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    • 81. 发明申请
    • Testing device and testing method
    • 检测装置及检测方法
    • US20050209801A1
    • 2005-09-22
    • US11131151
    • 2005-05-17
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G01R31/26G01R19/00G01R31/319
    • G01R31/31924
    • A testing device that tests an electronic device includes a detection-voltage outputting unit operable to output a current detection voltage based on a power source current that the electronic device receives from a power source, a transmission line operable to transmit the current detection voltage, a detection amplifier operable to output an amplifier output voltage based on the current detection voltage received through the transmission line, a switching unit operable to select whether the current detection voltage is supplied to the detection amplifier, an integrator operable to output an integral value that is obtained by integrating values based on the amplifier output voltage, and a decision unit operable to decide whether the electronic device is good or bad based on the integral value.
    • 测试电子装置的测试装置包括:检测电压输出单元,用于基于电子设备从电源接收的电源电流输出电流检测电压;可传输电流检测电压的传输线; 检测放大器,用于基于通过传输线接收的电流检测电压输出放大器输出电压;切换单元,用于选择是否将电流检测电压提供给检测放大器;积分器,其可操作以输出获得的积分值 通过基于放大器输出电压积分值,以及判定单元,其可操作以基于积分值来确定电子设备是好还是坏。
    • 83. 发明授权
    • Current measuring method and current measuring apparatus
    • 电流测量方法和电流测量装置
    • US06492831B2
    • 2002-12-10
    • US09905026
    • 2001-07-13
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G01R3126
    • G01R19/0092G01R31/3004
    • A current measuring method, which measures a device current flowing through a terminal of a semiconductor device including charging the capacitor which is connected between the terminal and an earth potential of the semiconductor device, up to a predetermined voltage; setting the semiconductor device to be in active sate by applying a test pattern to the semiconductor device; measuring a potential of the capacitor at the terminal side after a predetermined test time has elapsed; and judging whether the device current is within a predetermined allowable range, based on the test time, capacitance of the capacitor, and the potential.
    • 一种电流测量方法,其测量流过半导体器件的端子的器件电流,包括将连接在所述半导体器件的端子和地电位之间的电容器充电至预定电压; 通过向半导体器件施加测试图案将半导体器件设置为有源状态; 在预定的测试时间过去之后测量端子侧电容器的电位; 并且基于测试时间,电容器的电容和电位来判断器件电流是否在预定的允许范围内。
    • 84. 发明授权
    • Power supply unit, semiconductor device testing apparatus and semiconductor device testing method
    • 电源单元,半导体器件测试仪器和半导体器件测试方法
    • US06391667B1
    • 2002-05-21
    • US09541916
    • 2000-04-03
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • H01L2166
    • H02M3/07G01R31/316
    • A power supply unit which supplies voltage to electric components, includes: a DC power supply (40) which supplies DC voltage to the electric components; at least one capacitor (C1), provided between the DC power supply (40) and the electric components, which charges the DC voltage; an input switch (SW1a) which connects or disconnects the capacitor (C1) and the DC power supply (40); and an output switch (SW1b) which connects or disconnects the capacitor (C1) and the electric components (semiconductor device under test); and a switching control unit (60) which charges the capacitor (C1) and supplies the DC voltage charged in the capacitor (C1) to the electric components. Thereby, the DC voltage to be supplied to the electric components or semiconductor device under test can be temporarily switched to low-noise DC voltage supplied from the charged-up capacitor (C1) during the test.
    • 向电气部件供给电压的电源单元包括:向电气部件供给直流电压的直流电源(40) 至少一个电容器(C1),设置在DC电源(40)和电气部件之间,对DC电压充电; 连接或断开电容器(C1)和直流电源(40)的输入开关(SW1a); 以及连接或断开电容器(C1)和电气部件(被测半导体器件)的输出开关(SW1b)。 以及对电容器(C1)充电并将充电在电容器(C1)中的直流电压提供给电气部件的开关控制单元(60)。 因此,供给到被测电气部件或半导体装置的直流电压可以暂时切换为在测试期间从充电电容器(C1)供给的低噪声直流电压。
    • 85. 发明授权
    • IC testing apparatus and testing method using same
    • IC测试仪器及使用方法的测试方法
    • US06313657B1
    • 2001-11-06
    • US09467722
    • 1999-12-20
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G01R3102
    • G01R31/319
    • In an IC testing apparatus, a sense line which is used for purpose of voltage measurement and a force line which is used for purpose of current supply are connected to a terminal of an IC under test through a first switch and a second switch, respectively, and a functional tester is connected to the terminal of the IC under test through a third switch. The first to the third switch are formed by semiconductor switches, and a fourth switch formed by a semiconductor switch having a reduced on resistance is connected across terminals of the first switch and the second switch which are located opposite from their terminals connected to the terminal of the IC under test. During an overload test in the DC test, the fourth switch is turned on to execute the test.
