： A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under the action of acid, and an acid-generator component (B) which generates acid upon exposure, the base component (A) including a polymeric compound (A1) containing a structural unit (a0) having an aromatic group, a structural unit (a5) represented by general formula (a5-1) shown below, and a structural unit (a1) containing an acid-dissociable, dissolution-inhibiting group. In the formula (a5-1), R1 represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, R2 represents a divalent linking group, and R3 represents a cyclic group containing —SO2— within the ring skeleton thereof.
摘要翻译：一种正极抗蚀剂组合物，其包含在酸性作用下在碱显影液中显示出增加的溶解度的碱成分（A）和暴露时产生酸的酸发生剂组分（B），所述碱成分（A）包含聚合物含有具有芳香族基团的结构单元（a0）的化合物（A1），下述通式（a5-1）所示的结构单元（a5）和含有酸解离性，溶解抑制性的结构单元（a1）组。式（a5-1）中，R 1表示氢原子，碳原子数1〜5的烷基或碳原子数1〜5的卤代烷基，R 2表示二价连接基，R 3表示含有 -SO2-在其环骨架内。

87. 发明授权

US08232041B2 Positive resist composition, method of forming resist pattern, and polymeric compound 有权
标题翻译：正型抗蚀剂组合物，形成抗蚀剂图案的方法和聚合物
公开(公告)号：US08232041B2
公开(公告)日：2012-07-31
申请号：US12694037
申请日：2010-01-26
申请人： Takahiro Dazai , Tomoyuki Hirano , Tasuku Matsumiya , Daiju Shiono
发明人： Takahiro Dazai , Tomoyuki Hirano , Tasuku Matsumiya , Daiju Shiono
IPC分类号： G03F7/039 , G03F7/20 , G03F7/30 , C08F28/06
CPC分类号： C08F220/10 , C08F28/06 , G03F7/0397 , Y10S430/111
摘要： A polymeric compound (A1) includes a structural unit (a0-1) represented by general formula (a0-1), a structural unit (a0-2) represented by general formula (a0-2), and a structural unit (a1-0-1) represented by general formula (a1-0-1), wherein relative to the combined total of all the structural units, the proportion of the structural unit (a0-1) is from 10 to 40 mol %, the proportion of the structural unit (a0-2) is from 5 to 20 mol %, and the proportion of the structural unit (a1-0-1) is from 10 to 55 mol %. [In the formulas, each of R1 and R independently represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms, or a halogenated alkyl group of 1 to 5 carbon atoms, R2, A and B each represents a divalent linking group, R3 represents a cyclic group containing —SO2— within the ring skeleton thereof, and R4 and X1 each represents an acid-dissociable, dissolution-inhibiting group.]
摘要翻译：高分子化合物（A1）包括由通式（a0-1）表示的结构单元（a0-1），由通式（a0-2）表示的结构单元（a0-2）和结构单元（a1- 0-1），其中相对于所有结构单元的组合总和，结构单元（a0-1）的比例为10〜40摩尔％，比例为结构单元（a0-2）为5〜20摩尔％，结构单元（a1-0-1）的比例为10〜55摩尔％。 [式中，R 1，R 2各自独立地表示氢原子，1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基，R2，A，B各自表示二价连接基团， R3表示在其环骨架中含有-SO2-的环状基团，R4和X1各自表示酸解离的溶解抑制基团。

88. 发明授权

US08221956B2 Resist composition for immersion exposure, method of forming resist pattern, and flourine-containing polymeric compound 有权
标题翻译：用于浸渍曝光的抗蚀剂组合物，形成抗蚀剂图案的方法和含有氟化物的聚合物
公开(公告)号：US08221956B2
公开(公告)日：2012-07-17
申请号：US12457705
申请日：2009-06-18
申请人： Daiju Shiono , Tomoyuki Hirano , Sanae Furuya , Takahiro Dazai , Hiroaki Shimizu , Tsuyoshi Kurosawa , Hideto Nito , Tsuyoshi Nakamura
发明人： Daiju Shiono , Tomoyuki Hirano , Sanae Furuya , Takahiro Dazai , Hiroaki Shimizu , Tsuyoshi Kurosawa , Hideto Nito , Tsuyoshi Nakamura
IPC分类号： G03F7/039 , G03F7/20 , G03F7/30 , C08F14/18
CPC分类号： C08F214/18 , C08F220/18 , C08F220/24 , C08F220/28 , G03F7/0046 , G03F7/0392 , G03F7/0397 , G03F7/2041 , Y10S430/108 , Y10S430/111
摘要： A resist composition for immersion exposure including: a fluorine-containing polymeric compound (F) containing a structural unit (f1) having a base dissociable group and a structural unit (f2) represented by general formula (f2-1) (wherein R represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group; and W is a group represented by any one of general formulas (w-1) to (w-4)); a base component (A) that exhibits changed solubility in an alkali developing solution under the action of acid; and an acid generator component (B) that generates acid upon exposure.
摘要翻译：一种浸渍曝光用抗蚀剂组合物，包括：含有具有碱解离基团的结构单元（f1）和由通式（f2-1）表示的结构单元（f2）的含氟聚合物（F）（其中R表示氢原子，低级烷基或卤代低级烷基; W为通式（w-1）〜（w-4）中任一个表示的基团）; 在酸性作用下在碱性显影液中表现出改变的溶解性的碱成分（A）和在曝光时产生酸的酸发生剂组分（B）。

