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81. 发明申请

US20100075677A1 METHODS AND SYSTEMS FOR SELECTING A TARGET BS WITH THE BEST SERVICE SUPPORTED IN WIMAX HANDOVER 审中-公开
标题翻译：用WIMAX切换支持最佳服务选择目标BS的方法和系统
公开(公告)号：US20100075677A1
公开(公告)日：2010-03-25
申请号：US12235546
申请日：2008-09-22
申请人： Yu Wang , Guangming Carl Shi , Tom Chin
发明人： Yu Wang , Guangming Carl Shi , Tom Chin
IPC分类号： H04W36/00
CPC分类号： H04W36/0055
摘要： Methods and apparatus for notifying a mobile station (MS) of service flow parameters supported by neighbor base stations, such that the MS may select a suitable neighbor base station (BS) candidate (i.e., a target BS) for performing a handover are provided. The notification may occur via handover messages, such as a BS Handover Request (MOB_BSHO-REQ) message or a BS Handover Response (MOB_BSHO-RSP) message, with a Service Level Supported field added, indicating the service flow parameters supported by the neighbor BSs. In this manner, service quality levels of data exchanges may be maintained as an MS is handed over from one BS to another.
摘要翻译：提供用于通知移动台（MS）由相邻基站支持的服务流参数的方法和装置，使得MS可以选择用于执行切换的合适的相邻基站（BS）候选（即，目标BS）。该通知可以经由诸如BS切换请求（MOB_BSHO-REQ）消息或附加了服务级别支持字段的BS切换响应（MOB_BSHO-RSP）消息的切换消息发生，指示由邻居BS支持的服务流参数。以这种方式，当MS从一个BS切换到另一个BS时，可以维持数据交换的服务质量水平。

82. 发明申请

US20100048490A1 BINDING LIGAND LINKED DRUG DELIVERY CONJUGATES OF TUBULYSINS 有权
标题翻译：绑定连锁药物联合药物联合管理
公开(公告)号：US20100048490A1
公开(公告)日：2010-02-25
申请号：US12530952
申请日：2008-03-13
申请人： Iontcho Radoslavov Vlahov , Christopher Paul Leamon , Yu Wang
发明人： Iontcho Radoslavov Vlahov , Christopher Paul Leamon , Yu Wang
IPC分类号： A61K47/48 , A61P43/00
CPC分类号： C07K7/06 , A61K47/55 , A61K47/551 , A61K47/64 , A61K47/65 , A61K47/6811 , A61K51/0497 , C07K5/021 , C07K5/06078
摘要： Described herein are compounds, pharmaceutical compositions and methods for treating pathogenic cell populations. The compounds described herein include conjugates of tubulysins and vitamin receptor binding ligands. The conjugates also include a releasable bivalent linker.
摘要翻译：本文描述了用于治疗致病细胞群体的化合物，药物组合物和方法。本文所述的化合物包括管状蛋白和维生素受体结合配体的缀合物。缀合物还包括可释放的二价连接体。

83. 发明授权

US07664144B2 Packet-switched network synchronization system and method 有权
标题翻译：分组交换网络同步系统和方法
公开(公告)号：US07664144B2
公开(公告)日：2010-02-16
申请号：US11614875
申请日：2006-12-21
申请人： John Fanson , Yu Wang
发明人： John Fanson , Yu Wang
IPC分类号： H04J3/06
CPC分类号： H04L7/042 , H04L27/2656 , H04L27/2689
摘要： A synchronization system and method for use in a packet switched communication network are provided. The synchronization system comprises a transmitter-identification system, a packet-boundary detection system and a storage-access system. The transmitter-identification system enables each receiving terminal within the network to know the identity of the originating transmitter terminal for a given packet of information, prior to the reception of this packet of information. The packet-boundary detection system enables detection of packet synchronization parameters for all transmitter-receiver pairs of terminals within the network. The storage-access system stores the detected packet synchronization parameters and allows the receiver to access the packet synchronization parameters. According to one embodiment of the invention, the synchronization method comprises the step of detecting synchronization parameters and, for a given receiver terminal, establishing the identity of the originating transmitter for an incoming packet of information, accessing synchronization parameters corresponding to the identified transmitter, adjusting receiver based on accessed synchronization parameters and decoding the incoming packet of information.
摘要翻译：提供了一种在分组交换通信网络中使用的同步系统和方法。同步系统包括发射机识别系统，分组边界检测系统和存储接入系统。在接收到该信息包之前，发射机识别系统使得网络内的每个接收终端能够知道给定分组信息的始发发射机终端的身份。分组边界检测系统能够检测网络内所有发射机 - 接收机对的对的分组同步参数。存储接入系统存储检测到的分组同步参数，并允许接收机访问分组同步参数。根据本发明的一个实施例，同步方法包括检测同步参数的步骤，并且对于给定的接收机终端，建立用于输入信息分组的始发发射机的身份，访问对应于所识别的发射机的同步参数，调整接收机基于所访问的同步参数并对输入的信息包进行解码。