    • 在IC测试装置中,用于电压测量的感测线和用于电流供给的强制线分别通过第一开关和第二开关连接到被测IC的端子, 并且功能测试器通过第三开关连接到被测IC的终端。 第一至第三开关由半导体开关形成,并且由具有导通电阻降低的半导体开关形成的第四开关连接在第一开关和第二开关的端子之间,该第一开关和第二开关的端子与连接到 IC被测试。 在直流测试过载测试期间,第四个开关打开以执行测试。
    • 86. 发明授权
    • Applied-voltage-based current measuring method and device
    • 基于应用电压的电流测量方法和装置
    • US06255842B1
    • 2001-07-03
    • US09341893
    • 1999-07-20
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G01R3126
    • G01R31/2851G01R15/09G01R19/0092G01R31/3004G01R31/31924
    • An applied-voltage-based current measuring apparatus in which an operational amplifier is supplied at its non-inverting input terminal with a predetermined voltage and at its inverting input terminal with a voltage to be applied to a load. A current measuring resistor is connected between the output terminal of the operational amplifier and the load and a voltage which is created across the current measuring resistor is measured to thereby measure a current flow to the load in the state of being supplied with a predetermined voltage and in which a plurality of current measuring resistors are connected in series in correspondence to current measuring ranges. Switching elements for current bypass use, each of which turns ON when the voltage created across the corresponding current measuring resistor reaches a predetermined value, are connected in parallel to the current measuring resistors. Automatically carrying out sequential measurements of voltages created at respective ends of the current measuring resistors. The measured results are subjected to subtraction processing to compute voltages which are developed across the current measuring resistors. The apparatus selects from the computed results an optimum value contained in any one of the measuring ranges, thereby specifying the current flowing to the load.
    • 一种基于施加电压的电流测量装置,其中在其非反相输入端子处以预定电压提供运算放大器,并在其反相输入端子处提供要施加到负载的电压。 电流测量电阻连接在运算放大器的输出端和负载之间,并测量跨过电流测量电阻产生的电压,从而测量在被提供预定电压的状态下到达负载的电流, 其中多个电流测量电阻器与电流测量范围相对应地串联连接。 用于当前旁路使用的开关元件,当相应的电流测量电阻器上产生的电压达到预定值时,每个开关元件都接通,并联连接到电流测量电阻器。 自动执行在电流测量电阻的各端产生的电压的顺序测量。 测量结果进行减法处理,以计算在当前测量电阻上形成的电压。 该装置从计算结果中选择包含在任一个测量范围内的最佳值,从而指定流向负载的电流。
    • 88. 发明授权
    • Voltage supply circuit for a load absorbing high tentative peak current
    • 用于负载吸收高暂定峰值电流的电源电路
    • US5874827A
    • 1999-02-23
    • US951296
    • 1997-10-16
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G01R31/26G01R31/28G01R31/319G05F1/56G05F1/618H01L21/822H01L27/04H02J1/10H03K19/00H03K19/0175G05F1/10
    • H02J1/10G01R31/31924G05F1/618
    • A voltage supply circuit is provided which is capable of rapidly terminating a fluctuation in the voltage at the voltage output terminal of a feedback type voltage supply and restoring the voltage to a steady-state value. The feedback type voltage supply has a voltage output terminal to which a current supply circuit and a current absorbing circuit are connected. The current supply circuit comprises a voltage source for generating a voltage slightly less than the steady-state voltage at the voltage output terminal, a first diode 33 having a cathode connected to the voltage output terminal, a second diode having a cathode connected to the voltage source, and a current source having a current output terminal connected to the junction between the anodes of the first and the second diode. The current absorbing circuit comprises a voltage source for outputting a voltage slightly above the steady-state voltage at the voltage output terminal, a third diode having an anode connected to the voltage output terminal, a fourth diode having an anode connected to the voltage source, and a current source having a current output terminal connected to the junction between the cathodes of the third and the fourth diode.