89. 发明申请

US20120077125A1 RESIST COMPOSITION FOR IMMERSION EXPOSURE, METHOD OF FORMING RESIST PATTERN USING THE SAME, AND FLUORINE-CONTAINING COMPOUND 有权
标题翻译：用于浸渍曝光的耐腐蚀组合物，使用其的形成耐蚀图案的方法和含氟化合物
公开(公告)号：US20120077125A1
公开(公告)日：2012-03-29
申请号：US13310625
申请日：2011-12-02
申请人： Daiju Shiono , Takahiro Dazai , Sanae Furuya , Tomoyuki Hirano , Takayoshi Mori
发明人： Daiju Shiono , Takahiro Dazai , Sanae Furuya , Tomoyuki Hirano , Takayoshi Mori
IPC分类号： G03F7/20 , G03F7/004 , G03F7/027
CPC分类号： G03F7/0046 , C07C69/653 , C07C69/67 , C07C69/712 , C07C69/757 , C07C2603/00 , C07C2603/84 , C07C2603/86 , C08F12/20 , C08F12/22 , C08F12/32 , C08F220/22 , C08F220/24 , C08F220/26 , C08F220/28 , C09D125/14 , C09D125/18 , G03F7/0048 , G03F7/0382 , G03F7/0397 , G03F7/2041 , C08F212/14 , C08F2220/1833 , C08F212/32 , C08F2220/185 , C08F2220/283 , C08F220/06
摘要： A resist composition for immersion exposure, including a base component that exhibits changed solubility in an alkali developing solution under action of acid, an acid generator component that generates acid upon exposure, and a fluorine-containing compound represented by a general formula (c-1) that is decomposable in an alkali developing solution: wherein R1 represents an organic group which may contain a polymerizable group, with the proviso that said polymerizable group has a carbon-carbon multiple bond, and the carbon atoms forming the multiple bond are not directly bonded to the carbon atom within the —C(═O)— group in general formula (c-1); and R2 represents an organic group having a fluorine atom.
摘要翻译：一种用于浸渍曝光的抗蚀剂组合物，包括在酸作用下在碱性显影液中表现出改变的溶解度的基础组分，暴露时产生酸的酸产生剂组分和由通式（c-1）表示的含氟化合物），其可以在碱性显影液中分解：其中R1表示可以含有可聚合基团的有机基团，条件是所述可聚合基团具有碳 - 碳多重键，并且形成多重键的碳原子不直接键合通式（c-1）中的-C（= O） - 基团中的碳原子; R2表示具有氟原子的有机基团。

90. 发明授权

US08088553B2 Positive resist composition, method of forming resist pattern, and polymeric compound 有权
标题翻译：正型抗蚀剂组合物，形成抗蚀剂图案的方法和聚合物
公开(公告)号：US08088553B2
公开(公告)日：2012-01-03
申请号：US12425706
申请日：2009-04-17
申请人： Hiroaki Shimizu , Tsuyoshi Nakamura , Takayoshi Mori , Sanae Furuya , Daiju Shiono , Tomoyuki Hirano , Takahiro Dazai
发明人： Hiroaki Shimizu , Tsuyoshi Nakamura , Takayoshi Mori , Sanae Furuya , Daiju Shiono , Tomoyuki Hirano , Takahiro Dazai
IPC分类号： G03F7/039 , G03F7/20 , G03F7/30 , C08F220/28
CPC分类号： G03F7/0397 , C08F220/18 , C08F220/28 , G03F7/0045 , G03F7/0046 , G03F7/2041 , Y10S430/111
摘要： A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) including a polymeric compound (A1) having a structural unit (a0-1) represented by general formula (a0-1) (wherein R1 represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group; R8 represents a divalent linking group; and R7 represents an acid dissociable, dissolution inhibiting group) and a structural unit (a0-2) represented by general formula (a0-2) (wherein R3 represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group; R4 represents a branched alkyl group of 3 or more carbon atoms; and each of R5 and R6 independently represents an alkyl group, wherein R5 and R6 are mutually bonded to form a ring).
摘要翻译：一种正性抗蚀剂组合物，其包含在酸的作用下在碱性显影液中显示出增加的溶解度的碱成分（A）和暴露时产生酸的酸产生剂组分（B），所述碱成分（A）包含高分子化合物 A1）具有由通式（a0-1）表示的结构单元（a0-1）（其中R1表示氢原子，低级烷基或卤代低级烷基; R8表示二价连接基团，R7表示酸解离，溶解抑制基）和由通式（a0-2）表示的结构单元（a0-2）（其中R3表示氢原子，低级烷基或卤代低级烷基; R4表示支链烷基 3个以上的碳原子，R5和R6各自独立地表示烷基，其中R5和R6相互键合形成环）。

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