84. 发明授权

US07645616B2 Use of lipocalin-2 as a diagnostic marker and therapeutic target 有权
标题翻译：使用脂笼蛋白-2作为诊断标记和治疗靶点
公开(公告)号：US07645616B2
公开(公告)日：2010-01-12
申请号：US11875271
申请日：2007-10-19
申请人： Aimin Xu , Yu Wang , Karen Siu Ling Lam
发明人： Aimin Xu , Yu Wang , Karen Siu Ling Lam
IPC分类号： G01N33/53
CPC分类号： C12Q1/6883 , A61K31/44 , A61K31/4439 , C07K14/47 , C12Q2600/136 , C12Q2600/158 , Y10S436/811
摘要： Methods and compositions for identifying and treating obesity and obesity-induced metabolic disorders are provided. One aspect provides a method for the evaluation of risk and progression of glucose tolerance, insulin resistance and Type 2 diabetes in mammalian subjects. The method includes measuring the concentration of circulating lipocalin-2 in a subject and comparing the measured level to lipocalin-2 to a reference level. Another aspect provides methods of treating insulin resistance, type 2 diabetes and other related complications by administering to a patient a composition that can reduce the circulating levels of lipocalin-2, for example a lipocalin-2 antagonist.
摘要翻译：提供了用于鉴定和治疗肥胖和肥胖诱导的代谢紊乱的方法和组合物。一方面提供了用于评估哺乳动物受试者中葡萄糖耐量，胰岛素抵抗和2型糖尿病的风险和进展的方法。该方法包括测量受试者中循环脂质运载蛋白-2的浓度，并将测量的水平与脂笼蛋白-2比较至参考水平。另一方面提供了通过向患者施用可以降低脂质运载蛋白-2（例如脂质运载蛋白-2拮抗剂）的循环水平的组合物来治疗胰岛素抵抗，2型糖尿病和其它相关并发症的方法。

85. 发明授权

US07632733B2 Polysilicon control etch-back indicator 有权
标题翻译：多晶硅控制回蚀指示器
公开(公告)号：US07632733B2
公开(公告)日：2009-12-15
申请号：US11413248
申请日：2006-04-29
申请人： Yu Wang , Tiesheng Li , Sung-Shan Tai , Hong Chang
发明人： Yu Wang , Tiesheng Li , Sung-Shan Tai , Hong Chang
IPC分类号： H01L21/336
CPC分类号： H01L29/7813 , H01L22/12 , H01L29/407 , H01L29/4236 , H01L29/4238 , H01L29/66734 , H01L2924/0002 , H01L2924/00
摘要： This invention discloses a semiconductor wafer for manufacturing electronic circuit thereon. The semiconductor substrate further includes an etch-back indicator that includes trenches of different sizes having polysilicon filled in the trenches and then completely removed from some of the trenches of greater planar trench dimensions and the polysilicon still remaining in a bottom portion in some of the trenches having smaller planar trench dimensions.
摘要翻译：本发明公开了一种用于在其上制造电子电路的半导体晶片。半导体衬底还包括回蚀指示器，其包括不同尺寸的沟槽，其具有填充在沟槽中的多晶硅，然后从更大的平面沟槽尺寸的一些沟槽中完全去除，并且多晶硅仍保留在一些沟槽中的底部具有较小的平面沟槽尺寸。

