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    • 87. 发明授权
    • Apparatus for thermal characterization under non-uniform heat load
    • 非均匀热负荷下热表征的装置
    • US08038343B2
    • 2011-10-18
    • US12048635
    • 2008-03-14
    • Hendrik F. HamannMadhusudan K. IyengarJames A. LaceyRoger R. Schmidt
    • Hendrik F. HamannMadhusudan K. IyengarJames A. LaceyRoger R. Schmidt
    • G01K3/00
    • H01L23/34H01L2924/0002H01L2924/00
    • A novel computer program product and method for thermally characterizing a device used for cooling an electronic device is disclosed. A cooling device, being operated, is thermally coupled to a heat pipe having a surface to receive a test chip. A heater is patterned on a circuitry side of the test chip. The heater is separate from operational circuitry of the test chip. A localized heat source is applied to at least one region on a test chip thermally coupled to the heat pipe to locally heat more than one region on a second surface of the test chip to test more than one hot spot. The second surface is the circuitry side of the test chip. The heater provides a bias heat to the test chip, independent of operating the test chip, while the localized heat source is selectively applied directly to the test chip. A temperature detector is used to measure a temperature distribution on the second surface of the test chip. The temperature distribution is used to thermally characterize said cooling device during operation.
    • 公开了一种用于热表征用于冷却电子设备的设备的新颖的计算机程序产品和方法。 被操作的冷却装置热耦合到具有接收测试芯片的表面的热管。 加热器在测试芯片的电路侧进行图案化。 加热器与测试芯片的操作电路分开。 将局部热源施加到热耦合到热管的测试芯片上的至少一个区域,以局部加热测试芯片的第二表面上的多于一个区域,以测试多于一个热点。 第二个表面是测试芯片的电路侧。 加热器对测试芯片提供偏置热量,与操作测试芯片无关,同时局部热源被选择性地直接应用于测试芯片。 温度检测器用于测量测试芯片第二表面上的温度分布。 温度分布用于在操作期间热定形所述冷却装置。