    • 提供一种电压供应电路,其能够快速地终止反馈型电压源的电压输出端子处的电压的波动,并将电压恢复到稳态值。 反馈型电压源具有连接电流供给电路和电流吸收电路的电压输出端子。 电流供给电路包括用于产生稍微小于电压输出端子处的稳态电压的电压的电压源,具有连接到电压输出端子的阴极的第一二极管33,具有连接到电压的阴极的第二二极管 源极和电流源,其具有连接到第一和第二二极管的阳极之间的结的电流输出端子。 电流吸收电路包括用于输出略高于电压输出端的稳态电压的电压的电压源,具有连接到电压输出端的阳极的第三二极管,连接到电压源的阳极的第四二极管, 以及电流源,其具有连接到第三和第四二极管的阴极之间的结的电流输出端子。
    • 89. 发明授权
    • Display device
    • 显示设备
    • US5784132A
    • 1998-07-21
    • US877484
    • 1997-06-16
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • G02F1/1335G02F1/136G02F1/1362G02F1/1368H01L29/786G02F1/1337
    • G02F1/136209G02F1/136227G02F1/1368
    • The drive substrate and an opposed substrate are joined to each other through a gap in which a liquid crystal is held. Pixels electrodes are provided on the drive substrate in a matrix form and, an opposed electrode is formed on the entire surface of the opposed substrate. The drive substrate 1 has a plurality of thin film transistors each for switching one of the pixel electrodes, a first interlayer insulating film for covering the thin film transistors, interconnect electrodes patterned on the first interlayer insulating film and connected to the thin film transistors, a second interlayer insulating film for covering the interconnect electrodes and a black matrix patterned on the second interlayer insulating film and used for shielding the thin film transistors beneath the second interlayer insulating film. The black matrix is covered by a planerization layer and the pixel electrodes are patterned on the planerization layer. The pixel electrodes are connected to the interconnect electrodes through the black matrix 10 which is made up of a metal film. In a display device of the active matrix type, an on-chip black structure is thus obtained by providing a black matrix also referred to as a light-shielding layer on a drive substrate.
    • 驱动基板和相对基板通过保持液晶的间隙相互连接。 像素电极以矩阵形式设置在驱动基板上,在相对的基板的整个表面上形成相对的电极。 驱动基板1具有用于切换像素电极中的一个的多个薄膜晶体管,用于覆盖薄膜晶体管的第一层间绝缘膜,在第一层间绝缘膜上图案化并连接到薄膜晶体管的互连电极, 用于覆盖互连电极的第二层间绝缘膜和在第二层间绝缘膜上图案化的黑色矩阵,用于屏蔽第二层间绝缘膜下面的薄膜晶体管。 黑色矩阵由平整层覆盖,并且像素电极在平面化层上被图案化。 像素电极通过由金属膜构成的黑矩阵10连接到互连电极。 在有源矩阵型的显示装置中,通过在驱动基板上设置也称为遮光层的黑色矩阵,从而获得片上黑色结构。
    • 90. 发明授权
    • Process for producing alpha-hydroxy acid or alpha-hydroxyamide by
microorganisms
    • 通过微生物生产α-羟基酸或α-羟基酰胺的方法
    • US5508181A
    • 1996-04-16
    • US378006
    • 1995-01-25
    • Yoshihiro Hashimoto
    • Yoshihiro Hashimoto
    • C12P7/42C12P13/02C12R1/01C12R1/13C12R1/38C12P1/04C12P7/46C12P7/50
    • C12P13/02C12P7/42Y10S435/822Y10S435/84Y10S435/874
    • A process for the production of .alpha.-hydroxy acids or .alpha.-hydroxyamides in which an .alpha.-hydroxynitrile compound or a mixture consisting of an aldehyde and prussic acid, which corresponds to the nitrile compound, is allowed to undergo a microbial reaction to produce the corresponding .alpha.-hydroxy acid or .alpha.-hydroxyamide, wherein the improvement resides in that phosphite ions or hypophosphite ions are allowed to be present in the reaction system. According to the present invention, since hydrolysis or hydration of nitrile compounds can be carried out by constantly keeping a low concentration level of aldehydes which are considered to be a cause of the enzyme inhibition in the reaction system, the enzyme activity can be maintained stably for a prolonged period of time and the formed acids or amides can therefore be accumulated in a high concentration.
    • 制备α-羟基酸或α-羟基酰胺的方法,其中使α-对羟基腈化合物或由对应于腈化合物的醛和氢醌组成的混合物进行微生物反应以产生相应的 α-羟基酸或α-羟基酰胺,其中改进在于允许亚磷酸根离子或次亚磷酸根离子存在于反应体系中。 根据本发明,由于腈化合物的水解或水化可以通过在反应体系中不断保持被认为是酶抑制的原因的低浓度的醛进行,因此可以稳定地维持酶活性 因此可以长时间地积聚形成的酸或酰胺,因此可以高浓度地积聚。