86. 发明申请

US20090274709A1 Lipocalin-2 As A Prognostic and Diagnostic Marker For Heart And Stroke Risks 有权
标题翻译： Lipocalin-2作为心脏和中风风险的预后和诊断标记
公开(公告)号：US20090274709A1
公开(公告)日：2009-11-05
申请号：US12113056
申请日：2008-04-30
申请人： Aimin Xu , Yu Wang , Reinhard Renneberg , George William Hunter Cautherley , Cangel Pui Yee Chan , Matthias Lehmann
发明人： Aimin Xu , Yu Wang , Reinhard Renneberg , George William Hunter Cautherley , Cangel Pui Yee Chan , Matthias Lehmann
IPC分类号： A61K39/395 , A61P9/00 , G06F19/00
CPC分类号： C07K14/47 , A61K38/00 , C07K16/18 , G01N33/6872 , G01N2800/32 , Y10S436/811
摘要： Methods and apparatus are disclosed for the measurement of lipocalin-2 in body fluids (including but not limited to blood, serum, plasma, urine, saliva, tear, etc.) by an assay such as an immunoassay or an immunotest for (1) the prediction of risk of future cardiovascular diseases; and (2) the determination of the likelihood that certain individuals will benefit to a greater or lesser extent from the use of certain treatments designed to prevent and/or treat cardiovascular diseases.
摘要翻译：公开了通过诸如免疫测定法或免疫测定法（1）的体液（包括但不限于血液，血清，血浆，尿液，唾液，泪液等）中脂质运载蛋白-2的测量的方法和装置，预测未来心血管疾病的风险; 和（2）确定某些个体在使用某些旨在预防和/或治疗心血管疾病的治疗方面或多或少受益的可能性。

87. 发明申请

US20090196764A1 HIGH FREQUENCY ELECTRIC-DRIVE WITH MULTI-POLE MOTOR FOR GAS PIPELINE AND STORAGE COMPRESSION APPLICATIONS 审中-公开
标题翻译：用于气体管道和储存压缩应用的多功能电动机的高频电动驱动
公开(公告)号：US20090196764A1
公开(公告)日：2009-08-06
申请号：US12025227
申请日：2008-02-04
申请人： James M. Fogarty , Christopher A. Kaminski , Konrad R. Weeber , Yu Wang , Rajib Datta
发明人： James M. Fogarty , Christopher A. Kaminski , Konrad R. Weeber , Yu Wang , Rajib Datta
IPC分类号： F04B49/06 , H02P27/04 , H02H7/10
CPC分类号： F04D25/0606 , F04D25/0686 , H02M7/487 , H02P27/14
摘要： An integrated electric-drive compressor system utilizes a high frequency drive for powering the multi-pole pair motor. The electric motor and compressor are housed in a common pressure casing. The electric motor has added permanent magnets for achieving higher ratings and higher speeds.
摘要翻译：集成电动压缩机系统利用高频驱动来为多极对电动机供电。电动机和压缩机容纳在共同的压力壳体中。电动机已经添加了永磁体，以实现更高的额定值和更高的速度。

88. 发明申请

US20090166621A1 RESISTANCE-BASED ETCH DEPTH DETERMINATION FOR SGT TECHNOLOGY 有权
标题翻译：用于SGT技术的基于电阻的蚀刻深度测定
公开(公告)号：US20090166621A1
公开(公告)日：2009-07-02
申请号：US12399632
申请日：2009-03-06
申请人： Tiesheng Li , Yu Wang , Yingying Lou , Anup Bhalla
发明人： Tiesheng Li , Yu Wang , Yingying Lou , Anup Bhalla
IPC分类号： H01L23/58
CPC分类号： H01L22/34 , H01L22/12 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A method for determining the depth etch, a method of forming a shielded gate trench (SGT) structure and a semiconductor device wafer are disclosed. A material layer is formed over part of a substrate having a trench. The material fills the trench. A resist mask is placed over a test portion of the material layer thereby defining a test structure that lies underneath the resist mask. The resist mask does not cover the trench. The material is isotropically etched and a signal related to a resistance change of the test structure is measured. A lateral undercut DL of the test structure is determined from the signal and an etch depth DT is determined from DL. The wafer may comprise one or more test structures forming a bridge circuit; one or more metal contacts that electrically connect the test structures through contact holes: and resist layer including over the test structures.
摘要翻译：公开了一种用于确定深度蚀刻的方法，形成屏蔽栅沟槽（SGT）结构的方法和半导体器件晶片。在具有沟槽的衬底的一部分上形成材料层。材料填充沟槽。将抗蚀剂掩模放置在材料层的测试部分上，从而限定位于抗蚀剂掩模下方的测试结构。抗蚀剂掩模不覆盖沟槽。该材料被各向同性地蚀刻并且测量与测试结构的电阻变化相关的信号。从信号确定测试结构的横向底切DL，并且从DL确定蚀刻深度DT。晶片可以包括形成桥接电路的一个或多个测试结构; 通过接触孔将测试结构电连接的一个或多个金属触点和包括在测试结构上的抗蚀剂层。

89. 发明申请

US20090030673A1 Automatically identifying unique language independent keys correlated with appropriate text strings of various locales by key search 失效
标题翻译：通过关键搜索自动识别与各种语言环境的适当文本字符串相关的独特语言独立键
公开(公告)号：US20090030673A1
公开(公告)日：2009-01-29
申请号：US11828695
申请日：2007-07-26
申请人： Al Chakra , John F. Sefler , Teppei Tsurumi , Yu Wang , Morgan Louis Johnson
发明人： Al Chakra , John F. Sefler , Teppei Tsurumi , Yu Wang , Morgan Louis Johnson
IPC分类号： G06F17/20
CPC分类号： G06F9/454
摘要： A method, system and computer program product for automatically identifying unique language independent keys. A “key search” is performed which searches for various language independent keys in a properties file associated with a value or text string entered in a first locale. A second locale is suggested to narrow the number of language independent keys displayed in connection with the value entered in the first locale. Upon receiving the value for the second locale, another key search is performed, where this key search is performed on the language independent keys displayed in connection with the first value entered in association with the first locale. A unique language independent key may be identified based on this subsequent key search. By performing key searches and suggesting a second locale to narrow the number of language independent keys, the time in identifying a unique language independent key is reduced and efficiency is improved.
摘要翻译：一种用于自动识别独特的独立密钥的方法，系统和计算机程序产品。执行“键搜索”，其搜索与在第一区域设置中输入的值或文本串相关联的属性文件中的各种与语言无关的键。建议第二个区域设置来缩小与第一个区域设置中输入的值相关的显示的独立语言密钥的数量。在接收到第二区域的值时，执行另一个键搜索，其中对与第一语言环境相关联地输入的第一值显示的与语言无关的键执行该键搜索。可以基于该随后的密钥搜索来识别独特的语言独立密钥。通过执行关键搜索并建议第二语言环境以缩小语言无关键的数量，减少了识别独特语言的密钥的时间并提高了效率。

90. 发明申请

US20080272371A1 RESISTANCE-BASED ETCH DEPTH DETERMINATION FOR SGT TECHNOLOGY 有权
标题翻译：用于SGT技术的基于电阻的蚀刻深度测定
公开(公告)号：US20080272371A1
公开(公告)日：2008-11-06
申请号：US11690581
申请日：2007-03-23
申请人： Tiesheng Li , Yu Wang , Yingying Lou , Anup Bhalla
发明人： Tiesheng Li , Yu Wang , Yingying Lou , Anup Bhalla
IPC分类号： H01L23/58
CPC分类号： H01L22/34 , H01L22/12 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A method for determining the depth etch, a method of forming a shielded gate trench (SGT) structure and a semiconductor device wafer are disclosed. A material layer is formed over part of a substrate having a trench. The material fills the trench. A resist mask is placed over a test portion of the material layer thereby defining a test structure that lies underneath the resist mask. The resist mask does not cover the trench. The material is isotropically etched and a signal related to a resistance change of the test structure is measured. A lateral undercut DL of the test structure is determined from the signal and an etch depth DT is determined from DL. The wafer may comprise one or more test structures forming a bridge circuit; one or more metal contacts that electrically connect the test structures through contact holes: and resist layer including over the test structures.
摘要翻译：公开了一种用于确定深度蚀刻的方法，形成屏蔽栅沟槽（SGT）结构的方法和半导体器件晶片。在具有沟槽的衬底的一部分上形成材料层。材料填充沟槽。将抗蚀剂掩模放置在材料层的测试部分上，从而限定位于抗蚀剂掩模下方的测试结构。抗蚀剂掩模不覆盖沟槽。该材料被各向同性地蚀刻并且测量与测试结构的电阻变化相关的信号。根据信号确定测试结构的横向底切D L L，并且从D L确定蚀刻深度D T T。晶片可以包括形成桥接电路的一个或多个测试结构; 通过接触孔将测试结构电连接的一个或多个金属触点和包括在测试结构上的抗蚀剂层。

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